{"id":"https://openalex.org/W4404848953","doi":"https://doi.org/10.1109/itc51657.2024.00048","title":"Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies","display_name":"Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4404848953","doi":"https://doi.org/10.1109/itc51657.2024.00048"},"language":"en","primary_location":{"id":"doi:10.1109/itc51657.2024.00048","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc51657.2024.00048","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002517106","display_name":"Jaehoon Lee","orcid":"https://orcid.org/0000-0001-7300-7666"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehoon Lee","raw_affiliation_strings":["Samsung Electronics,Foundry Business,Hwaseong-si,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Business,Hwaseong-si,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075415421","display_name":"Hyeonuk Son","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeonuk Son","raw_affiliation_strings":["Samsung Electronics,Foundry Business,Hwaseong-si,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Business,Hwaseong-si,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seohyun Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seohyun Kang","raw_affiliation_strings":["Samsung Electronics,Foundry Business,Hwaseong-si,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Business,Hwaseong-si,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101677962","display_name":"Dahyun Kang","orcid":"https://orcid.org/0000-0001-7660-4861"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dahyun Kang","raw_affiliation_strings":["Samsung Electronics,Foundry Business,Hwaseong-si,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Business,Hwaseong-si,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054670897","display_name":"Dong-Kwan Han","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongkwan Han","raw_affiliation_strings":["Samsung Electronics,Foundry Business,Hwaseong-si,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Business,Hwaseong-si,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102407572","display_name":"Jongsin Yun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jongsin Yun","raw_affiliation_strings":["Siemens,Wilsonville,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens,Wilsonville,USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004438248","display_name":"Artur Pogiel","orcid":"https://orcid.org/0000-0001-5271-1566"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Artur Pogiel","raw_affiliation_strings":["Siemens,Poznań,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens,Poznań,Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054643544","display_name":"\u00c9tienne Racine","orcid":"https://orcid.org/0000-0003-4266-0421"},"institutions":[{"id":"https://openalex.org/I2801914806","display_name":"Siemens (Canada)","ror":"https://ror.org/03cpzkh11","country_code":"CA","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I2801914806"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Etienne Racine","raw_affiliation_strings":["Siemens,Ottawa,Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens,Ottawa,Canada","institution_ids":["https://openalex.org/I2801914806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068603918","display_name":"Krzysztof Jurga","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Krzysztof Jurga","raw_affiliation_strings":["Siemens,Poznań,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens,Poznań,Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013257426","display_name":"Lori Schramm","orcid":null},"institutions":[{"id":"https://openalex.org/I4210151799","display_name":"Siemens Healthcare (United States)","ror":"https://ror.org/054962n91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210151799"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lori Schramm","raw_affiliation_strings":["Siemens,Atlanta,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens,Atlanta,USA","institution_ids":["https://openalex.org/I4210151799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019406427","display_name":"Martin Keim","orcid":"https://orcid.org/0000-0002-0029-135X"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Martin Keim","raw_affiliation_strings":["Siemens,Orlando,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens,Orlando,USA","institution_ids":["https://openalex.org/I4210137693"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.3343608,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"280","last_page":"285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9401999711990356,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9401999711990356,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9061999917030334,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5499708652496338},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5004360675811768}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5499708652496338},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5004360675811768}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc51657.2024.00048","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc51657.2024.00048","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W289624287","https://openalex.org/W2008990681","https://openalex.org/W3007644171","https://openalex.org/W4245815828","https://openalex.org/W4352977393","https://openalex.org/W4391622516"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109"],"abstract_inverted_index":{"Scaling":[0],"down":[1],"the":[2,15,27,68,102,126,159,173,189,246],"transistor":[3,28],"size":[4,95],"enables":[5],"a":[6,64,82,91,97,149,195,213,234],"cost-effective":[7,166],"high-performing":[8],"solution":[9],"in":[10,67,88,96,112,180,188,231],"modern":[11],"semiconductor":[12],"designs.":[13],"However,":[14,125],"added":[16],"complexity":[17],"of":[18,26,49,72,85,104,128,152,176,245],"process":[19],"and":[20,217,242],"extremely":[21],"small":[22],"critical":[23],"three-dimensional":[24],"spacing":[25],"structure":[29],"make":[30],"it":[31],"more":[32],"challenging":[33],"to":[34,44,121,184,198,211,239],"maintain":[35],"precise":[36],"variation":[37],"control.":[38],"Defects":[39],"introduced":[40,78],"here":[41],"can":[42],"lead":[43],"different":[45],"intermittent":[46],"behaviors,":[47],"some":[48],"which":[50,143],"might":[51,61],"not":[52,145],"appear":[53],"as":[54,63],"fails":[55],"during":[56],"traditional":[57],"testing":[58],"procedures":[59],"but":[60],"manifest":[62],"system":[65],"failure":[66],"field.":[69],"The":[70],"emergence":[71],"artificial":[73],"intelligence":[74],"chip":[75],"design":[76],"has":[77],"high":[79],"demands":[80],"for":[81,139,158,165,220],"massive":[83],"number":[84],"multi-cores":[86],"connected":[87],"parallel":[89],"with":[90,233],"huge":[92],"memory":[93,206,221],"array":[94],"chip.":[98],"This":[99],"further":[100],"increases":[101],"importance":[103],"identifying":[105],"rare":[106],"tail":[107],"events":[108],"through":[109],"in-depth":[110],"diagnosis":[111],"advanced":[113],"nodes.":[114],"Various":[115],"sophisticated":[116],"algorithms":[117,129,153],"have":[118],"been":[119],"proposed":[120],"improve":[122,199],"defect":[123,236],"coverage.":[124],"addition":[127],"may":[130,144],"increase":[131],"test":[132,186,200],"cost":[133],"tremendously":[134],"while":[135],"providing":[136],"limited":[137],"benefits":[138],"specific":[140,160],"fault":[141],"types":[142],"happen.":[146],"Therefore,":[147],"selecting":[148],"smart":[150],"combination":[151,232],"that":[154],"provide":[155],"enough":[156],"coverage":[157,201],"product":[161],"application":[162],"is":[163],"essential":[164],"testing.":[167],"In":[168],"this":[169],"paper,":[170],"we":[171],"review":[172],"electrical":[174],"properties":[175],"marginal":[177],"defects":[178],"inserted":[179],"an":[181],"SRAM":[182],"device":[183],"evaluate":[185,240],"escapes":[187],"latest":[190],"technology.":[191],"We":[192],"also":[193],"present":[194],"new":[196],"algorithm":[197,216],"efficiency.":[202],"A":[203,223],"commercially":[204,224],"available":[205,225],"BIST":[207],"tool":[208,228],"was":[209,229],"used":[210,230],"load":[212],"DFT":[214],"compatible":[215],"operation":[218],"set":[219],"test.":[222],"analog":[226,243],"simulation":[227,237],"novel":[235],"flow":[238],"digital":[241],"behavior":[244],"device.":[247]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}