{"id":"https://openalex.org/W4249490090","doi":"https://doi.org/10.1109/iwsoc.2004.1319886","title":"A fully automated approach for analog circuit reuse","display_name":"A fully automated approach for analog circuit reuse","publication_year":2004,"publication_date":"2004-09-28","ids":{"openalex":"https://openalex.org/W4249490090","doi":"https://doi.org/10.1109/iwsoc.2004.1319886"},"language":"en","primary_location":{"id":"doi:10.1109/iwsoc.2004.1319886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iwsoc.2004.1319886","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081908967","display_name":"S. Hammouda","orcid":null},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"S. Hammouda","raw_affiliation_strings":["Mentor Graphics Egypt, Cairo, Egypt","University of Calgary, Calgary, AB, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics Egypt, Cairo, Egypt","institution_ids":[]},{"raw_affiliation_string":"University of Calgary, Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072737392","display_name":"M. Dessouky","orcid":null},"institutions":[{"id":"https://openalex.org/I107720978","display_name":"Ain Shams University","ror":"https://ror.org/00cb9w016","country_code":"EG","type":"education","lineage":["https://openalex.org/I107720978"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M. Dessouky","raw_affiliation_strings":["Ain Shams University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ain Shams University, Cairo, Egypt","institution_ids":["https://openalex.org/I107720978"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054219108","display_name":"M. Tawfik","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Tawfik","raw_affiliation_strings":["Mentor Graphics Egypt, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics Egypt, Cairo, Egypt","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004601413","display_name":"Wael Badawy","orcid":"https://orcid.org/0000-0003-0251-9124"},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"W. Badawy","raw_affiliation_strings":["University of Calgary, Calgary, AB, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Calgary, Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.43916459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"237","last_page":"240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.8570022583007812},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7092136740684509},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.5528082251548767},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5379119515419006},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48652714490890503},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.4701929986476898},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4133002460002899},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32955271005630493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2070433795452118},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19448339939117432}],"concepts":[{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.8570022583007812},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7092136740684509},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.5528082251548767},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5379119515419006},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48652714490890503},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.4701929986476898},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4133002460002899},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32955271005630493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2070433795452118},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19448339939117432},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iwsoc.2004.1319886","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iwsoc.2004.1319886","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1602282536","https://openalex.org/W2106476087","https://openalex.org/W2144133630","https://openalex.org/W2154507680","https://openalex.org/W3148118115","https://openalex.org/W4236195134","https://openalex.org/W4237533301"],"related_works":["https://openalex.org/W2051886008","https://openalex.org/W2885948601","https://openalex.org/W2170939617","https://openalex.org/W4255141013","https://openalex.org/W4312992159","https://openalex.org/W3205162826","https://openalex.org/W2110634429","https://openalex.org/W2059530328","https://openalex.org/W2080428035","https://openalex.org/W4245815492"],"abstract_inverted_index":{"Demonstrated":[0],"in":[1,69,92],"this":[2,93],"paper":[3,94],"is":[4,16,90],"a":[5,27,37,65,84],"technique":[6,42],"for":[7],"automatic":[8],"circuit":[9],"resizing":[10],"between":[11],"different":[12],"technologies.":[13],"This":[14,41],"technology":[15,72],"not":[17],"based":[18,30],"on":[19,26,31],"any":[20],"optimization":[21],"techniques,":[22],"but":[23],"rather":[24],"relies":[25],"new":[28,66],"algorithm":[29],"knowledge":[32],"extraction,":[33],"which":[34],"makes":[35],"it":[36],"very":[38],"fast":[39],"technique.":[40],"studies":[43],"the":[44,70,74,78,97],"original":[45,79],"design":[46,68],"and":[47,60,62],"extracts":[48],"its":[49],"major":[50],"features":[51],"(basic":[52],"devices":[53],"&":[54],"blocks":[55],"features,":[56],"device":[57],"matching,":[58],"parasitics,":[59],"symmetry)":[61],"then":[63],"reproduces":[64],"sized":[67],"target":[71],"with":[73],"same":[75],"performance":[76],"as":[77],"design.":[80],"The":[81],"migration":[82,98],"of":[83],"low":[85],"voltage":[86],"delta":[87],"sigma":[88],"A/D":[89],"presented":[91],"to":[95],"validate":[96],"engine.":[99]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}