{"id":"https://openalex.org/W4406267805","doi":"https://doi.org/10.1109/ist63414.2024.10759240","title":"High Accuracy Vision-Laser Post-Welding Defect Detection and Segmentation Method Based on Convolutional Neural Networks","display_name":"High Accuracy Vision-Laser Post-Welding Defect Detection and Segmentation Method Based on Convolutional Neural Networks","publication_year":2024,"publication_date":"2024-10-14","ids":{"openalex":"https://openalex.org/W4406267805","doi":"https://doi.org/10.1109/ist63414.2024.10759240"},"language":"en","primary_location":{"id":"doi:10.1109/ist63414.2024.10759240","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ist63414.2024.10759240","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Imaging Systems and Techniques (IST)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Guo Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guo Chen","raw_affiliation_strings":["School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064324303","display_name":"Zijian Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zijian Fan","raw_affiliation_strings":["School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042819184","display_name":"Bin She","orcid":"https://orcid.org/0000-0002-5181-5555"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Binyang She","raw_affiliation_strings":["School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038576291","display_name":"Shule Xing","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131125","display_name":"Huanghuai University","ror":"https://ror.org/02k92ks68","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shule Xing","raw_affiliation_strings":["College of Energy Engineering, Huanghuai University,Henan,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Energy Engineering, Huanghuai University,Henan,China","institution_ids":["https://openalex.org/I4210131125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101714909","display_name":"Wei Tao","orcid":"https://orcid.org/0000-0002-0202-7763"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Tao","raw_affiliation_strings":["School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063614471","display_name":"Hui Zhao","orcid":"https://orcid.org/0000-0001-7331-376X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Zhao","raw_affiliation_strings":["School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103078519","display_name":"Na Lv","orcid":"https://orcid.org/0000-0002-8384-4414"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Na Lv","raw_affiliation_strings":["School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Sensing Science and Engineering, Shanghai Jiao Tong University,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9614999890327454,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.8599961996078491},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6984204053878784},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6916476488113403},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6582862138748169},{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.5430040955543518},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.5130373239517212},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5029489398002625},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41699138283729553},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13628420233726501},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.06794387102127075}],"concepts":[{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.8599961996078491},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6984204053878784},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6916476488113403},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6582862138748169},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.5430040955543518},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.5130373239517212},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5029489398002625},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41699138283729553},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13628420233726501},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.06794387102127075}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ist63414.2024.10759240","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ist63414.2024.10759240","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Imaging Systems and Techniques (IST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391621807","https://openalex.org/W2262409920","https://openalex.org/W3192220280","https://openalex.org/W2514640320","https://openalex.org/W2549651119","https://openalex.org/W2393201117","https://openalex.org/W1995340519","https://openalex.org/W4220851919","https://openalex.org/W2969591342","https://openalex.org/W1522196789"],"abstract_inverted_index":{"Recently,":[0],"the":[1,10,42,48,56,59,84,101,104,111,118,152,171,188],"advent":[2],"of":[3,14,44,58,103,113,158,163,168,185],"deep":[4],"learning":[5],"technology":[6],"has":[7],"led":[8],"to":[9,50,122],"exploration":[11],"and":[12,81,99,131,136,143,165,203],"application":[13,65],"Convolutional":[15],"Neural":[16],"Networks":[17],"(CNN)":[18],"based":[19],"welding":[20,45,105,119,172,189],"defect":[21,79,120,173,190,201],"detection":[22,80,174,202],"methods":[23,34],"by":[24],"numerous":[25],"researchers":[26],"in":[27,66,199],"several":[28],"industrial":[29],"settings.":[30],"However,":[31],"most":[32],"CNN-based":[33,75],"are":[35],"single-task":[36,124],"networks":[37],"that":[38,151],"can":[39,95],"only":[40],"classify":[41],"type":[43],"defect,":[46],"lacking":[47],"capacity":[49],"provide":[51],"additional":[52],"information":[53,116],"such":[54],"as":[55],"shape":[57],"defect.":[60,106],"This":[61,70,107],"limitation":[62],"hinders":[63],"their":[64],"more":[67,114],"diverse":[68],"scenarios.":[69],"paper":[71],"proposes":[72],"a":[73,92,155,160,166,179],"high-accuracy,":[74],"method":[76,153,195],"for":[77,110,133],"post-welding":[78],"segmentation":[82,191,204],"using":[83],"Vision-laser":[85,127],"system.":[86],"The":[87,138,148,193],"proposed":[88,139,194],"method,":[89],"which":[90],"comprises":[91],"multitask":[93],"CNN,":[94],"simultaneously":[96],"detect,":[97],"classify,":[98],"segment":[100],"area":[102],"approach":[108],"allows":[109],"acquisition":[112],"comprehensive":[115],"about":[117],"compared":[121],"existing":[123],"methods.":[125],"A":[126],"system":[128],"is":[129,141],"assembled":[130],"calibrated":[132],"data":[134],"collection":[135],"testing.":[137],"network":[140],"trained":[142],"evaluated":[144],"on":[145,170,187],"this":[146],"dataset.":[147],"results":[149],"demonstrate":[150],"achieved":[154,178],"mean":[156,161,180],"accuracy":[157,198],"99.58%,":[159],"precision":[162],"99.43%,":[164],"recall":[167],"97.05%":[169],"task.":[175,192],"Additionally,":[176],"it":[177],"Intersection":[181],"over":[182],"Union":[183],"(IoU)":[184],"92.58%":[186],"exhibits":[196],"high":[197],"both":[200],"tasks.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}