{"id":"https://openalex.org/W7131285597","doi":"https://doi.org/10.1109/itc-asia67627.2025.00025","title":"Fault Injection and Tolerance Analysis of Battery Management Systems Using SystemC-AMS","display_name":"Fault Injection and Tolerance Analysis of Battery Management Systems Using SystemC-AMS","publication_year":2025,"publication_date":"2025-12-16","ids":{"openalex":"https://openalex.org/W7131285597","doi":"https://doi.org/10.1109/itc-asia67627.2025.00025"},"language":null,"primary_location":{"id":"doi:10.1109/itc-asia67627.2025.00025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia67627.2025.00025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039539756","display_name":"Hao-Yang Chi","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hao-Yang Chi","raw_affiliation_strings":["National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029346217","display_name":"Chih-Tsun Huang","orcid":"https://orcid.org/0000-0002-0214-6826"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Tsun Huang","raw_affiliation_strings":["National Tsing Hua University,Computer Science,Hsinchu,Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Computer Science,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110204273","display_name":"Jing-Jia Liou","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jing-Jia Liou","raw_affiliation_strings":["National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Tsing Hua University,Department of Electrical Engineering,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029792346","display_name":"H. H. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148979","display_name":"MediaTek (Taiwan)","ror":"https://ror.org/05g9jck81","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210148979"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Harry Chen","raw_affiliation_strings":["MediaTek Inc.,Hsinchu,Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MediaTek Inc.,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210148979"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.58070164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"96","last_page":"101"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.3889999985694885,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.3889999985694885,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.2029999941587448,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.05050000175833702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6559000015258789},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5990999937057495},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5432000160217285},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.48649999499320984},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.46790000796318054},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.448199987411499},{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.41280001401901245},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.376800000667572}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7384999990463257},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6559000015258789},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5990999937057495},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5432000160217285},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.48649999499320984},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.46889999508857727},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.46790000796318054},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.448199987411499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.445499986410141},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.420199990272522},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.41280001401901245},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.376800000667572},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3718999922275543},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.35839998722076416},{"id":"https://openalex.org/C132835097","wikidata":"https://www.wikidata.org/wiki/Q7663745","display_name":"System safety","level":2,"score":0.3479999899864197},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.3212999999523163},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.3197999894618988},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.3027999997138977},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.28360000252723694},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2630000114440918},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.25859999656677246},{"id":"https://openalex.org/C149629883","wikidata":"https://www.wikidata.org/wiki/Q660926","display_name":"Fraction (chemistry)","level":2,"score":0.2531000077724457},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.2502000033855438}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia67627.2025.00025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia67627.2025.00025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.699133574962616,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2032952916","https://openalex.org/W2133496267","https://openalex.org/W2521889106","https://openalex.org/W2588943218","https://openalex.org/W2944551229","https://openalex.org/W2970120812","https://openalex.org/W3202060642","https://openalex.org/W4296394352","https://openalex.org/W4320038365","https://openalex.org/W4378449568","https://openalex.org/W4381050937","https://openalex.org/W4394994369","https://openalex.org/W4407690888"],"related_works":[],"abstract_inverted_index":{"Battery":[0],"management":[1],"system":[2],"(BMS)":[3],"is":[4],"a":[5,21,48],"key":[6],"component":[7],"to":[8,34,104],"keep":[9],"battery":[10],"packs":[11],"operating":[12],"in":[13],"safe":[14],"and":[15,30,38,62,82,95,106,111,116,126],"enduring":[16],"conditions.":[17,58],"This":[18],"paper":[19],"presents":[20],"SystemC-AMS\u2013based":[22],"BMS":[23,28],"simulation":[24],"platform":[25],"including":[26],"both":[27,123],"control":[29],"cell":[31],"modeling":[32],"designed":[33],"support":[35],"fault":[36,44],"injection":[37,45],"modular":[39],"protection":[40,121],"analysis.":[41],"Through":[42],"single-bit":[43],"experiments,":[46],"only":[47],"small":[49],"fraction":[50],"(12.8%)":[51],"of":[52],"injected":[53],"faults":[54,73],"violate":[55],"the":[56,68,93,100,124],"safety":[57,97,133],"And":[59],"SOC":[60,117,127],"estimation":[61],"ADC":[63,115,125],"modules":[64],"are":[65],"identified":[66],"as":[67,79],"most":[69],"critical":[70],"components":[71],"with":[72],"covering":[74],"all":[75,132],"severe":[76],"conditions":[77],"such":[78],"overcharge,":[80],"overdischarge":[81],"overheating.":[83],"After":[84],"applying":[85],"dual":[86],"module":[87],"redundancy":[88],"(DMR),":[89],"we":[90,129],"can":[91,130],"enhance":[92],"reliability":[94],"reduce":[96],"violations":[98],"from":[99],"original":[101],"92321":[102],"errors":[103,108],"72020":[105],"7860":[107],"or":[109],"78.01%":[110],"8.51%,":[112],"respectively":[113],"for":[114,122],"modules.":[118],"With":[119],"DMR":[120],"modules,":[128],"eliminate":[131],"violations.":[134]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-02-25T00:00:00"}