{"id":"https://openalex.org/W4402390145","doi":"https://doi.org/10.1109/itc-asia62534.2024.10661358","title":"ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery","display_name":"ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery","publication_year":2024,"publication_date":"2024-08-18","ids":{"openalex":"https://openalex.org/W4402390145","doi":"https://doi.org/10.1109/itc-asia62534.2024.10661358"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia62534.2024.10661358","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia62534.2024.10661358","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101630605","display_name":"Jiajia Zhang","orcid":"https://orcid.org/0000-0002-9362-4060"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiajia Zhang","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054955949","display_name":"Zhenmin Li","orcid":"https://orcid.org/0000-0003-3279-9083"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenmin Li","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059839025","display_name":"Gaoyang Shan","orcid":"https://orcid.org/0000-0001-6763-177X"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gaoyang Shan","raw_affiliation_strings":["Ajou University,Department of Software and Computer Engineering,Suwon,Korea"],"affiliations":[{"raw_affiliation_string":"Ajou University,Department of Software and Computer Engineering,Suwon,Korea","institution_ids":["https://openalex.org/I57664883"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115883269","display_name":"Jie Song","orcid":"https://orcid.org/0000-0002-0846-7591"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Song","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038153401","display_name":"Xing Guo","orcid":"https://orcid.org/0000-0003-2676-6744"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Guo","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology,Department of Computer Science and Networks,Fukuoka,Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology,Department of Computer Science and Networks,Fukuoka,Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101630605"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12744719,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.8398958444595337},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6209924817085266},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.509769856929779},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4081594944000244},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4069772958755493},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.40414315462112427},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3250044286251068},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25578656792640686},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.11919820308685303},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.10223865509033203}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.8398958444595337},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6209924817085266},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.509769856929779},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4081594944000244},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4069772958755493},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.40414315462112427},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3250044286251068},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25578656792640686},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.11919820308685303},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.10223865509033203},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia62534.2024.10661358","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia62534.2024.10661358","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1659671481","https://openalex.org/W1899181454","https://openalex.org/W1995355345","https://openalex.org/W2015524290","https://openalex.org/W2277435279","https://openalex.org/W2293212301","https://openalex.org/W2558274594","https://openalex.org/W2587844224","https://openalex.org/W2908633424","https://openalex.org/W2923710620","https://openalex.org/W2954322948","https://openalex.org/W3000209635","https://openalex.org/W4280650494","https://openalex.org/W4281611099","https://openalex.org/W4308544387","https://openalex.org/W4312546227","https://openalex.org/W4393032545"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W764628369","https://openalex.org/W2990896947","https://openalex.org/W1502430142","https://openalex.org/W2155141467"],"abstract_inverted_index":{"As":[0],"the":[1,72,89,94,100,109],"semiconductor":[2],"technology":[3],"continues":[4],"to":[5,14,44],"advance,":[6],"integrated":[7],"circuits":[8],"(ICs)":[9],"are":[10,67],"becoming":[11],"increasingly":[12],"sensitive":[13],"soft":[15],"errors,":[16],"e.g.,":[17],"double-node":[18],"upsets":[19,23],"(DNUs)":[20],"and":[21,42,59,63,97],"triplenode":[22],"(TNUs),":[24],"induced":[25],"by":[26],"harsh":[27],"radiation.":[28],"In":[29],"this":[30],"paper,":[31],"a":[32,60],"low-cost":[33],"latch":[34,115],"design,":[35],"namely":[36],"ICLTR,":[37],"using":[38],"input-split":[39],"inverters":[40],"(ISIs)":[41],"C-elements":[43,58],"provide":[45],"complete":[46,73],"TNU":[47,74,113],"recovery,":[48],"is":[49],"proposed.":[50],"ICLTR":[51,84],"consists":[52],"of":[53,88,93,99,112],"seven":[54,56],"ISIs,":[55],"2-input":[57],"clock-gated":[61],"inverter,":[62],"all":[64],"these":[65],"elements":[66],"interlocked.":[68],"Simulation":[69],"results":[70,80],"show":[71,82],"recovery":[75,114],"for":[76],"ICLTR.":[77],"The":[78],"simulation":[79],"also":[81],"that":[83],"can":[85],"save":[86],"59.5%":[87],"transmission":[90],"delay,":[91],"36.1%":[92],"power":[95],"consumption":[96],"81.6%":[98],"delay-area-power":[101],"product":[102],"(DAPP)":[103],"on":[104],"average":[105],"when":[106],"compared":[107],"with":[108],"same":[110],"type":[111],"designs.":[116]},"counts_by_year":[],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}