{"id":"https://openalex.org/W4388117470","doi":"https://doi.org/10.1109/itc-asia58802.2023.10301166","title":"A Low Overhead and Double-Node-Upset Self-Recoverable Latch","display_name":"A Low Overhead and Double-Node-Upset Self-Recoverable Latch","publication_year":2023,"publication_date":"2023-09-12","ids":{"openalex":"https://openalex.org/W4388117470","doi":"https://doi.org/10.1109/itc-asia58802.2023.10301166"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia58802.2023.10301166","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia58802.2023.10301166","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]},{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Microelectronics, Hefei University of Technology, Hefei, China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101008811","display_name":"Xia Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Xia","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085987622","display_name":"Tianming Ni","orcid":"https://orcid.org/0000-0001-6272-8660"},"institutions":[{"id":"https://openalex.org/I70908550","display_name":"Anhui Polytechnic University","ror":"https://ror.org/041sj0284","country_code":"CN","type":"education","lineage":["https://openalex.org/I70908550"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianming Ni","raw_affiliation_strings":["Anhui Polytechnic University,School of Integrated Circuits,Wuhu,China","School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui Polytechnic University,School of Integrated Circuits,Wuhu,China","institution_ids":["https://openalex.org/I70908550"]},{"raw_affiliation_string":"School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China","institution_ids":["https://openalex.org/I70908550"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081525426","display_name":"Jie Cui","orcid":"https://orcid.org/0000-0001-7258-3418"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Cui","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronics,Hefei,China","School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronics,Hefei,China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["University of Montpellier / CNRS,Laboratory of Informatics, Robotics and Microelectronics of Montpellier,Montpellier,France","Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier / CNRS,Laboratory of Informatics, Robotics and Microelectronics of Montpellier,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology,Graduate School of Computer Science and Systems Engineering,Fukuoka,Japan","Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology,Graduate School of Computer Science and Systems Engineering,Fukuoka,Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7616705894470215},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.7427212595939636},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6568506956100464},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5301215052604675},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5236332416534424},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5024511814117432},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22120380401611328},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1423712968826294},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07671570777893066}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7616705894470215},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.7427212595939636},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6568506956100464},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5301215052604675},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5236332416534424},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5024511814117432},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22120380401611328},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1423712968826294},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07671570777893066},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/itc-asia58802.2023.10301166","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia58802.2023.10301166","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-04241214v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ITC-Asia 2023 - 7th IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. pp.1-5, ⟨10.1109/ITC-Asia58802.2023.10301166⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-04241214v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241214/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ITC-Asia 2023 - 7th IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. pp.1-5, ⟨10.1109/ITC-Asia58802.2023.10301166⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6299999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4388117470.pdf"},"referenced_works_count":18,"referenced_works":["https://openalex.org/W1011947702","https://openalex.org/W1659671481","https://openalex.org/W1899181454","https://openalex.org/W2015524290","https://openalex.org/W2277435279","https://openalex.org/W2293212301","https://openalex.org/W2344743430","https://openalex.org/W2533291033","https://openalex.org/W2558274594","https://openalex.org/W2587844224","https://openalex.org/W2793901141","https://openalex.org/W2901644239","https://openalex.org/W3000209635","https://openalex.org/W3046446688","https://openalex.org/W3199363867","https://openalex.org/W4281611099","https://openalex.org/W4312292430","https://openalex.org/W4320170196"],"related_works":["https://openalex.org/W2160088500","https://openalex.org/W2124354281","https://openalex.org/W1523508240","https://openalex.org/W2102538861","https://openalex.org/W2012451149","https://openalex.org/W2622269177","https://openalex.org/W3206176645","https://openalex.org/W2978528242","https://openalex.org/W3140581668","https://openalex.org/W2165400042"],"abstract_inverted_index":{"With":[0],"the":[1,33,74],"rapid":[2],"advancement":[3],"of":[4,37,51],"semiconductor":[5],"technologies,":[6],"integrated":[7],"circuits,":[8],"especially":[9],"storage":[10],"elements":[11],"(e.g.,":[12],"latches)":[13],"have":[14],"become":[15],"increasingly":[16],"vulnerable":[17],"to":[18,23,66,104],"soft":[19],"errors.":[20],"In":[21],"order":[22],"effectively":[24],"tolerate":[25],"double-node-upsets":[26],"(DNUs)":[27],"caused":[28],"by":[29,89,92,95,99],"radiation":[30],"and":[31,35,53,63,83,97],"reduce":[32,87],"power":[34,52,91],"area":[36,94],"latches,":[38],"this":[39],"paper":[40],"proposes":[41],"a":[42],"DNU":[43,68,107],"self-recoverable":[44,108],"latch":[45,57,76],"with":[46],"low":[47],"overhead":[48],"in":[49],"terms":[50],"area.":[54],"The":[55],"proposed":[56,75],"mainly":[58],"comprises":[59],"seven":[60],"2-input":[61],"C-elements":[62],"two":[64],"inverters":[65],"achieve":[67],"self-recovery.":[69],"Simulation":[70],"results":[71],"show":[72],"that":[73,84],"can":[77,86],"recover":[78],"from":[79],"all":[80],"possible":[81],"DNUs":[82],"it":[85],"delay":[88],"45.7%,":[90],"29.1%,":[93],"65.9%,":[96],"area-power-delay-product":[98],"87.4%,":[100],"on":[101],"average,":[102],"compared":[103],"typical":[105],"existing":[106],"latches.":[109]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}