{"id":"https://openalex.org/W4382935225","doi":"https://doi.org/10.1109/iwasi58316.2023.10164482","title":"Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique","display_name":"Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique","publication_year":2023,"publication_date":"2023-06-08","ids":{"openalex":"https://openalex.org/W4382935225","doi":"https://doi.org/10.1109/iwasi58316.2023.10164482"},"language":"en","primary_location":{"id":"doi:10.1109/iwasi58316.2023.10164482","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iwasi58316.2023.10164482","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049510723","display_name":"Kyle van Oosterhout","orcid":"https://orcid.org/0000-0001-7469-9182"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Kyle van Oosterhout","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004374867","display_name":"Martijn Timmermans","orcid":"https://orcid.org/0009-0005-4286-7475"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Martijn Timmermans","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073904718","display_name":"Marco Fattori","orcid":"https://orcid.org/0000-0001-6357-7614"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Marco Fattori","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5051691710","display_name":"Eugenio Cantatore","orcid":"https://orcid.org/0000-0002-9646-7232"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Eugenio Cantatore","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5049510723"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08222308,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2016 march","issue":null,"first_page":"160","last_page":"165"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.705320417881012},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6677854061126709},{"id":"https://openalex.org/keywords/transistor-model","display_name":"Transistor model","score":0.6052229404449463},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6050276160240173},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5720402598381042},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5491207242012024},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.545832097530365},{"id":"https://openalex.org/keywords/linearization","display_name":"Linearization","score":0.5449619889259338},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4932641386985779},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48618000745773315},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.46352726221084595},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4439888596534729},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.41920673847198486},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3402060270309448},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3136562407016754},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2777610123157501},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19812312722206116},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19245871901512146},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1588381826877594},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.11875796318054199},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09223887324333191},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07761988043785095}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.705320417881012},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6677854061126709},{"id":"https://openalex.org/C150169584","wikidata":"https://www.wikidata.org/wiki/Q7834319","display_name":"Transistor model","level":4,"score":0.6052229404449463},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6050276160240173},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5720402598381042},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5491207242012024},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.545832097530365},{"id":"https://openalex.org/C11210021","wikidata":"https://www.wikidata.org/wiki/Q1520713","display_name":"Linearization","level":3,"score":0.5449619889259338},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4932641386985779},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48618000745773315},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.46352726221084595},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4439888596534729},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.41920673847198486},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3402060270309448},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3136562407016754},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2777610123157501},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19812312722206116},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19245871901512146},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1588381826877594},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.11875796318054199},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09223887324333191},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07761988043785095},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iwasi58316.2023.10164482","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iwasi58316.2023.10164482","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.tue.nl:openaire_cris_publications/1d07929d-cd28-4d12-a137-f6d7cd387e90","is_oa":false,"landing_page_url":"https://research.tue.nl/en/publications/1d07929d-cd28-4d12-a137-f6d7cd387e90","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"van Oosterhout, K, Timmermans, M, Fattori, M & Cantatore, E 2023, Transistor Based Source Degeneration : A Calibration-less Open-Loop Linearization Technique. in 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)., 10164482, Institute of Electrical and Electronics Engineers, pp. 160-165, 9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023, Monopoli, Italy, 8/06/23. https://doi.org/10.1109/IWASI58316.2023.10164482","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8799999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2307662004","https://openalex.org/W2777276209","https://openalex.org/W2898609453","https://openalex.org/W3000512418","https://openalex.org/W3083634856","https://openalex.org/W4255919373","https://openalex.org/W6698333691"],"related_works":["https://openalex.org/W3200817179","https://openalex.org/W1960166976","https://openalex.org/W1992708211","https://openalex.org/W2380067098","https://openalex.org/W1548152478","https://openalex.org/W2137172615","https://openalex.org/W2106247205","https://openalex.org/W4238016235","https://openalex.org/W2161403464","https://openalex.org/W2085611637"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3,8,16],"source":[4],"degeneration":[5,12],"technique":[6,98],"using":[7,39],"diode-connected":[9],"transistor":[10,64],"as":[11,43,45,67,69],"device":[13],"rather":[14],"than":[15],"conventional":[17],"resistor":[18],"improves":[19],"the":[20,31,55,60,63,72,109],"robustness":[21],"against":[22],"changes":[23],"in":[24,83],"biasing":[25],"condition":[26],"and":[27,29,90,119],"temperature,":[28],"removes":[30],"need":[32,110],"for":[33,111],"calibration.":[34],"The":[35,74],"method":[36,75],"is":[37],"validated":[38],"an":[40,77,116],"analytical":[41],"model,":[42],"well":[44,68],"with":[46],"simulations,":[47],"both":[48],"at":[49],"very":[50,65],"low":[51],"bias":[52,88],"currents":[53],"(where":[54],"analytic":[56],"exponential":[57],"model":[58],"matches":[59],"behaviour":[61],"of":[62,79,87,92],"well)":[66],"closer":[70],"to":[71,81],"threshold.":[73],"shows":[76],"improvement":[78],"6dB":[80],"20dB":[82],"linearity":[84],"when":[85],"variation":[86],"current":[89],"temperature":[91],"20%":[93],"are":[94],"considered.":[95],"Using":[96],"this":[97],"would":[99],"thus":[100],"enable":[101],"highly":[102],"linear,":[103],"power":[104,118],"efficient,":[105],"open-loop":[106],"amplifiers":[107],"without":[108],"calibration":[112],"systems,":[113],"which":[114],"have":[115],"unavoidable":[117],"area":[120],"overhead.":[121]},"counts_by_year":[],"updated_date":"2026-03-04T09:10:02.777135","created_date":"2025-10-10T00:00:00"}