{"id":"https://openalex.org/W4416961952","doi":"https://doi.org/10.1109/ist66504.2025.11268433","title":"Explicit Linear Levenberg\u2013Marquardt Method for Image Reconstruction in Electrical Capacitance Tomography","display_name":"Explicit Linear Levenberg\u2013Marquardt Method for Image Reconstruction in Electrical Capacitance Tomography","publication_year":2025,"publication_date":"2025-10-15","ids":{"openalex":"https://openalex.org/W4416961952","doi":"https://doi.org/10.1109/ist66504.2025.11268433"},"language":null,"primary_location":{"id":"doi:10.1109/ist66504.2025.11268433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ist66504.2025.11268433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Imaging Systems and Techniques (IST)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001394482","display_name":"Damian Wanta","orcid":"https://orcid.org/0000-0002-1596-6524"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Damian Wanta","raw_affiliation_strings":["Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061167438","display_name":"Waldemar T. Smolik","orcid":"https://orcid.org/0000-0002-1524-5049"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Waldemar T. Smolik","raw_affiliation_strings":["Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044386511","display_name":"Mikhail Ivanenko","orcid":"https://orcid.org/0009-0006-8682-2751"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Mikhail Ivanenko","raw_affiliation_strings":["Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology (WUT),Faculty of Electronics and Information Technology,Warsaw,Poland","institution_ids":["https://openalex.org/I108403487"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I108403487"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.46050953,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.003100000089034438,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.8162000179290771},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.739799976348877},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.631600022315979},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.49399998784065247},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.4602000117301941},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4334000051021576},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.42320001125335693},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.42250001430511475},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.4041000008583069}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.8162000179290771},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.739799976348877},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.631600022315979},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5121999979019165},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.49399998784065247},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.4602000117301941},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4334000051021576},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.42320001125335693},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.42250001430511475},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4129999876022339},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.4041000008583069},{"id":"https://openalex.org/C2779898584","wikidata":"https://www.wikidata.org/wiki/Q7820109","display_name":"Reconstruction algorithm","level":3,"score":0.4034999907016754},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.38109999895095825},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.36239999532699585},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.33550000190734863},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.328900009393692},{"id":"https://openalex.org/C17020691","wikidata":"https://www.wikidata.org/wiki/Q139677","display_name":"Operator (biology)","level":5,"score":0.3212999999523163},{"id":"https://openalex.org/C206654267","wikidata":"https://www.wikidata.org/wiki/Q4723986","display_name":"Algebraic Reconstruction Technique","level":3,"score":0.31310001015663147},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.3091000020503998},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2874999940395355},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.28060001134872437},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.28040000796318054},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27570000290870667},{"id":"https://openalex.org/C160824197","wikidata":"https://www.wikidata.org/wiki/Q2071054","display_name":"Linear approximation","level":3,"score":0.27459999918937683},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.27309998869895935},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.2635999917984009},{"id":"https://openalex.org/C49766605","wikidata":"https://www.wikidata.org/wiki/Q207643","display_name":"Linear map","level":2,"score":0.25619998574256897},{"id":"https://openalex.org/C2776865275","wikidata":"https://www.wikidata.org/wiki/Q311666","display_name":"Projector","level":2,"score":0.250900000333786}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ist66504.2025.11268433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ist66504.2025.11268433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Imaging Systems and Techniques (IST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2000241688","https://openalex.org/W2060021325","https://openalex.org/W2067034367","https://openalex.org/W2070738097","https://openalex.org/W2089674817","https://openalex.org/W2113761410","https://openalex.org/W2148882247","https://openalex.org/W2530307286","https://openalex.org/W2575872241","https://openalex.org/W2731282217","https://openalex.org/W2809002902","https://openalex.org/W2899186693","https://openalex.org/W2924523132","https://openalex.org/W2948018983","https://openalex.org/W3024054958"],"related_works":[],"abstract_inverted_index":{"We":[0,140],"introduce":[1],"a":[2,9,71,76,90,100,111,127],"new":[3,186],"algebraic":[4],"reconstruction":[5,82,93,108,216],"technique":[6],"based":[7],"on":[8,119],"simplified":[10],"version":[11],"of":[12,63,89,103,132,203],"the":[13,38,59,81,87,142,156,185,201,204,209],"LevenbergMarquardt":[14],"algorithm,":[15],"tailored":[16],"for":[17,99],"use":[18],"in":[19,218],"electrical":[20],"capacitance":[21,32],"tomography.":[22],"This":[23],"imaging":[24],"modality":[25],"estimates":[26],"spatial":[27,56],"permittivity":[28,134],"distributions":[29,135],"by":[30],"analysing":[31],"measurements":[33],"between":[34,211],"multiple":[35],"electrodes":[36],"surrounding":[37],"domain.":[39],"While":[40],"Electrical":[41,220],"Capacitance":[42,221],"Tomography":[43,222],"is":[44,124,161],"attractive":[45],"due":[46],"to":[47,110,207],"its":[48,64],"fast":[49,212],"acquisition":[50],"speed,":[51],"it":[52],"suffers":[53],"from":[54,146],"limited":[55],"resolution":[57],"and":[58,75,155,177,214],"inherently":[60],"ill-posed":[61],"nature":[62],"inverse":[65],"problem.":[66],"The":[67,122,181],"proposed":[68,205],"method":[69,123,187],"assumes":[70],"fixed":[72],"sensitivity":[73],"matrix":[74,113],"constant":[77],"damping":[78],"parameter":[79],"throughout":[80],"process.":[83],"These":[84,198],"simplifications":[85],"allow":[86],"derivation":[88],"closed-form":[91],"linear":[92],"operator":[94],"that":[95,184],"can":[96],"be":[97],"precomputed":[98],"given":[101],"number":[102],"iterations.":[104],"Once":[105],"computed,":[106],"image":[107],"reduces":[109],"single":[112],"multiplication,":[114],"enabling":[115],"real-time":[116],"performance":[117],"even":[118],"modest":[120],"hardware.":[121],"tested":[125],"using":[126,163],"simulated":[128],"dataset":[129],"containing":[130],"hundreds":[131],"synthetic":[133],"with":[136,144],"varying":[137],"inclusion":[138],"geometries.":[139],"compare":[141],"results":[143,182],"those":[145],"two":[147],"commonly":[148],"used":[149],"one-step":[150],"techniques:":[151],"Linear":[152],"Back":[153],"Projection":[154],"Moore-Penrose":[157],"pseudo-inverse.":[158],"Image":[159],"quality":[160],"evaluated":[162],"four":[164],"standard":[165],"metrics:":[166],"Structural":[167],"Similarity":[168],"Index":[169],"Measure,":[170],"Peak":[171],"Signal-to-Noise":[172],"Ratio,":[173],"Mean":[174],"Squared":[175],"Error,":[176],"Pearson":[178],"Correlation":[179],"Coefficient.":[180],"show":[183],"offers":[188],"significantly":[189],"improved":[190,215],"structural":[191],"similarity":[192],"while":[193],"maintaining":[194],"comparable":[195],"computational":[196],"speed.":[197],"findings":[199],"demonstrate":[200],"potential":[202],"approach":[206],"bridge":[208],"gap":[210],"execution":[213],"fidelity":[217],"practical":[219],"applications.":[223]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-12-03T00:00:00"}