{"id":"https://openalex.org/W4285377613","doi":"https://doi.org/10.1109/itc-asia53059.2021.9808704","title":"Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability","display_name":"Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability","publication_year":2021,"publication_date":"2021-08-18","ids":{"openalex":"https://openalex.org/W4285377613","doi":"https://doi.org/10.1109/itc-asia53059.2021.9808704"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia53059.2021.9808704","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia53059.2021.9808704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100422399","display_name":"Zhen Wang","orcid":"https://orcid.org/0000-0003-0019-8240"},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Wang","raw_affiliation_strings":["Shanghai University of Electric Power,School of the Computer Science and Technology,Shanghai,China,200090"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai University of Electric Power,School of the Computer Science and Technology,Shanghai,China,200090","institution_ids":["https://openalex.org/I23632641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085598947","display_name":"Guofa Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I23632641","display_name":"Shanghai University of Electric Power","ror":"https://ror.org/02w4tny03","country_code":"CN","type":"education","lineage":["https://openalex.org/I23632641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guofa Zhang","raw_affiliation_strings":["Shanghai University of Electric Power,School of the Computer Science and Technology,Shanghai,China,200090"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai University of Electric Power,School of the Computer Science and Technology,Shanghai,China,200090","institution_ids":["https://openalex.org/I23632641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100394414","display_name":"Jing Ye","orcid":"https://orcid.org/0000-0002-8023-5090"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Ye","raw_affiliation_strings":["Institute of Computing Technology,Chinese Academy of Sciences,Beijing,China,100190"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computing Technology,Chinese Academy of Sciences,Beijing,China,100190","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088671434","display_name":"Jianhui Jiang","orcid":"https://orcid.org/0000-0002-5829-8423"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianhui Jiang","raw_affiliation_strings":["Tongji University,School of Software Engineering,Shanghai,China,200092"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tongji University,School of Software Engineering,Shanghai,China,200092","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7613000869750977},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6631798148155212},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6555278897285461},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5617994666099548},{"id":"https://openalex.org/keywords/correlation-coefficient","display_name":"Correlation coefficient","score":0.459440141916275},{"id":"https://openalex.org/keywords/subtraction","display_name":"Subtraction","score":0.45523953437805176},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43399739265441895},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43030282855033875},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42341333627700806},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.24498853087425232},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23212751746177673},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.208024799823761},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09184524416923523},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.07511729001998901}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7613000869750977},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6631798148155212},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6555278897285461},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5617994666099548},{"id":"https://openalex.org/C2780092901","wikidata":"https://www.wikidata.org/wiki/Q3433612","display_name":"Correlation coefficient","level":2,"score":0.459440141916275},{"id":"https://openalex.org/C68060419","wikidata":"https://www.wikidata.org/wiki/Q40754","display_name":"Subtraction","level":2,"score":0.45523953437805176},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43399739265441895},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43030282855033875},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42341333627700806},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.24498853087425232},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23212751746177673},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.208024799823761},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09184524416923523},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.07511729001998901},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia53059.2021.9808704","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia53059.2021.9808704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1998824039","https://openalex.org/W2020217519","https://openalex.org/W2047742327","https://openalex.org/W2097325076","https://openalex.org/W2144038574","https://openalex.org/W2169033838","https://openalex.org/W2399535694","https://openalex.org/W2515531880","https://openalex.org/W2612139336","https://openalex.org/W2619638368","https://openalex.org/W2626784759","https://openalex.org/W2744017409","https://openalex.org/W2769672439","https://openalex.org/W3009178428","https://openalex.org/W3096150904","https://openalex.org/W3146960355","https://openalex.org/W4200271347"],"related_works":["https://openalex.org/W2090049157","https://openalex.org/W1976835164","https://openalex.org/W2134771946","https://openalex.org/W189153436","https://openalex.org/W52818356","https://openalex.org/W2006407424","https://openalex.org/W2389214306","https://openalex.org/W4206782091","https://openalex.org/W2952669920","https://openalex.org/W4301252470"],"abstract_inverted_index":{"Recently,":[0],"approximate":[1],"arithmetic":[2],"circuits":[3,81],"(AACs)":[4],"have":[5,101],"been":[6],"widely":[7],"used":[8],"in":[9,21,134],"applications":[10],"with":[11,92],"inherent":[12],"error":[13,103],"tolerance.":[14],"To":[15],"guarantee":[16],"the":[17,22,61,83,110,122],"usability":[18],"of":[19,72,105,117,136],"AACs":[20],"approximation":[23],"applications,":[24],"it":[25],"is":[26],"necessary":[27],"to":[28,59,127],"analyze":[29],"AAC":[30,39],"reliability.":[31],"In":[32],"this":[33],"paper,":[34],"we":[35],"propose":[36],"two":[37,74,98,128],"accurate":[38],"reliability":[40,46,130],"evaluation":[41],"methods":[42,75,100,124,133],"based":[43,132],"on":[44],"signal":[45],"analysis,":[47],"where":[48],"subtraction":[49],"correlation":[50,54,62],"coefficient":[51,55],"and":[52,70,107,109,115,138],"division":[53],"are":[56,76,113,125],"applied":[57],"respectively":[58],"solve":[60],"problem":[63],"caused":[64],"by":[65,78],"fanout":[66],"reconvergence.":[67],"The":[68,86],"accuracy":[69],"scalability":[71],"these":[73],"verified":[77],"randomly":[79],"selected":[80],"from":[82],"EvoApprox8b":[84],"library.":[85],"experimental":[87],"results":[88],"show":[89],"that,":[90],"compared":[91],"Monte":[93],"Carlo":[94],"(MC)":[95],"simulation,":[96],"our":[97],"proposed":[99,123],"average":[102],"rates":[104],"0.34%":[106],"0.65%":[108],"run-time":[111],"costs":[112],"0.012%":[114],"0.019%":[116],"MC’s":[118],"simulation":[119],"time.":[120],"Moreover,":[121],"superior":[126],"recently":[129],"analysis":[131],"terms":[135],"efficiency":[137],"accuracy.":[139]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}