{"id":"https://openalex.org/W3121249265","doi":"https://doi.org/10.1109/itc44778.2020.9325279","title":"Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test","display_name":"Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test","publication_year":2020,"publication_date":"2020-11-01","ids":{"openalex":"https://openalex.org/W3121249265","doi":"https://doi.org/10.1109/itc44778.2020.9325279","mag":"3121249265"},"language":"en","primary_location":{"id":"doi:10.1109/itc44778.2020.9325279","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44778.2020.9325279","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013292058","display_name":"Youngsu Oh","orcid":"https://orcid.org/0000-0002-6066-3151"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Youngsu Oh","raw_affiliation_strings":["PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070109664","display_name":"Dongmin Han","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongmin Han","raw_affiliation_strings":["PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017263604","display_name":"Byeongseon Go","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byeongseon Go","raw_affiliation_strings":["PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031633529","display_name":"Seungtaek Lee","orcid":"https://orcid.org/0000-0001-9765-4171"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungtaek Lee","raw_affiliation_strings":["PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102372264","display_name":"Woosik Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woosik Jeong","raw_affiliation_strings":["PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"PE Research Lab, DRAM PE SK Hynix, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I134353371"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5013292058"],"corresponding_institution_ids":["https://openalex.org/I134353371"],"apc_list":null,"apc_paid":null,"fwci":0.231,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52351916,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7068657279014587},{"id":"https://openalex.org/keywords/plot","display_name":"Plot (graphics)","score":0.6830300092697144},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6686223149299622},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6565961241722107},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.6515992879867554},{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.6279463171958923},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.43609076738357544},{"id":"https://openalex.org/keywords/diagram","display_name":"Diagram","score":0.43522676825523376},{"id":"https://openalex.org/keywords/scatter-plot","display_name":"Scatter plot","score":0.4305342733860016},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37787848711013794},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07982996106147766},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.07725152373313904}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7068657279014587},{"id":"https://openalex.org/C167651023","wikidata":"https://www.wikidata.org/wiki/Q1474611","display_name":"Plot (graphics)","level":2,"score":0.6830300092697144},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6686223149299622},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6565961241722107},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.6515992879867554},{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.6279463171958923},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.43609076738357544},{"id":"https://openalex.org/C186399060","wikidata":"https://www.wikidata.org/wiki/Q959962","display_name":"Diagram","level":2,"score":0.43522676825523376},{"id":"https://openalex.org/C31462909","wikidata":"https://www.wikidata.org/wiki/Q1045782","display_name":"Scatter plot","level":2,"score":0.4305342733860016},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37787848711013794},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07982996106147766},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.07725152373313904},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc44778.2020.9325279","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44778.2020.9325279","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W282702537","https://openalex.org/W2098928979","https://openalex.org/W2149155748","https://openalex.org/W2791561716","https://openalex.org/W2921101359","https://openalex.org/W2949906277"],"related_works":["https://openalex.org/W4320303648","https://openalex.org/W2263439615","https://openalex.org/W3214510223","https://openalex.org/W3112288064","https://openalex.org/W2489311714","https://openalex.org/W3019306865","https://openalex.org/W3112335861","https://openalex.org/W2615990358","https://openalex.org/W4390570946","https://openalex.org/W4399548037"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,13,28,64],"method":[4],"for":[5,112],"the":[6,9,17,38,51,59,70,73,88,108,114,122,133,139,147,153,157],"evaluation":[7],"of":[8,12,69,87,156],"eye":[10,123,130],"diagram":[11,131],"signal":[14,101,109,140],"by":[15,42],"analyzing":[16],"atypical":[18,90],"Shmoo":[19,60,91,135],"plot":[20,61,136],"extracted":[21,62,89,134,148],"from":[22,132],"an":[23,43,79,129],"automatic":[24,158],"test":[25,159],"equipment":[26],"using":[27,63],"loopback":[29,32],"technique.":[30],"The":[31,125],"technique":[33],"was":[34,82],"used":[35],"to":[36,49,84,137,151],"minimize":[37],"external":[39],"noise":[40],"generated":[41],"oscilloscope,":[44],"thereby":[45],"making":[46],"it":[47],"easier":[48],"measure":[50],"signals":[52,71],"and":[53,97,100,117,143],"collect":[54],"raw":[55,149],"data.":[56],"In":[57],"addition,":[58],"shorting":[65],"package":[66],"enables":[67],"analyses":[68],"entering":[72],"device":[74],"in":[75,121],"actual":[76],"situations.":[77],"Subsequently,":[78],"analysis":[80,126],"tool":[81,106,127],"developed":[83],"investigate":[85],"characteristics":[86],"plot,":[92],"such":[93],"as":[94],"jitter,":[95],"rise":[96],"fall":[98],"time,":[99],"data":[102,150],"rate.":[103],"Furthermore,":[104],"this":[105],"indicates":[107],"loss":[110],"rate":[111],"all":[113],"pass":[115],"zones":[116],"center":[118],"point":[119],"deviations":[120],"diagram.":[124],"produces":[128],"determine":[138,152],"quality":[141],"status":[142],"also":[144],"statistically":[145],"analyzes":[146],"process":[154],"capability":[155],"equipment.":[160]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}