{"id":"https://openalex.org/W3121343024","doi":"https://doi.org/10.1109/itc44778.2020.9325239","title":"On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors","display_name":"On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors","publication_year":2020,"publication_date":"2020-11-01","ids":{"openalex":"https://openalex.org/W3121343024","doi":"https://doi.org/10.1109/itc44778.2020.9325239","mag":"3121343024"},"language":"en","primary_location":{"id":"doi:10.1109/itc44778.2020.9325239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44778.2020.9325239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067758354","display_name":"Richard Bramley","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Richard Bramley","raw_affiliation_strings":["GPU Architecture NVIDIA, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"GPU Architecture NVIDIA, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110299873","display_name":"Yanxiang Huang","orcid":"https://orcid.org/0009-0003-2172-0074"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yanxiang Huang","raw_affiliation_strings":["GPU Architecture NVIDIA, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"GPU Architecture NVIDIA, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089359190","display_name":"Guangshan Duan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Guangshan Duan","raw_affiliation_strings":["GPU Architecture NVIDIA Shanghai, China"],"affiliations":[{"raw_affiliation_string":"GPU Architecture NVIDIA Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058543385","display_name":"N.R. Saxena","orcid":"https://orcid.org/0009-0001-1248-0721"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nirmal Saxena","raw_affiliation_strings":["GPU Architecture NVIDIA, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"GPU Architecture NVIDIA, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085364010","display_name":"Paul Racunas","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul Racunas","raw_affiliation_strings":["GPU Architecture NVIDIA, Westford, MA, USA"],"affiliations":[{"raw_affiliation_string":"GPU Architecture NVIDIA, Westford, MA, USA","institution_ids":["https://openalex.org/I4210127875"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5067758354"],"corresponding_institution_ids":["https://openalex.org/I4210127875"],"apc_list":null,"apc_paid":null,"fwci":0.2055,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.53377049,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"30","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7224321961402893},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.5463212132453918},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5394284725189209},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5375966429710388},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5336334109306335},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5003020763397217},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.49517789483070374},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44531187415122986},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2929385006427765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14239755272865295},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1145995557308197},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.08858481049537659}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7224321961402893},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.5463212132453918},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5394284725189209},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5375966429710388},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5336334109306335},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5003020763397217},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.49517789483070374},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44531187415122986},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2929385006427765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14239755272865295},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1145995557308197},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.08858481049537659},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc44778.2020.9325239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44778.2020.9325239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1965936844","https://openalex.org/W1972649107","https://openalex.org/W1976431848","https://openalex.org/W1990608831","https://openalex.org/W2072867273","https://openalex.org/W2106305072","https://openalex.org/W2109341366","https://openalex.org/W2115194678","https://openalex.org/W2117747343","https://openalex.org/W2123907700","https://openalex.org/W2144512449","https://openalex.org/W2158907675","https://openalex.org/W2234891566","https://openalex.org/W2341534752","https://openalex.org/W2901848761","https://openalex.org/W2903464615","https://openalex.org/W2967526496","https://openalex.org/W3215500439","https://openalex.org/W4232837724","https://openalex.org/W4249144718","https://openalex.org/W4250303214"],"related_works":["https://openalex.org/W2372318178","https://openalex.org/W3209466718","https://openalex.org/W2337334590","https://openalex.org/W2524718329","https://openalex.org/W3216201951","https://openalex.org/W1530507059","https://openalex.org/W2355543518","https://openalex.org/W2267274201","https://openalex.org/W2143925077","https://openalex.org/W3168522962"],"abstract_inverted_index":{"Accurate":[0],"determination":[1],"of":[2,7],"the":[3,30],"safe-fault":[4],"failure":[5],"rate":[6],"complex":[8],"digital":[9],"designs":[10],"is":[11],"an":[12],"exascale":[13],"problem.":[14],"We":[15,40],"present":[16],"a":[17,26,45],"novel":[18],"measurement":[19],"methodology":[20,46],"and":[21,32],"results":[22],"which":[23],"could":[24],"have":[25],"profound":[27],"impact":[28],"on":[29],"performance":[31],"availability":[33],"for":[34,47],"GPUs":[35],"in":[36],"safety":[37],"critical":[38],"systems.":[39],"extend":[41],"our":[42],"analysis":[43],"with":[44],"in-the-field":[48],"verification.":[49]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}