{"id":"https://openalex.org/W3007474556","doi":"https://doi.org/10.1109/itc44170.2019.9000134","title":"Device-Aware Test: A New Test Approach Towards DPPB Level","display_name":"Device-Aware Test: A New Test Approach Towards DPPB Level","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3007474556","doi":"https://doi.org/10.1109/itc44170.2019.9000134","mag":"3007474556"},"language":"en","primary_location":{"id":"doi:10.1109/itc44170.2019.9000134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000134","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-03504847v1/file/ITC_2019__Device_Aware_Test_2019-04-30_19-21.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014825211","display_name":"Moritz Fieback","orcid":"https://orcid.org/0000-0002-9782-393X"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Moritz Fieback","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology,Mekelweg 4, Delft,The Netherlands,2628CD","Computer Engineering Laboratory, Delft University of Technology, Mekelweg 4, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology,Mekelweg 4, Delft,The Netherlands,2628CD","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Mekelweg 4, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009217361","display_name":"Lizhou Wu","orcid":"https://orcid.org/0000-0003-4439-7436"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Lizhou Wu","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology,Mekelweg 4, Delft,The Netherlands,2628CD","Computer Engineering Laboratory, Delft University of Technology, Mekelweg 4, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology,Mekelweg 4, Delft,The Netherlands,2628CD","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Mekelweg 4, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101751601","display_name":"Guilherme Cardoso Medeiros","orcid":"https://orcid.org/0000-0002-7480-2474"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Guilherme Cardoso Medeiros","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology,Mekelweg 4, Delft,The Netherlands,2628CD","Computer Engineering Laboratory, Delft University of Technology, Mekelweg 4, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology,Mekelweg 4, Delft,The Netherlands,2628CD","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Mekelweg 4, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108828025","display_name":"Hassen Aziza","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Hassen Aziza","raw_affiliation_strings":["IM2NP, UMR CNRS 7334, Aix-Marseille Université,38 rue Joliot Curie, Marseille,France,F-13451","IM2NP, UMR CNRS 7334, Aix-Marseille Universit\u00e9, 38 rue Joliot Curie, Marseille, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IM2NP, UMR CNRS 7334, Aix-Marseille Université,38 rue Joliot Curie, Marseille,France,F-13451","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767"]},{"raw_affiliation_string":"IM2NP, UMR CNRS 7334, Aix-Marseille Universit\u00e9, 38 rue Joliot Curie, Marseille, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210112016"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002378343","display_name":"Siddharth Rao","orcid":"https://orcid.org/0000-0001-6161-3052"},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Siddharth Rao","raw_affiliation_strings":["IMEC,Kapeldreef 75, Leuven,Belgium,B-3001","IMEC, Kapeldreef 75, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC,Kapeldreef 75, Leuven,Belgium,B-3001","institution_ids":["https://openalex.org/I196972281","https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044629739","display_name":"Erik Jan Marinissen","orcid":"https://orcid.org/0000-0002-5058-8303"},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Erik Jan Marinissen","raw_affiliation_strings":["IMEC,Kapeldreef 75, Leuven,Belgium,B-3001","IMEC, Kapeldreef 75, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC,Kapeldreef 75, Leuven,Belgium,B-3001","institution_ids":["https://openalex.org/I196972281","https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042250419","display_name":"Mottaqiallah Taouil","orcid":"https://orcid.org/0000-0002-9911-4846"},"institutions":[{"id":"https://openalex.org/I4210134898","display_name":"J.M. Burgerscentrum","ror":"https://ror.org/035jnav47","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210134898"]},{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mottaqiallah Taouil","raw_affiliation_strings":["CognitiveIC,Van der Burghweg 1, Delft,The Netherlands,2628CS","CognitiveIC, Van der Burghweg 1, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CognitiveIC,Van der Burghweg 1, Delft,The Netherlands,2628CS","institution_ids":["https://openalex.org/I4210134898","https://openalex.org/I4210164637"]},{"raw_affiliation_string":"CognitiveIC, Van der Burghweg 1, Delft, The Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I4210134898","display_name":"J.M. Burgerscentrum","ror":"https://ror.org/035jnav47","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210134898"]},{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["CognitiveIC,Van der Burghweg 1, Delft,The Netherlands,2628CS","CognitiveIC, Van der Burghweg 1, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CognitiveIC,Van der Burghweg 1, Delft,The Netherlands,2628CS","institution_ids":["https://openalex.org/I4210134898","https://openalex.org/I4210164637"]},{"raw_affiliation_string":"CognitiveIC, Van der Burghweg 1, Delft, The Netherlands","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":68,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.7401437163352966},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5668644905090332},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5564172267913818},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5304840207099915},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.495008647441864},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.48664745688438416},{"id":"https://openalex.org/keywords/random-access","display_name":"Random access","score":0.46745166182518005},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4515950381755829},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44679901003837585},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4455545246601105},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.43911212682724},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4114637076854706},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3365422785282135},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24021315574645996},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2209411859512329},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.20604172348976135},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10854488611221313},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.08788233995437622},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08523967862129211}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.7401437163352966},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5668644905090332},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5564172267913818},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5304840207099915},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.495008647441864},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.48664745688438416},{"id":"https://openalex.org/C101722063","wikidata":"https://www.wikidata.org/wiki/Q218825","display_name":"Random access","level":2,"score":0.46745166182518005},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4515950381755829},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44679901003837585},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4455545246601105},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.43911212682724},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4114637076854706},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3365422785282135},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24021315574645996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2209411859512329},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.20604172348976135},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10854488611221313},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08788233995437622},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08523967862129211},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/itc44170.2019.9000134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000134","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03504847v1","is_oa":true,"landing_page_url":"https://hal.science/hal-03504847","pdf_url":"https://hal.science/hal-03504847v1/file/ITC_2019__Device_Aware_Test_2019-04-30_19-21.pdf","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2019 IEEE International Test Conference (ITC), Nov 2019, Washington, United States. pp.1-10, ⟨10.1109/ITC44170.2019.9000134⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:tudelft.nl:uuid:eebca2ca-eee2-4cfb-bcef-6aa49eb7684b","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:eebca2ca-eee2-4cfb-bcef-6aa49eb7684b","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-03504847v1","is_oa":true,"landing_page_url":"https://hal.science/hal-03504847","pdf_url":"https://hal.science/hal-03504847v1/file/ITC_2019__Device_Aware_Test_2019-04-30_19-21.pdf","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2019 IEEE International Test Conference (ITC), Nov 2019, Washington, United States. pp.1-10, ⟨10.1109/ITC44170.2019.9000134⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3007474556.pdf","grobid_xml":"https://content.openalex.org/works/W3007474556.grobid-xml"},"referenced_works_count":46,"referenced_works":["https://openalex.org/W155286498","https://openalex.org/W1652447308","https://openalex.org/W1677852443","https://openalex.org/W1961775031","https://openalex.org/W1963076157","https://openalex.org/W1971319818","https://openalex.org/W1980732266","https://openalex.org/W1982533447","https://openalex.org/W2004823737","https://openalex.org/W2007506199","https://openalex.org/W2008990681","https://openalex.org/W2010160963","https://openalex.org/W2016923128","https://openalex.org/W2022318845","https://openalex.org/W2025535306","https://openalex.org/W2028036252","https://openalex.org/W2034030717","https://openalex.org/W2061761071","https://openalex.org/W2061946964","https://openalex.org/W2096007426","https://openalex.org/W2103657905","https://openalex.org/W2106246015","https://openalex.org/W2106935654","https://openalex.org/W2124058650","https://openalex.org/W2124692465","https://openalex.org/W2125263803","https://openalex.org/W2132188866","https://openalex.org/W2152422320","https://openalex.org/W2163160035","https://openalex.org/W2165911664","https://openalex.org/W2169375167","https://openalex.org/W2237390331","https://openalex.org/W2583536366","https://openalex.org/W2585010444","https://openalex.org/W2744406216","https://openalex.org/W2786883037","https://openalex.org/W2911925285","https://openalex.org/W2914110167","https://openalex.org/W2921386757","https://openalex.org/W2926843349","https://openalex.org/W2957233579","https://openalex.org/W2967501850","https://openalex.org/W2968659011","https://openalex.org/W4236231374","https://openalex.org/W4252884382","https://openalex.org/W6685073862"],"related_works":["https://openalex.org/W2076211355","https://openalex.org/W2007070351","https://openalex.org/W2033811947","https://openalex.org/W2183989414","https://openalex.org/W1551399929","https://openalex.org/W2038212394","https://openalex.org/W2620406532","https://openalex.org/W2410132916","https://openalex.org/W2104937488","https://openalex.org/W2725431849"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,35,38,41,48,86,161,174],"new":[4,169],"test":[5,103,156],"approach":[6,16,54,106,132,170],"that":[7,34,129,140,149],"goes":[8],"beyond":[9],"cell-aware":[10],"test,":[11],"i.e.,":[12],"device-aware":[13],"test.":[14],"The":[15,28,105,126,168],"consists":[17],"of":[18,62,70],"three":[19],"steps:":[20],"defect":[21,29,36,65],"modeling,":[22,24],"fault":[23,88,92,99],"and":[25,73,101,118],"test/DfT":[26],"development.":[27],"modeling":[30],"does":[31],"not":[32,142],"assume":[33],"in":[37,177],"device":[39,72],"(or":[40],"cell)":[42],"can":[43],"be":[44],"modeled":[45],"electrically":[46],"as":[47,158],"linear":[49],"resistor":[50],"(as":[51],"the":[52,60,63,67,71,80,130,145,150,182],"traditional":[53,146],"suggests),":[55],"but":[56],"it":[57],"rather":[58],"incorporates":[59],"impact":[61],"physical":[64],"on":[66,75,91],"technology":[68],"parameters":[69],"thereafter":[74],"its":[76],"electrical":[77,82],"parameters.":[78],"Once":[79],"defective":[81,162],"model":[83],"is":[84,94,107,133],"defined,":[85],"systematic":[87],"analysis":[89],"(based":[90],"simulation)":[93],"performed":[95],"to":[96,135,154],"derive":[97],"appropriate":[98],"models":[100],"subsequently":[102],"solutions.":[104],"demonstrated":[108],"using":[109],"two":[110,184],"memory":[111,116,124,186],"technologies:":[112],"resistive":[113],"random":[114,122],"access":[115,123],"(RRAM)":[117],"spin-transfer":[119],"torque":[120],"magnetic":[121],"(STT-MRAM).":[125],"results":[127],"show":[128],"proposed":[131],"able":[134],"sensitize":[136],"faults":[137],"for":[138,160,179],"defects":[139],"are":[141],"detected":[143],"with":[144],"approach,":[147],"meaning":[148],"latter":[151],"cannot":[152],"lead":[153],"high-quality":[155],"solutions":[157],"required":[159],"part":[163],"per":[164],"billion":[165],"(DPPB)":[166],"level.":[167],"clearly":[171],"sets":[172],"up":[173],"turning":[175],"point":[176],"testing":[178],"at":[180],"least":[181],"considered":[183],"emerging":[185],"technologies.":[187]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":12},{"year":2021,"cited_by_count":18},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}