{"id":"https://openalex.org/W3126059759","doi":"https://doi.org/10.1109/itc44778.2020.9325272","title":"Functional Criticality Classification of Structural Faults in AI Accelerators","display_name":"Functional Criticality Classification of Structural Faults in AI Accelerators","publication_year":2020,"publication_date":"2020-11-01","ids":{"openalex":"https://openalex.org/W3126059759","doi":"https://doi.org/10.1109/itc44778.2020.9325272","mag":"3126059759"},"language":"en","primary_location":{"id":"doi:10.1109/itc44778.2020.9325272","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44778.2020.9325272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090354528","display_name":"Arjun Chaudhuri","orcid":"https://orcid.org/0000-0001-9353-6397"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Arjun Chaudhuri","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017274857","display_name":"Jonti Talukdar","orcid":"https://orcid.org/0000-0001-7079-5281"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jonti Talukdar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101754630","display_name":"Fei Su","orcid":"https://orcid.org/0000-0002-3536-8126"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fei Su","raw_affiliation_strings":["Intel Corporation, Folsom, CA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Folsom, CA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090354528"],"corresponding_institution_ids":["https://openalex.org/I170897317"],"apc_list":null,"apc_paid":null,"fwci":1.5412,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.83405359,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.9432361125946045},{"id":"https://openalex.org/keywords/mnist-database","display_name":"MNIST database","score":0.8740037679672241},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7670269012451172},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5893133878707886},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5750476717948914},{"id":"https://openalex.org/keywords/failure-mode-effects-and-criticality-analysis","display_name":"Failure mode, effects, and criticality analysis","score":0.5266345143318176},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4586314260959625},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.33710572123527527}],"concepts":[{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.9432361125946045},{"id":"https://openalex.org/C190502265","wikidata":"https://www.wikidata.org/wiki/Q17069496","display_name":"MNIST database","level":3,"score":0.8740037679672241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7670269012451172},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5893133878707886},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5750476717948914},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.5266345143318176},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4586314260959625},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33710572123527527},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc44778.2020.9325272","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44778.2020.9325272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2099471712","https://openalex.org/W2112796928","https://openalex.org/W2137061486","https://openalex.org/W2289252105","https://openalex.org/W2506467271","https://openalex.org/W2606722458","https://openalex.org/W2767260595","https://openalex.org/W2893813411","https://openalex.org/W2944349874","https://openalex.org/W2954535151","https://openalex.org/W2963684088","https://openalex.org/W3008838787","https://openalex.org/W4320013936","https://openalex.org/W6685352114"],"related_works":["https://openalex.org/W2361355225","https://openalex.org/W2030439800","https://openalex.org/W1582034041","https://openalex.org/W2094868523","https://openalex.org/W2352957805","https://openalex.org/W125625301","https://openalex.org/W2384212105","https://openalex.org/W2313929543","https://openalex.org/W4239638359","https://openalex.org/W1979768108"],"abstract_inverted_index":{"The":[0,101],"ubiquitous":[1],"application":[2],"of":[3,25,42,50,85,92],"deep":[4],"neural":[5],"networks":[6,99],"(DNNs)":[7],"has":[8],"led":[9],"to":[10,58,80,108],"a":[11,51,74],"rise":[12],"in":[13,29,45],"demand":[14],"for":[15],"artificial":[16],"intelligence":[17],"(AI)":[18],"accelerators.":[19],"This":[20],"paper":[21],"studies":[22],"the":[23,40,46,62,82,90],"problem":[24,91],"classifying":[26],"structural":[27],"faults":[28,44],"such":[30],"an":[31],"accelerator":[32],"based":[33,78],"on":[34,61],"their":[35],"functional":[36,83,115],"criticality.":[37],"We":[38,72,88],"analyze":[39],"impact":[41],"stuck-at":[43],"processing":[47],"elements":[48],"(PEs)":[49],"$128":[52],"\\times":[53],"128$":[54],"systolic":[55],"array":[56],"designed":[57],"perform":[59],"classification":[60],"MNIST":[63],"dataset":[64],"using":[65],"both":[66],"32-bit":[67],"and":[68],"16-bit":[69],"data":[70],"paths.":[71],"present":[73],"two-tier":[75,102],"machine-learning":[76],"(ML)":[77],"method":[79,106],"assess":[81],"criticality":[84,104,116],"these":[86],"faults.":[87],"address":[89],"minimizing":[93],"misclassification":[94],"by":[95],"utilizing":[96],"generative":[97],"adversarial":[98],"(GANs).":[100],"ML/GAN-based":[103],"assessment":[105],"leads":[107],"less":[109],"than":[110],"1%":[111],"test":[112],"escapes":[113],"during":[114],"evaluation.":[117]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}