{"id":"https://openalex.org/W4413755579","doi":"https://doi.org/10.1109/isvlsi65124.2025.11130244","title":"High-Precision BGR Design with Advanced Curvature Compensation &amp; Optimized Layout in 28 nm CMOS Technology","display_name":"High-Precision BGR Design with Advanced Curvature Compensation &amp; Optimized Layout in 28 nm CMOS Technology","publication_year":2025,"publication_date":"2025-07-06","ids":{"openalex":"https://openalex.org/W4413755579","doi":"https://doi.org/10.1109/isvlsi65124.2025.11130244"},"language":"en","primary_location":{"id":"doi:10.1109/isvlsi65124.2025.11130244","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvlsi65124.2025.11130244","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5099023103","display_name":"Ravi S. Siddanath","orcid":null},"institutions":[{"id":"https://openalex.org/I26072440","display_name":"Indian Institute of Information Technology Allahabad","ror":"https://ror.org/03rgjt374","country_code":"IN","type":"education","lineage":["https://openalex.org/I26072440"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ravi S. Siddanath","raw_affiliation_strings":["IIIT,ECE Dept,Allahabad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIIT,ECE Dept,Allahabad","institution_ids":["https://openalex.org/I26072440"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100622857","display_name":"Mohit Gupta","orcid":"https://orcid.org/0000-0001-6538-5026"},"institutions":[{"id":"https://openalex.org/I26072440","display_name":"Indian Institute of Information Technology Allahabad","ror":"https://ror.org/03rgjt374","country_code":"IN","type":"education","lineage":["https://openalex.org/I26072440"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mohit Gupta","raw_affiliation_strings":["IIIT,ECE Dept,Allahabad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIIT,ECE Dept,Allahabad","institution_ids":["https://openalex.org/I26072440"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048482919","display_name":"Raghav Rao","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Dhirendra Rao","raw_affiliation_strings":["Texas Instruments Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Souvik Kumar Das","orcid":null},"institutions":[{"id":"https://openalex.org/I26072440","display_name":"Indian Institute of Information Technology Allahabad","ror":"https://ror.org/03rgjt374","country_code":"IN","type":"education","lineage":["https://openalex.org/I26072440"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Souvik Kumar Das","raw_affiliation_strings":["IIIT,ECE Dept,Allahabad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIIT,ECE Dept,Allahabad","institution_ids":["https://openalex.org/I26072440"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080246349","display_name":"R. Hegde","orcid":null},"institutions":[{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raghavendra Manjunath Hegde","raw_affiliation_strings":["Micron Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micron Technology","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101490653","display_name":"Prasanna Kumar Misra","orcid":"https://orcid.org/0000-0003-4942-1335"},"institutions":[{"id":"https://openalex.org/I26072440","display_name":"Indian Institute of Information Technology Allahabad","ror":"https://ror.org/03rgjt374","country_code":"IN","type":"education","lineage":["https://openalex.org/I26072440"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Prasanna Kumar Misra","raw_affiliation_strings":["IIIT,ECE Dept,Allahabad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIIT,ECE Dept,Allahabad","institution_ids":["https://openalex.org/I26072440"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108722448","display_name":"Manish Goswami","orcid":"https://orcid.org/0000-0002-7165-1412"},"institutions":[{"id":"https://openalex.org/I26072440","display_name":"Indian Institute of Information Technology Allahabad","ror":"https://ror.org/03rgjt374","country_code":"IN","type":"education","lineage":["https://openalex.org/I26072440"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Goswami","raw_affiliation_strings":["IIIT,ECE Dept,Allahabad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIIT,ECE Dept,Allahabad","institution_ids":["https://openalex.org/I26072440"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057408571","display_name":"Kavindra Kandpal","orcid":"https://orcid.org/0000-0002-2683-2230"},"institutions":[{"id":"https://openalex.org/I26072440","display_name":"Indian Institute of Information Technology Allahabad","ror":"https://ror.org/03rgjt374","country_code":"IN","type":"education","lineage":["https://openalex.org/I26072440"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Kavindra Kandpal","raw_affiliation_strings":["IIIT,ECE Dept,Allahabad"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIIT,ECE Dept,Allahabad","institution_ids":["https://openalex.org/I26072440"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.3874,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.90224322,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8003517985343933},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.647255539894104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4822309911251068},{"id":"https://openalex.org/keywords/curvature","display_name":"Curvature","score":0.4496033787727356},{"id":"https://openalex.org/keywords/integrated-circuit-layout","display_name":"Integrated circuit layout","score":0.4391586482524872},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37503543496131897},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.28802865743637085},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15898597240447998},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09577542543411255},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.060099124908447266}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8003517985343933},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.647255539894104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4822309911251068},{"id":"https://openalex.org/C195065555","wikidata":"https://www.wikidata.org/wiki/Q214881","display_name":"Curvature","level":2,"score":0.4496033787727356},{"id":"https://openalex.org/C2765594","wikidata":"https://www.wikidata.org/wiki/Q2624187","display_name":"Integrated circuit layout","level":3,"score":0.4391586482524872},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37503543496131897},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.28802865743637085},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15898597240447998},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09577542543411255},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.060099124908447266},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isvlsi65124.2025.11130244","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvlsi65124.2025.11130244","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1994057142","https://openalex.org/W2060422862","https://openalex.org/W2514888137","https://openalex.org/W2625363942","https://openalex.org/W3090803462","https://openalex.org/W3096479054","https://openalex.org/W3197666296","https://openalex.org/W4293646961","https://openalex.org/W4312673264","https://openalex.org/W4385831372","https://openalex.org/W4393028350"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2379084545","https://openalex.org/W2464627195","https://openalex.org/W2109445684","https://openalex.org/W2081082331","https://openalex.org/W1706204896"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3,22,30,40],"high-precision,":[4],"lowpower":[5],"Bandgap":[6],"Reference":[7],"(BGR)":[8],"circuit":[9,20,89],"designed":[10],"using":[11],"UMC":[12],"28":[13],"nm":[14],"CMOS":[15],"technology.":[16],"The":[17,50,72],"proposed":[18],"BGR":[19],"achieves":[21],"stable":[23],"reference":[24],"voltage":[25],"of":[26,33,43,52,68],"0.647":[27],"V":[28],"with":[29,75],"temperature":[31,41],"coefficient":[32],"$17.69":[34],"\\mathrm{ppm}":[35],"/{":[36],"}^{\\circ}":[37,48],"\\mathrm{C}$":[38],"across":[39],"range":[42],"-40":[44],"\u00b0C":[45],"to":[46],"$125{":[47],"\\mathrm{C}$.":[49],"utilization":[51],"advanced":[53],"curvature":[54],"compensation":[55],"techniques":[56],"involving":[57],"subthreshold":[58],"region":[59],"MOSFET":[60],"current,":[61],"the":[62,88],"design":[63],"ensures":[64],"minimal":[65],"power":[66],"consumption":[67],"$38.62":[69],"\\mu":[70],"\\mathrm{~W}$.":[71],"optimized":[73],"layout":[74],"$0.082":[76],"\\mathrm{~mm}^{2}$":[77],"area,":[78],"minimizes":[79],"parasitic":[80],"effects":[81],"and":[82,94],"maintains":[83],"robust":[84],"signal":[85],"integrity,":[86],"making":[87],"suitable":[90],"for":[91],"precision":[92],"analog":[93],"low-voltage":[95],"applications.":[96]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}
