{"id":"https://openalex.org/W4388117458","doi":"https://doi.org/10.1109/itc-asia58802.2023.10301158","title":"On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults","display_name":"On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults","publication_year":2023,"publication_date":"2023-09-12","ids":{"openalex":"https://openalex.org/W4388117458","doi":"https://doi.org/10.1109/itc-asia58802.2023.10301158"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia58802.2023.10301158","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia58802.2023.10301158","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058181716","display_name":"Shogo Tokai","orcid":"https://orcid.org/0000-0002-0729-4596"},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shogo Tokai","raw_affiliation_strings":["Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan","institution_ids":["https://openalex.org/I922474255"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081711169","display_name":"Daichi Akamatsu","orcid":null},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daichi Akamatsu","raw_affiliation_strings":["Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan","institution_ids":["https://openalex.org/I922474255"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071523958","display_name":"Hiroyuki Yotsuyanagi","orcid":"https://orcid.org/0000-0002-4223-3705"},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Yotsuyanagi","raw_affiliation_strings":["Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan","institution_ids":["https://openalex.org/I922474255"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052190532","display_name":"Masaki Hashizume","orcid":null},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaki Hashizume","raw_affiliation_strings":["Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokushima University,Graduate School of Advanced Technology and Science,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Graduate School of Advanced Technology and Science, Tokushima University, Tokushima, Japan","institution_ids":["https://openalex.org/I922474255"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2454,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54175504,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiplier","display_name":"Multiplier (economics)","score":0.658635139465332},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5795682072639465},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5395570993423462},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5017101764678955},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.49452874064445496},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.47567978501319885},{"id":"https://openalex.org/keywords/approximation-error","display_name":"Approximation error","score":0.4650631546974182},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4293835759162903},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.42609164118766785},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40740594267845154},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.35778331756591797},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.3386896848678589},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08893904089927673},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.060996562242507935}],"concepts":[{"id":"https://openalex.org/C124584101","wikidata":"https://www.wikidata.org/wiki/Q1053266","display_name":"Multiplier (economics)","level":2,"score":0.658635139465332},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5795682072639465},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5395570993423462},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5017101764678955},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.49452874064445496},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.47567978501319885},{"id":"https://openalex.org/C122383733","wikidata":"https://www.wikidata.org/wiki/Q865920","display_name":"Approximation error","level":2,"score":0.4650631546974182},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4293835759162903},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.42609164118766785},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40740594267845154},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35778331756591797},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3386896848678589},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08893904089927673},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.060996562242507935},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia58802.2023.10301158","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/itc-asia58802.2023.10301158","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1968419018","https://openalex.org/W2005865544","https://openalex.org/W2032698581","https://openalex.org/W2065359960","https://openalex.org/W2578985517","https://openalex.org/W2612905448","https://openalex.org/W2770370002","https://openalex.org/W2807505184","https://openalex.org/W2896491213","https://openalex.org/W2997664772","https://openalex.org/W3039722244","https://openalex.org/W3048414096","https://openalex.org/W3215988232","https://openalex.org/W4200608870","https://openalex.org/W4210994207","https://openalex.org/W4285377613"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2021253405","https://openalex.org/W2091533492","https://openalex.org/W2323083271","https://openalex.org/W2802691720","https://openalex.org/W2940545572","https://openalex.org/W2098752843"],"abstract_inverted_index":{"In":[0,41],"recent":[1],"years,":[2],"approximate":[3,18,75],"computing":[4],"has":[5],"been":[6,15],"used":[7],"in":[8,35,88,127],"error-tolerant":[9],"applications.":[10],"Several":[11],"approximation":[12,43],"methods":[13],"have":[14],"proposed":[16,117],"for":[17,73],"multipliers":[19],"by":[20,51],"trun-cating":[21],"the":[22,26,31,36,39,59,63,79,89,95,99,103,116],"lower":[23,100],"bits":[24,101,110],"of":[25,33,62,102],"calculation":[27,64],"result":[28],"according":[29],"to":[30,98],"positions":[32],"one-bits":[34],"multiplier":[37,76],"and":[38],"multiplicand.":[40],"testing":[42],"circuits,":[44],"test":[45,70,90,118,128],"cost":[46],"reduction":[47,126],"can":[48,120],"be":[49],"achieved":[50],"removing":[52],"acceptable":[53,60],"faults":[54],"that":[55,94],"affect":[56],"only":[57,107],"within":[58],"range":[61],"error.":[65],"This":[66],"paper":[67],"proposes":[68],"a":[69,86,114,123],"generation":[71,91,119],"method":[72,84],"an":[74],"based":[77],"on":[78],"static":[80],"segment":[81],"method.":[82],"The":[83],"adds":[85],"circuit":[87],"phase":[92],"such":[93],"fault":[96],"propagation":[97],"output":[104],"is":[105],"restricted":[106],"when":[108],"these":[109],"are":[111],"truncated.":[112],"As":[113],"result,":[115],"attain":[121],"about":[122],"5.2":[124],"%":[125],"patterns.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}