{"id":"https://openalex.org/W2767250483","doi":"https://doi.org/10.1109/itc-asia.2017.8097110","title":"A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability","display_name":"A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2767250483","doi":"https://doi.org/10.1109/itc-asia.2017.8097110","mag":"2767250483"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia.2017.8097110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia.2017.8097110","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102979133","display_name":"Chih-Hao Wang","orcid":"https://orcid.org/0000-0002-2841-6978"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Hao Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028476747","display_name":"Tong-Yu Hsieh","orcid":"https://orcid.org/0000-0002-7954-5569"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tong-Yu Hsieh","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":0.4385,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.6682768,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"52","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.720920979976654},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6862673759460449},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.6198470592498779},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6098448038101196},{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.5678179264068604},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5269775390625},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4932035803794861},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.4276994466781616},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22455522418022156},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12034499645233154},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10664239525794983}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.720920979976654},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6862673759460449},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6198470592498779},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6098448038101196},{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.5678179264068604},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5269775390625},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4932035803794861},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.4276994466781616},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22455522418022156},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12034499645233154},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10664239525794983},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia.2017.8097110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia.2017.8097110","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1507615093","https://openalex.org/W1971278432","https://openalex.org/W1975922194","https://openalex.org/W1987398152","https://openalex.org/W2115005577","https://openalex.org/W2116587035","https://openalex.org/W2121760724","https://openalex.org/W2122819799","https://openalex.org/W2124618076","https://openalex.org/W2128303695","https://openalex.org/W2128855500","https://openalex.org/W2133687702","https://openalex.org/W2145986592","https://openalex.org/W2163747310","https://openalex.org/W2613347744"],"related_works":["https://openalex.org/W2113594494","https://openalex.org/W2306469233","https://openalex.org/W2065356549","https://openalex.org/W2118844295","https://openalex.org/W4400983058","https://openalex.org/W2181665053","https://openalex.org/W2184233008","https://openalex.org/W4285816383","https://openalex.org/W2377071794","https://openalex.org/W4312609455"],"abstract_inverted_index":{"In":[0,59],"this":[1],"work":[2],"we":[3],"propose":[4],"a":[5],"hybrid":[6,174],"concurrent":[7],"error":[8],"detection":[9],"(CED)":[10],"scheme":[11,186],"that":[12,73,152,180],"combines":[13],"the":[14,18,38,54,81,92,95,109,116,121,129,135,139,144,160,172,181],"implication-based":[15,39],"method":[16,25,40],"with":[17,48],"parity":[19,23,130],"check":[20,24,131],"method.":[21,132],"The":[22,148,176],"is":[26,105,157,165],"easy":[27],"to":[28,44,107,169,190],"implement":[29],"and":[30,142],"has":[31,41],"high":[32,42],"probability":[33,55,82,161],"of":[34,56,83,94,113,138,154,162,184],"detecting":[35,57,84,125,163],"errors,":[36],"while":[37],"flexibility":[43],"be":[45,66,87,99],"easily":[46],"integrated":[47],"other":[49],"CED":[50],"methods":[51],"for":[52,124],"improidng":[53],"errors.":[58],"addition,":[60],"fault":[61],"diagnosis":[62],"capability":[63],"can":[64,86,98],"even":[65],"enabled":[67],"by":[68,74,128,171],"integrating":[69],"implications.":[70],"We":[71],"show":[72,151,179],"combining":[75],"these":[76],"two":[77],"methods,":[78],"not":[79],"only":[80],"errors":[85,127,164],"significantly":[88],"increased,":[89],"but":[90],"also":[91,178,199],"diagnosability":[93,183],"target":[96,122],"circuit":[97,123],"effectively":[100],"enhanced.":[101],"A":[102],"systematical":[103],"flow":[104],"developed":[106],"add":[108],"required":[110,158],"checking":[111],"logic":[112],"implications":[114,141],"into":[115],"most":[117],"appropriate":[118],"locations":[119],"in":[120,202],"undetected":[126],"This":[133],"minimizes":[134],"total":[136],"number":[137],"employed":[140],"thus":[143],"incurred":[145],"area":[146,155],"overhead.":[147],"experimental":[149],"results":[150,177],"89.08%":[153],"overhead":[156],"yet":[159],"improved":[166],"from":[167,188],"88.32%":[168],"97.73%":[170],"proposed":[173],"scheme.":[175,204],"achievable":[182],"our":[185,203],"enhances":[187],"91.79%":[189],"96.36%":[191],"on":[192],"average.":[193],"More":[194],"than":[195],"200":[196],"equivalent":[197],"faults":[198],"become":[200],"distinguishable":[201]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}