{"id":"https://openalex.org/W2156824182","doi":"https://doi.org/10.1109/jetcas.2011.2135470","title":"Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS","display_name":"Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2156824182","doi":"https://doi.org/10.1109/jetcas.2011.2135470","mag":"2156824182"},"language":"en","primary_location":{"id":"doi:10.1109/jetcas.2011.2135470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2011.2135470","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023516811","display_name":"Elie Maricau","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Elie Maricau","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5023516811"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":8.9081,"has_fulltext":false,"cited_by_count":76,"citation_normalized_percentile":{"value":0.98128275,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"1","issue":"1","first_page":"50","last_page":"58"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6744980812072754},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6529324054718018},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.6410515904426575},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.635300874710083},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5963796377182007},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5750420689582825},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5251523852348328},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4809945821762085},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.47619664669036865},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.45885801315307617},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41557827591896057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3993167579174042},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.382434219121933},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06733879446983337}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6744980812072754},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6529324054718018},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.6410515904426575},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.635300874710083},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5963796377182007},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5750420689582825},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5251523852348328},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4809945821762085},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.47619664669036865},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.45885801315307617},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41557827591896057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3993167579174042},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.382434219121933},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06733879446983337},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jetcas.2011.2135470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2011.2135470","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/652337","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/652337/2/EM.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Emerging and Selected Topics in Circuits and Systems, vol. 1 (1), Art.No. 1, (50-58)","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W1577739352","https://openalex.org/W1583499813","https://openalex.org/W1604537105","https://openalex.org/W1967004917","https://openalex.org/W1968809267","https://openalex.org/W1988922865","https://openalex.org/W1990794787","https://openalex.org/W1991891926","https://openalex.org/W2003957094","https://openalex.org/W2010176811","https://openalex.org/W2020491095","https://openalex.org/W2023868109","https://openalex.org/W2036537371","https://openalex.org/W2039518657","https://openalex.org/W2041424982","https://openalex.org/W2047552062","https://openalex.org/W2062874667","https://openalex.org/W2066698193","https://openalex.org/W2070588354","https://openalex.org/W2071908165","https://openalex.org/W2076209003","https://openalex.org/W2081890843","https://openalex.org/W2087983786","https://openalex.org/W2093553477","https://openalex.org/W2096995644","https://openalex.org/W2099138617","https://openalex.org/W2099835127","https://openalex.org/W2102209270","https://openalex.org/W2102352834","https://openalex.org/W2105854936","https://openalex.org/W2107073052","https://openalex.org/W2108024876","https://openalex.org/W2109953360","https://openalex.org/W2110033475","https://openalex.org/W2113488650","https://openalex.org/W2114599766","https://openalex.org/W2115726748","https://openalex.org/W2117324805","https://openalex.org/W2118078356","https://openalex.org/W2119610788","https://openalex.org/W2122520074","https://openalex.org/W2129064750","https://openalex.org/W2130688260","https://openalex.org/W2133831885","https://openalex.org/W2134869654","https://openalex.org/W2136122966","https://openalex.org/W2136723550","https://openalex.org/W2139286506","https://openalex.org/W2140823559","https://openalex.org/W2145656335","https://openalex.org/W2145774126","https://openalex.org/W2152775237","https://openalex.org/W2167369830","https://openalex.org/W2296253867","https://openalex.org/W2526903821","https://openalex.org/W2548125287","https://openalex.org/W2566855134","https://openalex.org/W3152276207","https://openalex.org/W4230157952","https://openalex.org/W4232569293","https://openalex.org/W4241148352","https://openalex.org/W6675726429","https://openalex.org/W6677446150","https://openalex.org/W6729452756"],"related_works":["https://openalex.org/W4318953393","https://openalex.org/W2744643496","https://openalex.org/W2048419807","https://openalex.org/W3075611072","https://openalex.org/W2081795747","https://openalex.org/W3094423394","https://openalex.org/W2357721494","https://openalex.org/W1553422968","https://openalex.org/W1974416117","https://openalex.org/W2168458994"],"abstract_inverted_index":{"Integrated":[0],"analog":[1,91,149],"circuit":[2,46,69,111,119],"design":[3,37,56,75,142],"in":[4,88,98],"nanometer":[5,99],"CMOS":[6,100],"technologies":[7,101],"brings":[8],"forth":[9],"new":[10],"and":[11,19,29,39,73,104,122,135,147],"significant":[12],"reliability":[13,70,120],"challenges.":[14],"Ever-increasing":[15],"process":[16],"variability":[17],"effects":[18,97],"transistor":[20,65,105],"wear-out":[21],"phenomena":[22],"such":[23],"as":[24],"BTI,":[25],"hot":[26],"carrier":[27],"degradation":[28],"dielectric":[30],"breakdown":[31],"force":[32],"designers":[33,50,130],"to":[34,40,51,131,136],"use":[35],"large":[36],"margins":[38],"increase":[41],"the":[42,45,82,86],"uncertainty":[43],"on":[44],"lifetime.":[47],"To":[48],"help":[49,129],"tackle":[52],"these":[53],"problems":[54],"at":[55],"time":[57],"(i.e.,":[58],"Design":[59],"For":[60],"Reliability,":[61],"or":[62],"DFR),":[63],"accurate":[64,110],"aging":[66,106],"models,":[67,107],"efficient":[68,116],"analysis":[71,123],"methods":[72,117,127],"novel":[74],"techniques":[76,143],"are":[77,102,113,124,151],"needed.":[78],"The":[79,93],"paper":[80],"overviews":[81],"current":[83],"state":[84],"of":[85],"art":[87],"DFR":[89],"for":[90,109,118,144],"circuits.":[92],"most":[94],"important":[95],"unreliability":[96],"reviewed":[103],"intended":[108],"simulation,":[112],"described.":[114],"Also,":[115],"simulation":[121],"discussed.":[125],"These":[126],"can":[128],"analyze":[132],"their":[133],"circuits":[134,150],"identify":[137],"weak":[138],"spots.":[139],"Finally,":[140],"cost-effective":[141],"more":[145],"resilient":[146],"self-healing":[148],"studied.":[152]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":10},{"year":2015,"cited_by_count":10},{"year":2014,"cited_by_count":11},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":11}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}