{"id":"https://openalex.org/W2973197679","doi":"https://doi.org/10.1109/itc44170.2019.9000123","title":"Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs","display_name":"Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W2973197679","doi":"https://doi.org/10.1109/itc44170.2019.9000123","mag":"2973197679"},"language":"en","primary_location":{"id":"doi:10.1109/itc44170.2019.9000123","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000123","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028691975","display_name":"Wim Dobbelaere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Wim Dobbelaere","raw_affiliation_strings":["ON Semiconductor,Oudenaarde,Belgium","ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor,Oudenaarde,Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067635473","display_name":"Frederik Colle","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Frederik Colle","raw_affiliation_strings":["ON Semiconductor,Oudenaarde,Belgium","ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor,Oudenaarde,Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017481892","display_name":"Anthony Coyette","orcid":"https://orcid.org/0000-0002-3221-4578"},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anthony Coyette","raw_affiliation_strings":["ON Semiconductor,Oudenaarde,Belgium","ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor,Oudenaarde,Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062808173","display_name":"Ronny Vanhooren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ronny Vanhooren","raw_affiliation_strings":["ON Semiconductor,Oudenaarde,Belgium","ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor,Oudenaarde,Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066688200","display_name":"Nektar Xama","orcid":"https://orcid.org/0000-0001-5286-1759"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nektar Xama","raw_affiliation_strings":["KU Leuven,Department of Electrical Engineering,Leuven,Belgium","Department of Electrical Engineering, KU Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven,Department of Electrical Engineering,Leuven,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081211811","display_name":"Jhon Gomez","orcid":"https://orcid.org/0000-0002-3676-1106"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jhon Gomez","raw_affiliation_strings":["KU Leuven,Department of Electrical Engineering,Leuven,Belgium","Department of Electrical Engineering, KU Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven,Department of Electrical Engineering,Leuven,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["KU Leuven,Department of Electrical Engineering,Leuven,Belgium","Department of Electrical Engineering, KU Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven,Department of Electrical Engineering,Leuven,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Department of Electrical Engineering, KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5028691975"],"corresponding_institution_ids":["https://openalex.org/I4210110772"],"apc_list":null,"apc_paid":null,"fwci":0.9538,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.76283875,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.8514020442962646},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.6078138947486877},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.5620295405387878},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5454673171043396},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5218988060951233},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.49215763807296753},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4790688455104828},{"id":"https://openalex.org/keywords/burn-in","display_name":"Burn-in","score":0.45271480083465576},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.42643147706985474},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4216432273387909},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.411907434463501},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35343584418296814},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3473585247993469},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32342809438705444},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07495677471160889}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.8514020442962646},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.6078138947486877},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.5620295405387878},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5454673171043396},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5218988060951233},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.49215763807296753},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4790688455104828},{"id":"https://openalex.org/C179707776","wikidata":"https://www.wikidata.org/wiki/Q662895","display_name":"Burn-in","level":2,"score":0.45271480083465576},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.42643147706985474},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4216432273387909},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.411907434463501},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35343584418296814},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3473585247993469},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32342809438705444},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07495677471160889},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc44170.2019.9000123","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc44170.2019.9000123","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1481383401","https://openalex.org/W1955440229","https://openalex.org/W1993765721","https://openalex.org/W2059795568","https://openalex.org/W2734838165","https://openalex.org/W2735061862"],"related_works":["https://openalex.org/W2758348730","https://openalex.org/W2132658806","https://openalex.org/W2031235560","https://openalex.org/W3210666397","https://openalex.org/W2350662357","https://openalex.org/W2972765784","https://openalex.org/W2160915513","https://openalex.org/W2161335888","https://openalex.org/W2378051443","https://openalex.org/W3036272329"],"abstract_inverted_index":{"The":[0],"test":[1],"and":[2,32],"design":[3],"methodology":[4,74],"currently":[5],"used":[6],"to":[7,16,30,59],"develop":[8],"automotive":[9],"mixed-signal":[10],"integrated":[11],"circuits,":[12],"is":[13],"not":[14,28],"sufficient":[15],"achieve":[17],"the":[18,46,61,77],"<;":[19],"10":[20],"PPB":[21],"quality":[22,62],"target.":[23],"In":[24],"particular":[25],"it":[26],"does":[27],"allow":[29],"activate":[31],"detect":[33],"all":[34],"latent":[35],"defects,":[36],"which":[37],"are":[38],"a":[39,70],"significant":[40],"cause":[41],"of":[42],"vehicle":[43],"failures":[44],"in":[45,57,67],"field.":[47],"This":[48],"paper":[49],"discusses":[50],"whether":[51,65],"full":[52],"burn-in":[53],"will":[54,75],"be":[55],"needed":[56],"order":[58],"meet":[60],"goal,":[63],"or":[64],"Vstress":[66],"combination":[68],"with":[69],"defect":[71],"activation":[72],"coverage":[73],"do":[76],"job.":[78]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}