{"id":"https://openalex.org/W1573858157","doi":"https://doi.org/10.1109/isvdat.2015.7208085","title":"An efficient approach for estimating the impact of SSO noise on LPDDR2 timing budget","display_name":"An efficient approach for estimating the impact of SSO noise on LPDDR2 timing budget","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W1573858157","doi":"https://doi.org/10.1109/isvdat.2015.7208085","mag":"1573858157"},"language":"en","primary_location":{"id":"doi:10.1109/isvdat.2015.7208085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvdat.2015.7208085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 19th International Symposium on VLSI Design and Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032406189","display_name":"Yagya D. Mishra","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121746","display_name":"Ministry of Electronics and Information Technology","ror":"https://ror.org/02z31cn83","country_code":"IN","type":"government","lineage":["https://openalex.org/I4210121746"]},{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]},{"id":"https://openalex.org/I119939252","display_name":"Indraprastha Institute of Information Technology Delhi","ror":"https://ror.org/03vfp4g33","country_code":"IN","type":"education","lineage":["https://openalex.org/I119939252"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Yagya D. Mishra","raw_affiliation_strings":["Denartment of Electronics and Comm. Engineering., IIIT Delhi, New Delhi, India","Department of Electronics and Comm Engg, IIIT Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Denartment of Electronics and Comm. Engineering., IIIT Delhi, New Delhi, India","institution_ids":["https://openalex.org/I119939252","https://openalex.org/I4210121746"]},{"raw_affiliation_string":"Department of Electronics and Comm Engg, IIIT Delhi, New Delhi, India","institution_ids":["https://openalex.org/I119939252","https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089109424","display_name":"Mohammad Hashmi","orcid":"https://orcid.org/0000-0002-1772-588X"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]},{"id":"https://openalex.org/I119939252","display_name":"Indraprastha Institute of Information Technology Delhi","ror":"https://ror.org/03vfp4g33","country_code":"IN","type":"education","lineage":["https://openalex.org/I119939252"]},{"id":"https://openalex.org/I4210121746","display_name":"Ministry of Electronics and Information Technology","ror":"https://ror.org/02z31cn83","country_code":"IN","type":"government","lineage":["https://openalex.org/I4210121746"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mohammad S. Hashmi","raw_affiliation_strings":["Denartment of Electronics and Comm. Engineering., IIIT Delhi, New Delhi, India","Department of Electronics and Comm Engg, IIIT Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Denartment of Electronics and Comm. Engineering., IIIT Delhi, New Delhi, India","institution_ids":["https://openalex.org/I119939252","https://openalex.org/I4210121746"]},{"raw_affiliation_string":"Department of Electronics and Comm Engg, IIIT Delhi, New Delhi, India","institution_ids":["https://openalex.org/I119939252","https://openalex.org/I68891433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015645946","display_name":"Akhilesh C. Mishra","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Akhilesh C. Mishra","raw_affiliation_strings":["STM icroelectronics Pvt. Ltd., Greater Noida, India","STMicroelectronics Pvt. Ltd., Greater Noida, India"],"affiliations":[{"raw_affiliation_string":"STM icroelectronics Pvt. Ltd., Greater Noida, India","institution_ids":["https://openalex.org/I4210094169"]},{"raw_affiliation_string":"STMicroelectronics Pvt. Ltd., Greater Noida, India","institution_ids":["https://openalex.org/I4210094169"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5032406189"],"corresponding_institution_ids":["https://openalex.org/I119939252","https://openalex.org/I4210121746","https://openalex.org/I68891433"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02951787,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8783681392669678},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.8229656219482422},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6693525910377502},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6470286846160889},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5272908210754395},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5075446367263794},{"id":"https://openalex.org/keywords/ibis","display_name":"Ibis","score":0.48065340518951416},{"id":"https://openalex.org/keywords/spec#","display_name":"Spec#","score":0.41209733486175537},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18604019284248352},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14284709095954895},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08960112929344177}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8783681392669678},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.8229656219482422},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6693525910377502},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6470286846160889},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5272908210754395},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5075446367263794},{"id":"https://openalex.org/C2780698032","wikidata":"https://www.wikidata.org/wiki/Q193833","display_name":"Ibis","level":2,"score":0.48065340518951416},{"id":"https://openalex.org/C2778565505","wikidata":"https://www.wikidata.org/wiki/Q2207566","display_name":"Spec#","level":2,"score":0.41209733486175537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18604019284248352},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14284709095954895},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08960112929344177},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isvdat.2015.7208085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isvdat.2015.7208085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 19th International Symposium on VLSI Design and Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1552134816","https://openalex.org/W2114756964","https://openalex.org/W2146229113","https://openalex.org/W3140285801","https://openalex.org/W6633054092"],"related_works":["https://openalex.org/W4232600088","https://openalex.org/W4237774341","https://openalex.org/W4239926154","https://openalex.org/W1629038581","https://openalex.org/W2409639281","https://openalex.org/W878150521","https://openalex.org/W4235361502","https://openalex.org/W2315691163","https://openalex.org/W2008941207","https://openalex.org/W2153572130"],"abstract_inverted_index":{"In":[0,73],"this":[1,47,89],"paper,":[2],"a":[3,36],"new":[4],"methodology":[5,49,61],"for":[6],"analysis":[7],"of":[8,22,25,35,71,94],"SSO":[9],"effect":[10],"on":[11,15,55],"jitter":[12,31],"value":[13],"based":[14,65,86],"IBIS":[16],"v5.0":[17],"is":[18,50,78],"proposed.":[19],"Subsequently,":[20],"investigation":[21],"the":[23,59,75,92,95],"impact":[24],"simultaneous":[26],"switching":[27],"output":[28],"(SSO)":[29],"noise,":[30],"and":[32,62,88],"timing":[33],"closure":[34],"complete":[37],"8":[38],"bit":[39],"LPDDR2":[40],"bus":[41],"at":[42],"400":[43],"MHz":[44],"obtained":[45,54],"using":[46,58],"developed":[48,60,76],"presented.":[51],"Experimental":[52],"results":[53],"automotive":[56],"microcontrollers":[57],"conventional":[63],"spice":[64,85],"techniques":[66],"compare":[67],"favourably":[68],"in":[69],"terms":[70],"accuracy.":[72],"addition,":[74],"technique":[77,87],"also":[79],"manifold":[80],"faster":[81],"when":[82],"compared":[83],"to":[84],"essentially":[90],"demonstrate":[91],"effectiveness":[93],"proposed":[96],"approach.":[97]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}