{"id":"https://openalex.org/W3008391163","doi":"https://doi.org/10.1109/itc44170.2019.9000137","title":"International Symposium on Design and Diagnostics of Electronic Circuits and Systems","display_name":"International Symposium on Design and Diagnostics of Electronic Circuits and Systems","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3008391163","doi":"https://doi.org/10.1109/itc44170.2019.9000137","mag":"3008391163"},"language":"en","primary_location":{"id":"doi:10.1109/itc44170.2019.9000137","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000137","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025739407","display_name":"Zoran Stamenkovi\u0107","orcid":"https://orcid.org/0000-0002-6078-413X"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]},{"id":"https://openalex.org/I96578850","display_name":"Leibniz Institute for Neurobiology","ror":"https://ror.org/01zwmgk08","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I96578850"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Zoran Stamenkovic","raw_affiliation_strings":["IHP - Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany","IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I96578850"]},{"raw_affiliation_string":"IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I2800958632","display_name":"Institut des Nanotechnologies de Lyon","ror":"https://ror.org/04jsk0b74","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I112936343","https://openalex.org/I113428412","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I2800958632","https://openalex.org/I4405259976","https://openalex.org/I4405263940","https://openalex.org/I48430043","https://openalex.org/I48430043","https://openalex.org/I59692284"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alberto Bosio","raw_affiliation_strings":["Institute of Nanotechnology of Lyon, Ecole Centrale de Lyon,Ecully,France","INL - Conception de Syst\u00e8mes H\u00e9t\u00e9rog\u00e8nes"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Nanotechnology of Lyon, Ecole Centrale de Lyon,Ecully,France","institution_ids":["https://openalex.org/I2800958632","https://openalex.org/I112936343"]},{"raw_affiliation_string":"INL - Conception de Syst\u00e8mes H\u00e9t\u00e9rog\u00e8nes","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071446072","display_name":"Gy\u00f6rgy Cserey","orcid":"https://orcid.org/0000-0002-6836-1502"},"institutions":[{"id":"https://openalex.org/I1297592001","display_name":"Bionics Institute","ror":"https://ror.org/05e4f1b55","country_code":"AU","type":"facility","lineage":["https://openalex.org/I1297592001"]},{"id":"https://openalex.org/I31882830","display_name":"P\u00e1zm\u00e1ny P\u00e9ter Catholic University","ror":"https://ror.org/05v9kya57","country_code":"HU","type":"education","lineage":["https://openalex.org/I31882830"]}],"countries":["AU","HU"],"is_corresponding":false,"raw_author_name":"Gyorgy Cserey","raw_affiliation_strings":["Faculty of Information Technology and Bionics, Pazmany Peter Catholic University,Budapest,Hungary","Faculty of Information Technology and Bionics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology and Bionics, Pazmany Peter Catholic University,Budapest,Hungary","institution_ids":["https://openalex.org/I31882830"]},{"raw_affiliation_string":"Faculty of Information Technology and Bionics","institution_ids":["https://openalex.org/I1297592001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101706960","display_name":"Ond\u0159ej Nov\u00e1k","orcid":"https://orcid.org/0000-0002-3030-0616"},"institutions":[{"id":"https://openalex.org/I147009085","display_name":"Technical University of Liberec","ror":"https://ror.org/02jtk7k02","country_code":"CZ","type":"education","lineage":["https://openalex.org/I147009085"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Ondrej Novak","raw_affiliation_strings":["Faculty of Mechatronics and Interdis. Studies, Technical University of Liberec,Liberec,Czechia","Technical University of Liberec"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Mechatronics and Interdis. Studies, Technical University of Liberec,Liberec,Czechia","institution_ids":["https://openalex.org/I147009085"]},{"raw_affiliation_string":"Technical University of Liberec","institution_ids":["https://openalex.org/I147009085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056589147","display_name":"Witold A. Pleskacz","orcid":"https://orcid.org/0000-0001-7064-503X"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Witold Pleskacz","raw_affiliation_strings":["Institute of Microelectr. and Optoelectronics, Warsaw University of Technology,Warsaw,Poland","Warsaw University of Technology [Warsaw]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectr. and Optoelectronics, Warsaw University of Technology,Warsaw,Poland","institution_ids":["https://openalex.org/I108403487"]},{"raw_affiliation_string":"Warsaw University of Technology [Warsaw]","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055549968","display_name":"Luk\u00e1\u0161 Sekanina","orcid":"https://orcid.org/0000-0002-2693-9011"},"institutions":[{"id":"https://openalex.org/I60587646","display_name":"Brno University of Technology","ror":"https://ror.org/03613d656","country_code":"CZ","type":"education","lineage":["https://openalex.org/I60587646"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Lukas Sekanina","raw_affiliation_strings":["Faculty of Information Technology, Brno University of Technology,Brno,Czechia","Brno University of Technology  [Brno]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology, Brno University of Technology,Brno,Czechia","institution_ids":["https://openalex.org/I60587646"]},{"raw_affiliation_string":"Brno University of Technology  [Brno]","institution_ids":["https://openalex.org/I60587646"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006749662","display_name":"Andreas Steininger","orcid":"https://orcid.org/0000-0002-3847-1647"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Andreas Steininger","raw_affiliation_strings":["Institute of Computer Engineering, Vienna University of Technology,Vienna,Austria","Vienna University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering, Vienna University of Technology,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Vienna University of Technology","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030920745","display_name":"Goran M. Stojanovi\u0107","orcid":"https://orcid.org/0000-0003-2098-189X"},"institutions":[{"id":"https://openalex.org/I170726198","display_name":"University of Novi Sad","ror":"https://ror.org/00xa57a59","country_code":"RS","type":"education","lineage":["https://openalex.org/I170726198"]}],"countries":["RS"],"is_corresponding":false,"raw_author_name":"Goran Stojanovic","raw_affiliation_strings":["Faculty of Technical Sciences, University of Novi Sad,Novi Sad,Serbia","University of Novi Sad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Technical Sciences, University of Novi Sad,Novi Sad,Serbia","institution_ids":["https://openalex.org/I170726198"]},{"raw_affiliation_string":"University of Novi Sad","institution_ids":["https://openalex.org/I170726198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030204131","display_name":"Viera Stopjakov\u00e1","orcid":"https://orcid.org/0000-0002-0010-8965"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"Viera Stopjakova","raw_affiliation_strings":["Faculty of Elect. Eng. and Information Techn., Slovak University of Technology,Bratislava,Slovakia","Slovak University of Technology in Bratislava"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Elect. Eng. and Information Techn., Slovak University of Technology,Bratislava,Slovakia","institution_ids":["https://openalex.org/I110757952"]},{"raw_affiliation_string":"Slovak University of Technology in Bratislava","institution_ids":["https://openalex.org/I110757952"]}]}],"institutions":[],"countries_distinct_count":9,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.21157255,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"2019","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9341999888420105,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6760696172714233},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4420095682144165},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.436690092086792},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4343186020851135},{"id":"https://openalex.org/keywords/electronic-design","display_name":"Electronic design","score":0.41810745000839233},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38096046447753906},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.36607348918914795},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27170437574386597},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.12934750318527222},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.10569053888320923}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6760696172714233},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4420095682144165},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.436690092086792},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4343186020851135},{"id":"https://openalex.org/C2984557284","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design","level":2,"score":0.41810745000839233},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38096046447753906},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.36607348918914795},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27170437574386597},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.12934750318527222},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.10569053888320923},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/itc44170.2019.9000137","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000137","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03894952v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03894952","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2019 IEEE International Test Conference (ITC), Nov 2019, Washington, United States. pp.1-4, ⟨10.1109/ITC44170.2019.9000137⟩","raw_type":"Conference papers"},{"id":"mag:3090986304","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=202002228896949292","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W641782856","https://openalex.org/W24443521","https://openalex.org/W2471323292","https://openalex.org/W2296759459","https://openalex.org/W2045139758","https://openalex.org/W4205202004","https://openalex.org/W2188047296","https://openalex.org/W2352527711","https://openalex.org/W9484388","https://openalex.org/W4252286421"],"abstract_inverted_index":{"The":[0],"paper":[1],"is":[2],"a":[3,64],"contribution":[4],"to":[5,68],"the":[6,11,24,28,33,39,45,51,78],"50th":[7],"anniversary":[8],"celebration":[9],"of":[10,27,36,50,58],"International":[12,52],"Test":[13,19],"Conference":[14],"(ITC)":[15],"and":[16,31,48,56,61,75],"its":[17],"Global":[18],"Forum":[20],"(GTF),":[21],"which":[22,66],"honors":[23],"geographic":[25],"breadth":[26],"test":[29,70],"community":[30],"highlights":[32],"global":[34],"reach":[35],"ITC":[37],"during":[38],"past":[40],"50":[41],"years.":[42],"It":[43],"covers":[44],"past,":[46],"present,":[47],"future":[49],"Symposium":[53],"on":[54],"Design":[55],"Diagnostics":[57],"Electronic":[59],"Circuits":[60],"Systems":[62],"(DDECS),":[63],"symposium":[65],"belongs":[67],"prominent":[69],"technology":[71],"related":[72],"events":[73],"initiated":[74],"supported":[76],"by":[77],"ITC.":[79]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}