{"id":"https://openalex.org/W2886180265","doi":"https://doi.org/10.1109/iwssip.2018.8439421","title":"Toward an Embedded Application to Identify Degradation in Energized Polymeric Insulators using Discrete Wavelet Transform","display_name":"Toward an Embedded Application to Identify Degradation in Energized Polymeric Insulators using Discrete Wavelet Transform","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2886180265","doi":"https://doi.org/10.1109/iwssip.2018.8439421","mag":"2886180265"},"language":"en","primary_location":{"id":"doi:10.1109/iwssip.2018.8439421","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iwssip.2018.8439421","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 25th International Conference on Systems, Signals and Image Processing (IWSSIP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047397471","display_name":"Rebeca Guerreiro Carvalho Cunha","orcid":null},"institutions":[{"id":"https://openalex.org/I3018325552","display_name":"Instituto Federal de Educa\u00e7\u00e3o, Ci\u00eancia e Tecnologia do Cear\u00e1","ror":"https://ror.org/02225fd27","country_code":"BR","type":"government","lineage":["https://openalex.org/I3018325552"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Rebeca G.C. Cunha","raw_affiliation_strings":["Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil","institution_ids":["https://openalex.org/I3018325552"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019945499","display_name":"Elias T. Silva","orcid":"https://orcid.org/0000-0001-6695-9685"},"institutions":[{"id":"https://openalex.org/I3018325552","display_name":"Instituto Federal de Educa\u00e7\u00e3o, Ci\u00eancia e Tecnologia do Cear\u00e1","ror":"https://ror.org/02225fd27","country_code":"BR","type":"government","lineage":["https://openalex.org/I3018325552"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Elias T. Da Silva Junior","raw_affiliation_strings":["Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil","institution_ids":["https://openalex.org/I3018325552"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104000627","display_name":"Jo\u00e3o Wellington M. Souza","orcid":null},"institutions":[{"id":"https://openalex.org/I3018325552","display_name":"Instituto Federal de Educa\u00e7\u00e3o, Ci\u00eancia e Tecnologia do Cear\u00e1","ror":"https://ror.org/02225fd27","country_code":"BR","type":"government","lineage":["https://openalex.org/I3018325552"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Joao W. M. De Souza","raw_affiliation_strings":["Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil","institution_ids":["https://openalex.org/I3018325552"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049651824","display_name":"Pedro P. Rebou\u00e7as Filho","orcid":"https://orcid.org/0000-0002-1878-5489"},"institutions":[{"id":"https://openalex.org/I3018325552","display_name":"Instituto Federal de Educa\u00e7\u00e3o, Ci\u00eancia e Tecnologia do Cear\u00e1","ror":"https://ror.org/02225fd27","country_code":"BR","type":"government","lineage":["https://openalex.org/I3018325552"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Pedro P. Reboucas Filho","raw_affiliation_strings":["Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Federal Institute of Education, Science and Technology of Ceara - IFCE, Fortaleza-CE, Brazil","institution_ids":["https://openalex.org/I3018325552"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5047397471"],"corresponding_institution_ids":["https://openalex.org/I3018325552"],"apc_list":null,"apc_paid":null,"fwci":0.3882,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.5488203,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"7208","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.6887109279632568},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5764758586883545},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5683392882347107},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5573140978813171},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.46892789006233215},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42862552404403687},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.42590975761413574},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3795522153377533},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35441386699676514},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22908556461334229},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18686255812644958}],"concepts":[{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.6887109279632568},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5764758586883545},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5683392882347107},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5573140978813171},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.46892789006233215},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42862552404403687},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42590975761413574},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3795522153377533},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35441386699676514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22908556461334229},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18686255812644958}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iwssip.2018.8439421","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iwssip.2018.8439421","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 25th International Conference on Systems, Signals and Image Processing (IWSSIP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7300000190734863}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W53279664","https://openalex.org/W228380312","https://openalex.org/W1549961746","https://openalex.org/W1560107318","https://openalex.org/W1984144969","https://openalex.org/W2007220779","https://openalex.org/W2042087998","https://openalex.org/W2090083448","https://openalex.org/W2108921102","https://openalex.org/W2112511167","https://openalex.org/W2122876603","https://openalex.org/W2398224019","https://openalex.org/W2620958134","https://openalex.org/W6602197541","https://openalex.org/W6633497745","https://openalex.org/W6646345694","https://openalex.org/W6712770160"],"related_works":["https://openalex.org/W183670115","https://openalex.org/W1501179639","https://openalex.org/W3199035354","https://openalex.org/W2085792030","https://openalex.org/W1807354010","https://openalex.org/W3143644526","https://openalex.org/W598225674","https://openalex.org/W2734230146","https://openalex.org/W1588899229","https://openalex.org/W2077021924"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,64],"approach":[4],"to":[5,25],"distinguish":[6],"among":[7],"different":[8],"aging":[9],"conditions":[10],"in":[11,63],"insulators":[12],"present":[13],"on":[14],"power":[15],"distribution":[16],"nets.":[17],"The":[18],"ultrasound":[19],"emitted":[20],"by":[21,33],"insulators,":[22],"when":[23],"submitted":[24],"the":[26,53,70,77],"nominal":[27],"voltage,":[28],"is":[29,74],"captured":[30],"and":[31,42,56,80],"processed":[32],"Discrete":[34],"Wavelet":[35],"Transform.":[36],"Two":[37],"classifiers":[38],"are":[39],"used,":[40],"Bayes":[41],"KNN,":[43],"obtaining":[44],"about":[45],"93":[46],"%":[47],"of":[48,59],"accuracy.":[49],"It":[50],"also":[51],"analyses":[52],"execution":[54],"time":[55],"memory":[57],"footprint":[58],"a":[60,72],"DWT":[61],"implemented":[62],"embedded":[65,81],"platform":[66],"(ARM":[67],"Cortex-M).":[68],"In":[69],"end,":[71],"comparison":[73],"made":[75],"between":[76],"computational":[78],"simulation":[79],"accuracies.":[82]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}