{"id":"https://openalex.org/W4388117340","doi":"https://doi.org/10.1109/itc-asia58802.2023.10301187","title":"Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness","display_name":"Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness","publication_year":2023,"publication_date":"2023-09-12","ids":{"openalex":"https://openalex.org/W4388117340","doi":"https://doi.org/10.1109/itc-asia58802.2023.10301187"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia58802.2023.10301187","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia58802.2023.10301187","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494v1/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]},{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China","School of Microelectronics, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085539633","display_name":"Chao Zhou","orcid":"https://orcid.org/0000-0002-6205-2573"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Zhou","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014391272","display_name":"Shaojie Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaojie Wei","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081525426","display_name":"Jie Cui","orcid":"https://orcid.org/0000-0001-7258-3418"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Cui","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China","School of Microelectronics, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["University of Montpellier / CNRS,Laboratory of Informatics, Robotics and Microelectronics of Montpellier,Montpellier,France","Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"University of Montpellier / CNRS,Laboratory of Informatics, Robotics and Microelectronics of Montpellier,Montpellier,France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology,Graduate School of Computer Science and Systems Engineering,Fukuoka,Japan","Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology,Graduate School of Computer Science and Systems Engineering,Fukuoka,Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5072439444"],"corresponding_institution_ids":["https://openalex.org/I143868143","https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.2662,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55173075,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.8606345653533936},{"id":"https://openalex.org/keywords/transmission-gate","display_name":"Transmission gate","score":0.7718843221664429},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.708051323890686},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.7045722007751465},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6961552500724792},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.604016900062561},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5615743398666382},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.5286638736724854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5211684703826904},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5033952593803406},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4964180588722229},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.44796353578567505},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3837206959724426},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35729658603668213},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34785008430480957},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.34731703996658325},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.31258493661880493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2512342929840088},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1657552421092987},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1308411955833435}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.8606345653533936},{"id":"https://openalex.org/C2780949067","wikidata":"https://www.wikidata.org/wiki/Q1136752","display_name":"Transmission gate","level":4,"score":0.7718843221664429},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.708051323890686},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.7045722007751465},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6961552500724792},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.604016900062561},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5615743398666382},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.5286638736724854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5211684703826904},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5033952593803406},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4964180588722229},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.44796353578567505},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3837206959724426},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35729658603668213},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34785008430480957},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.34731703996658325},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.31258493661880493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2512342929840088},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1657552421092987},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1308411955833435},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/itc-asia58802.2023.10301187","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia58802.2023.10301187","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-04240494v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494v1/document","source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ITC-Asia 2023 - 7th IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. pp.1-6, ⟨10.1109/ITC-Asia58802.2023.10301187⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-04240494v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240494v1/document","source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ITC-Asia 2023 - 7th IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. pp.1-6, ⟨10.1109/ITC-Asia58802.2023.10301187⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"score":0.7599999904632568,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4388117340.pdf","grobid_xml":"https://content.openalex.org/works/W4388117340.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1980433502","https://openalex.org/W2157703590","https://openalex.org/W2532367691","https://openalex.org/W2558274594","https://openalex.org/W2757143835","https://openalex.org/W2769731910","https://openalex.org/W2773772422","https://openalex.org/W2891093713","https://openalex.org/W2896064880","https://openalex.org/W2910893392","https://openalex.org/W2954184824","https://openalex.org/W2954322948","https://openalex.org/W2981057900","https://openalex.org/W3010963881","https://openalex.org/W3088899692","https://openalex.org/W3176868109","https://openalex.org/W3199363867","https://openalex.org/W3209966609","https://openalex.org/W4226306512","https://openalex.org/W4285377701","https://openalex.org/W4311412650","https://openalex.org/W4312292430","https://openalex.org/W4313116334"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W2051386096","https://openalex.org/W2099245758","https://openalex.org/W2100150400","https://openalex.org/W1981970801"],"abstract_inverted_index":{"As":[0],"CMOS":[1,7],"processes":[2],"continue":[3],"to":[4,13,69,107],"shrink,":[5],"nano-scale":[6],"latches":[8],"have":[9],"become":[10],"increasingly":[11],"sensitive":[12],"multiple-node":[14],"upset":[15],"(MNU)":[16],"errors":[17],"caused":[18],"by":[19],"radiation.":[20],"To":[21],"tolerate":[22],"MNU,":[23],"a":[24,75],"novel":[25],"quadruple-node-upset":[26],"(QNU)":[27],"self-recoverable":[28],"latch":[29,37,61,81,99],"is":[30,38],"proposed":[31,36,60,80,98],"in":[32,85],"this":[33],"paper.":[34],"The":[35],"mainly":[39],"constructed":[40],"from":[41,64],"six":[42,49],"blocks":[43],"of":[44,55,87],"three-level":[45],"C-elements":[46],"(TLCEs)":[47],"and":[48,74,90],"inverters.":[50],"With":[51],"the":[52,56,59,70,79,97],"mutual":[53],"feedback":[54],"various":[57],"TLCEs,":[58],"can":[62],"recover":[63],"any":[65],"QNU.":[66],"Furthermore,":[67],"due":[68],"clock":[71],"gating":[72],"methodology":[73],"high-speed":[76],"transmission":[77,91],"path,":[78],"has":[82],"lower":[83],"overhead":[84,105],"terms":[86],"power":[88],"dissipation":[89],"delay.":[92],"Simulation":[93],"results":[94],"show":[95],"that":[96],"achieves":[100],"high":[101],"reliability":[102],"with":[103],"moderate":[104],"compared":[106],"typical":[108],"existing":[109],"latches.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-11T14:59:36.786465","created_date":"2025-10-10T00:00:00"}