{"id":"https://openalex.org/W2036257880","doi":"https://doi.org/10.1109/isvlsi.2013.6654633","title":"A novel method to mitigate TSV electromigration for 3D ICs","display_name":"A novel method to mitigate TSV electromigration for 3D ICs","publication_year":2013,"publication_date":"2013-08-01","ids":{"openalex":"https://openalex.org/W2036257880","doi":"https://doi.org/10.1109/isvlsi.2013.6654633","mag":"2036257880"},"language":"en","primary_location":{"id":"doi:10.1109/isvlsi.2013.6654633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvlsi.2013.6654633","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091884273","display_name":"Yuanqing Cheng","orcid":"https://orcid.org/0000-0003-2477-314X"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Yuanqing Cheng","raw_affiliation_strings":["LIRMM, University of Montpellier/CNRS, Montpellier, France","[LIRMM, University of Montpellier 2, Montpellier, France]"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"[LIRMM, University of Montpellier 2, Montpellier, France]","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022136174","display_name":"Aida Todri\u2010Sanial","orcid":"https://orcid.org/0000-0001-8573-2910"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Aida Todri-Sanial","raw_affiliation_strings":["LIRMM, University of Montpellier/CNRS, Montpellier, France","[LIRMM, University of Montpellier 2, Montpellier, France]"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"[LIRMM, University of Montpellier 2, Montpellier, France]","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alberto Bosio","raw_affiliation_strings":["LIRMM, University of Montpellier/CNRS, Montpellier, France","[LIRMM, University of Montpellier 2, Montpellier, France]"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"[LIRMM, University of Montpellier 2, Montpellier, France]","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031456328","display_name":"Luigi Dillio","orcid":null},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luigi Dillio","raw_affiliation_strings":["LIRMM, University of Montpellier/CNRS, Montpellier, France","[LIRMM, University of Montpellier 2, Montpellier, France]"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"[LIRMM, University of Montpellier 2, Montpellier, France]","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["LIRMM, University of Montpellier/CNRS, Montpellier, France","[LIRMM, University of Montpellier 2, Montpellier, France]"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"[LIRMM, University of Montpellier 2, Montpellier, France]","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089236739","display_name":"A. Virazel","orcid":"https://orcid.org/0000-0001-7398-7107"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Arnaud Virazel","raw_affiliation_strings":["LIRMM, University of Montpellier/CNRS, Montpellier, France","[LIRMM, University of Montpellier 2, Montpellier, France]"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"[LIRMM, University of Montpellier 2, Montpellier, France]","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071427870","display_name":"Pascal Vevet","orcid":null},"institutions":[{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Pascal Vevet","raw_affiliation_strings":["CEA - Leti, Grenoble, France","Leti, CEA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"CEA - Leti, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"Leti, CEA, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106036198","display_name":"Marc Belleville","orcid":null},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Marc Belleville","raw_affiliation_strings":["CEA - Leti, Grenoble, France","Leti, CEA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"CEA - Leti, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"Leti, CEA, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5091884273"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":1.2019,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.81484843,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"57","issue":null,"first_page":"121","last_page":"126"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9625438451766968},{"id":"https://openalex.org/keywords/three-dimensional-integrated-circuit","display_name":"Three-dimensional integrated circuit","score":0.729017972946167},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6800429224967957},{"id":"https://openalex.org/keywords/through-silicon-via","display_name":"Through-silicon via","score":0.5866840481758118},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5715998411178589},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5386760830879211},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5216801166534424},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5188397169113159},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.48480334877967834},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4833907186985016},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.48136407136917114},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.45417094230651855},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4035698473453522},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3404856324195862},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.3153489828109741},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.26916366815567017},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22516795992851257},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.20738506317138672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1854686737060547},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.1428077518939972}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9625438451766968},{"id":"https://openalex.org/C59088047","wikidata":"https://www.wikidata.org/wiki/Q229370","display_name":"Three-dimensional integrated circuit","level":3,"score":0.729017972946167},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6800429224967957},{"id":"https://openalex.org/C45632049","wikidata":"https://www.wikidata.org/wiki/Q1578120","display_name":"Through-silicon via","level":3,"score":0.5866840481758118},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5715998411178589},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5386760830879211},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5216801166534424},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5188397169113159},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.48480334877967834},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4833907186985016},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.48136407136917114},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.45417094230651855},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4035698473453522},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3404856324195862},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.3153489828109741},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.26916366815567017},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22516795992851257},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.20738506317138672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1854686737060547},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.1428077518939972},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isvlsi.2013.6654633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvlsi.2013.6654633","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-01248617v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248617","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1974192606","https://openalex.org/W1990215011","https://openalex.org/W2043839549","https://openalex.org/W2047344934","https://openalex.org/W2064712157","https://openalex.org/W2068545846","https://openalex.org/W2072609296","https://openalex.org/W2085087240","https://openalex.org/W2095790208","https://openalex.org/W2104225326","https://openalex.org/W2126763328","https://openalex.org/W2137484818","https://openalex.org/W2142850400","https://openalex.org/W2147960451","https://openalex.org/W2154517054","https://openalex.org/W2545788242","https://openalex.org/W3144072891","https://openalex.org/W3148055963","https://openalex.org/W4231431893","https://openalex.org/W6678858565"],"related_works":["https://openalex.org/W1990828594","https://openalex.org/W2016970881","https://openalex.org/W2027159884","https://openalex.org/W2333804548","https://openalex.org/W2534942874","https://openalex.org/W3093450488","https://openalex.org/W2016589506","https://openalex.org/W2376702355","https://openalex.org/W4385062230","https://openalex.org/W4237709086"],"abstract_inverted_index":{"Three-dimensional":[0],"(3D)":[1],"integration":[2],"is":[3],"considered":[4],"to":[5,10,28,34,83,133,164,168],"be":[6,49,115,139],"a":[7,80],"promising":[8],"technology":[9],"tackle":[11],"the":[12,69,88,109,120,169],"global":[13],"interconnect":[14],"scaling":[15],"problem":[16],"for":[17],"tera-scale":[18],"integrated":[19],"circuits":[20,31],"(ICs).":[21],"3D":[22,72],"ICs":[23,73],"typically":[24],"employ":[25],"through-silicon-vias":[26],"(TSVs)":[27],"connect":[29],"planar":[30],"vertically.":[32],"Due":[33],"its":[35],"immature":[36],"fabrication":[37],"process,":[38],"several":[39],"defects":[40,52,98],"such":[41,173],"as":[42],"void,":[43],"misalignment":[44],"and":[45,60,99,179],"dust":[46],"contamination,":[47],"may":[48],"introduced.":[50],"These":[51],"can":[53,67,103,114,138,156],"increase":[54],"current":[55,123],"densities":[56],"within":[57,125],"TSVs":[58],"significantly":[59,117],"cause":[61],"severe":[62],"electromigration":[63,105],"(EM)":[64],"effect,":[65],"which":[66,137],"degrade":[68],"reliability":[70],"of":[71,87,122],"considerably.":[74],"In":[75],"this":[76],"paper,":[77],"we":[78,93,127],"propose":[79],"novel":[81],"method":[82,155,174],"mitigate":[84],"EM":[85,112,145],"effect":[86,113],"defective":[89,135],"TSV.":[90],"At":[91],"first,":[92],"analyze":[94],"various":[95],"possible":[96],"TSV":[97],"demonstrate":[100],"that":[101,111,152],"they":[102],"aggravate":[104],"dramatically.":[106],"Based":[107],"on":[108,161],"observation":[110],"alleviated":[116],"by":[118],"balancing":[119],"direction":[121],"flow":[124],"TSV,":[126],"design":[128,170],"an":[129],"on-line":[130],"self-healing":[131],"circuit":[132],"protect":[134],"TSVs,":[136],"detected":[140],"during":[141],"test":[142],"procedure,":[143],"from":[144],"without":[146,171],"degrading":[147],"performance.":[148],"Experimental":[149],"results":[150],"show":[151],"our":[153],"proposed":[154],"achieve":[157],"tens":[158],"times":[159],"improvement":[160],"mean":[162],"time":[163],"failure":[165],"(MTTF)":[166],"compared":[167],"using":[172],"with":[175],"negligible":[176],"hardware":[177],"overheads":[178],"power":[180],"consumption.":[181]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}