{"id":"https://openalex.org/W2767738469","doi":"https://doi.org/10.1109/itc-asia.2017.8097107","title":"GPU-accelerated fault dictionary generation for the TRAX fault model","display_name":"GPU-accelerated fault dictionary generation for the TRAX fault model","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2767738469","doi":"https://doi.org/10.1109/itc-asia.2017.8097107","mag":"2767738469"},"language":"en","primary_location":{"id":"doi:10.1109/itc-asia.2017.8097107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia.2017.8097107","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049432009","display_name":"Matthew Beckler","orcid":"https://orcid.org/0000-0003-2282-090X"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Matthew Beckler","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111967389","display_name":"R.D. Blanton","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. D. Shawn Blanton","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, US"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, US","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5049432009"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":0.4506,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63198,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"34","last_page":"39"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8011139631271362},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.67570960521698},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6496307253837585},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.6266220808029175},{"id":"https://openalex.org/keywords/graphics-processing-unit","display_name":"Graphics processing unit","score":0.6262286305427551},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.6197510957717896},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5997781753540039},{"id":"https://openalex.org/keywords/graphics","display_name":"Graphics","score":0.5302172303199768},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5296209454536438},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.34966981410980225},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.16535750031471252},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09773597121238708},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.09072276949882507},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0741797387599945}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8011139631271362},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.67570960521698},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6496307253837585},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.6266220808029175},{"id":"https://openalex.org/C2779851693","wikidata":"https://www.wikidata.org/wiki/Q183484","display_name":"Graphics processing unit","level":2,"score":0.6262286305427551},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.6197510957717896},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5997781753540039},{"id":"https://openalex.org/C21442007","wikidata":"https://www.wikidata.org/wiki/Q1027879","display_name":"Graphics","level":2,"score":0.5302172303199768},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5296209454536438},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.34966981410980225},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.16535750031471252},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09773597121238708},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.09072276949882507},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0741797387599945},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/itc-asia.2017.8097107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/itc-asia.2017.8097107","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 International Test Conference in Asia (ITC-Asia)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W151183725","https://openalex.org/W1588481459","https://openalex.org/W1975338463","https://openalex.org/W1984429368","https://openalex.org/W2003968955","https://openalex.org/W2012278694","https://openalex.org/W2025554908","https://openalex.org/W2061141752","https://openalex.org/W2062716389","https://openalex.org/W2117648153","https://openalex.org/W2127673274","https://openalex.org/W2134856947","https://openalex.org/W2145224769","https://openalex.org/W2148752144","https://openalex.org/W2148873009","https://openalex.org/W2151762825","https://openalex.org/W2152854703","https://openalex.org/W2167094252","https://openalex.org/W2169553754","https://openalex.org/W3142439932","https://openalex.org/W3143946361","https://openalex.org/W3146952922","https://openalex.org/W4253013447"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2278517150","https://openalex.org/W4256030018","https://openalex.org/W3150960233","https://openalex.org/W2061946964","https://openalex.org/W2147400189","https://openalex.org/W2157545815"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,12,56,63,82,97,106],"design":[4],"and":[5,35,74,93],"implementation":[6],"of":[7,31,55,66,84,113],"a":[8,20,38,71,75,85,111],"fault":[9,14,33,39,42,46,57,86],"simulator":[10],"for":[11,17],"TRAnsition-X":[13],"model":[15],"(TRAX":[16],"short)":[18],"on":[19],"graphics":[21],"processing":[22],"unit":[23],"(GPU).":[24],"Fault":[25],"dictionaries":[26],"are":[27],"an":[28],"important":[29],"aspect":[30],"on-chip":[32],"detection":[34],"diagnosis.":[36],"Generating":[37],"dictionary":[40],"requires":[41],"simulation":[43,58],"with":[44],"no":[45],"dropping,":[47],"requiring":[48],"extensive":[49],"computational":[50],"resources.":[51],"The":[52],"inherent":[53],"parallelism":[54],"problem":[59],"maps":[60],"well":[61],"to":[62,80],"large":[64],"number":[65],"concurrent":[67],"threads":[68],"supported":[69],"by":[70],"modern":[72],"GPU,":[73],"GPU":[76,98],"can":[77],"be":[78],"used":[79],"accelerate":[81],"construction":[83],"dictionary.":[87],"Our":[88],"approach":[89],"employs":[90],"both":[91],"pattern-parallel":[92],"fault-parallel":[94],"algorithms":[95],"in":[96],"kernel":[99],"implementations.":[100],"Experiments":[101],"involving":[102],"various":[103],"circuits,":[104],"including":[105],"OpenSPARC":[107],"T2":[108],"processor,":[109],"demonstrate":[110],"speed-up":[112],"over":[114],"42x.":[115]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}