{"id":"https://openalex.org/W4402389967","doi":"https://doi.org/10.1109/itc-asia62534.2024.10661346","title":"A RO-Integrated-LFSR-Based Nonlinear Strong PUF with Intrinsic Modeling Attacks Resilience","display_name":"A RO-Integrated-LFSR-Based Nonlinear Strong PUF with Intrinsic Modeling Attacks Resilience","publication_year":2024,"publication_date":"2024-08-18","ids":{"openalex":"https://openalex.org/W4402389967","doi":"https://doi.org/10.1109/itc-asia62534.2024.10661346"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia62534.2024.10661346","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia62534.2024.10661346","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038200433","display_name":"Jingchang Bian","orcid":"https://orcid.org/0000-0002-4182-0553"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingchang Bian","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084787075","display_name":"Ruixiang Liu","orcid":"https://orcid.org/0009-0007-0779-4535"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruixiang Liu","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101081709","display_name":"Yankun Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yankun Lin","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029480162","display_name":"Zhao Yang","orcid":"https://orcid.org/0009-0001-6068-4374"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao Yang","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104384992","display_name":"Huaguo Liang","orcid":"https://orcid.org/0000-0002-2539-7062"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaguo Liang","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9833999872207642,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9682999849319458,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.8051072359085083},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.6070195436477661},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.514444887638092},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5091704726219177},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2466871440410614},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18546581268310547},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.12088432908058167},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.0742378830909729}],"concepts":[{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.8051072359085083},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.6070195436477661},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.514444887638092},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5091704726219177},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2466871440410614},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18546581268310547},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.12088432908058167},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0742378830909729},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia62534.2024.10661346","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia62534.2024.10661346","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W124944822","https://openalex.org/W2123482651","https://openalex.org/W2157440034","https://openalex.org/W2186373062","https://openalex.org/W2577417592","https://openalex.org/W2752832485","https://openalex.org/W2909319943","https://openalex.org/W2969755697","https://openalex.org/W2984020543","https://openalex.org/W3009034279","https://openalex.org/W3093600875","https://openalex.org/W3153089393","https://openalex.org/W4230927117","https://openalex.org/W4249899149","https://openalex.org/W4285303121","https://openalex.org/W4286377434","https://openalex.org/W4293026117","https://openalex.org/W4308479839","https://openalex.org/W4367313937","https://openalex.org/W4380361809","https://openalex.org/W4382677525","https://openalex.org/W4386634454","https://openalex.org/W4404133935","https://openalex.org/W6676995458","https://openalex.org/W6765207028"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2391979783","https://openalex.org/W2101477403","https://openalex.org/W4245086458","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890"],"abstract_inverted_index":{"Physical":[0],"Unclonable":[1],"Functions":[2],"(PUF)":[3],"are":[4],"important":[5],"hardware":[6,91],"security":[7,27],"primitives":[8],"used":[9],"for":[10],"generating":[11],"keys":[12],"and":[13,44,102,109,135],"identity":[14],"authentication,":[15],"with":[16],"wide":[17],"applications":[18],"in":[19,38,90,131],"the":[20,26,39,85,100,115,125],"Internet":[21],"of":[22,28,41,52,87,105],"Things":[23],"security.":[24],"However,":[25],"strong":[29],"PUF":[30,43,60,117,127],"faces":[31],"serious":[32],"threats":[33],"from":[34,75],"modeling":[35,67,122],"attacks,":[36],"especially":[37],"case":[40],"Arbiter":[42],"their":[45],"variants":[46],"that":[47,63,114],"involve":[48],"additive":[49],"linear":[50],"integration":[51],"entropy":[53,88,94],"sources.":[54],"This":[55],"paper":[56],"proposes":[57],"a":[58,80],"Ring-Oscillator-Integrated-Linear-Feedback-Shift-Register-based":[59],"(ROinLFSR":[61],"PUF)":[62],"achieves":[64,128],"immunity":[65],"to":[66],"attacks":[68],"by":[69],"highly":[70],"nonlinearly":[71],"integrating":[72],"independent":[73],"responses":[74],"weak":[76],"RO":[77],"PUFs":[78],"using":[79],"configurable":[81],"LFSR.":[82],"To":[83],"increase":[84],"efficiency":[86],"extraction":[89,96],"resources,":[92],"dual":[93],"sources":[95],"is":[97],"performed":[98],"on":[99],"period":[101],"duty":[103],"cycle":[104],"RO.":[106],"Python":[107],"simulation":[108],"FPGA":[110],"experimental":[111],"results":[112,130],"demonstrate":[113],"proposed":[116,126],"has":[118],"intrinsic":[119],"resilience":[120],"against":[121],"attacks.":[123],"And":[124],"good":[129],"reliability,":[132],"uniqueness,":[133],"uniformity,":[134],"randomness.":[136]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}