{"id":"https://openalex.org/W4388212451","doi":"https://doi.org/10.1109/issrew60843.2023.00045","title":"A Fault Injection and Formal Verification Framework Based on UML Sequence Diagrams","display_name":"A Fault Injection and Formal Verification Framework Based on UML Sequence Diagrams","publication_year":2023,"publication_date":"2023-10-09","ids":{"openalex":"https://openalex.org/W4388212451","doi":"https://doi.org/10.1109/issrew60843.2023.00045"},"language":"en","primary_location":{"id":"doi:10.1109/issrew60843.2023.00045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issrew60843.2023.00045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 34th International Symposium on Software Reliability Engineering Workshops (ISSREW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049825373","display_name":"Hezhen Liu","orcid":"https://orcid.org/0000-0003-0582-9558"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hezhen Liu","raw_affiliation_strings":["Huawei Technologies Co., Ltd.,Shenzhen,China,518129"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies Co., Ltd.,Shenzhen,China,518129","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035652898","display_name":"Jiacheng Yin","orcid":"https://orcid.org/0009-0003-6109-5138"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiacheng Yin","raw_affiliation_strings":["Huawei Technologies Co., Ltd.,Shenzhen,China,518129"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies Co., Ltd.,Shenzhen,China,518129","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057248193","display_name":"Chengqiang Huang","orcid":"https://orcid.org/0000-0002-7555-5639"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengqiang Huang","raw_affiliation_strings":["Huawei Technologies Co., Ltd.,Shenzhen,China,518129"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies Co., Ltd.,Shenzhen,China,518129","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111135329","display_name":"Hao Lan","orcid":null},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Lan","raw_affiliation_strings":["Huawei Technologies Co., Ltd.,Shenzhen,China,518129"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies Co., Ltd.,Shenzhen,China,518129","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049100391","display_name":"Zhi Jin","orcid":"https://orcid.org/0000-0003-1087-226X"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210128818","display_name":"Institute of Software","ror":"https://ror.org/033dfsn42","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhi Jin","raw_affiliation_strings":["Peking University, Ministry of Education,Key Laboratory of High Confidence Software Technologies,Beijing,China,100871","Institute of Software, EECS, Peking University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Peking University, Ministry of Education,Key Laboratory of High Confidence Software Technologies,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Institute of Software, EECS, Peking University, Beijing, China","institution_ids":["https://openalex.org/I4210128818","https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100459073","display_name":"Zheng Zheng","orcid":"https://orcid.org/0000-0001-7922-9067"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Zheng","raw_affiliation_strings":["Beihang University,School of Automation Science and Electrical Engineering,Beijing,China,100191"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China,100191","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100624366","display_name":"Xun Zhang","orcid":"https://orcid.org/0000-0002-8501-1969"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xun Zhang","raw_affiliation_strings":["Huawei Technologies Co., Ltd.,Shenzhen,China,518129"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies Co., Ltd.,Shenzhen,China,518129","institution_ids":["https://openalex.org/I2250955327"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5049825373"],"corresponding_institution_ids":["https://openalex.org/I2250955327"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16192937,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"45","last_page":"50"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sequence-diagram","display_name":"Sequence diagram","score":0.8279417753219604},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7842259407043457},{"id":"https://openalex.org/keywords/model-checking","display_name":"Model checking","score":0.6999286413192749},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.6942619681358337},{"id":"https://openalex.org/keywords/unified-modeling-language","display_name":"Unified Modeling Language","score":0.6749340891838074},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.5935404896736145},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.567052960395813},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5067349076271057},{"id":"https://openalex.org/keywords/formal-methods","display_name":"Formal methods","score":0.5062577128410339},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4466370642185211},{"id":"https://openalex.org/keywords/formal-specification","display_name":"Formal specification","score":0.42823362350463867},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.418689489364624},{"id":"https://openalex.org/keywords/applications-of-uml","display_name":"Applications of UML","score":0.4163006544113159},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.4064549207687378},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3339481055736542},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.11222583055496216},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11104419827461243}],"concepts":[{"id":"https://openalex.org/C153185123","wikidata":"https://www.wikidata.org/wiki/Q1391624","display_name":"Sequence diagram","level":4,"score":0.8279417753219604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7842259407043457},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.6999286413192749},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.6942619681358337},{"id":"https://openalex.org/C145644426","wikidata":"https://www.wikidata.org/wiki/Q169411","display_name":"Unified Modeling Language","level":3,"score":0.6749340891838074},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.5935404896736145},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.567052960395813},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5067349076271057},{"id":"https://openalex.org/C75606506","wikidata":"https://www.wikidata.org/wiki/Q1049183","display_name":"Formal methods","level":2,"score":0.5062577128410339},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4466370642185211},{"id":"https://openalex.org/C116253237","wikidata":"https://www.wikidata.org/wiki/Q1437424","display_name":"Formal specification","level":2,"score":0.42823362350463867},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.418689489364624},{"id":"https://openalex.org/C41298492","wikidata":"https://www.wikidata.org/wiki/Q4781506","display_name":"Applications of UML","level":4,"score":0.4163006544113159},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.4064549207687378},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3339481055736542},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.11222583055496216},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11104419827461243},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/issrew60843.2023.00045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issrew60843.2023.00045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 34th International Symposium on Software Reliability Engineering Workshops (ISSREW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W175317719","https://openalex.org/W1504504841","https://openalex.org/W1600260729","https://openalex.org/W2028905856","https://openalex.org/W2041268715","https://openalex.org/W2070628398","https://openalex.org/W2107672210","https://openalex.org/W2145071552","https://openalex.org/W2155391106","https://openalex.org/W2507141006","https://openalex.org/W2613051153","https://openalex.org/W2953488518","https://openalex.org/W3083665209","https://openalex.org/W3129119748","https://openalex.org/W4206949150","https://openalex.org/W6629982606","https://openalex.org/W6632390347","https://openalex.org/W6754014739"],"related_works":["https://openalex.org/W3018727313","https://openalex.org/W2373958571","https://openalex.org/W1526253314","https://openalex.org/W1864358311","https://openalex.org/W2163463765","https://openalex.org/W2007562802","https://openalex.org/W1994651680","https://openalex.org/W4246700523","https://openalex.org/W4379620210","https://openalex.org/W2897457454"],"abstract_inverted_index":{"Previous":[0],"studies":[1],"suggest":[2],"that":[3,44,183],"the":[4,16,21,41,116,119,134,145,148,162,167,170,185],"combination":[5],"of":[6,24,30,36,108,136,147,164,169],"model-based":[7],"fault":[8,65,89,113],"injection":[9,66],"and":[10,19,55,67,91,112,128,143,155,166,181],"model":[11,95,117],"checking":[12],"can":[13],"effectively":[14],"detect":[15],"dependability":[17],"bottlenecks":[18],"verify":[20],"fault-tolerance":[22],"capability":[23],"systems":[25],"at":[26],"very":[27],"early":[28],"phases":[29],"their":[31],"lifecycles.":[32],"However,":[33],"a":[34,64,94,109,159,175],"challenge":[35],"applying":[37],"such":[38],"techniques":[39],"in":[40],"industry":[42],"is":[43,77],"semi-formal":[45],"modeling":[46],"languages":[47],"like":[48],"UML":[49,72],"cannot":[50],"easily":[51],"support":[52,171],"automated":[53,123,156],"analysis":[54],"formal":[56,80],"verification.":[57],"To":[58],"address":[59],"this":[60],"challenge,":[61],"we":[62],"propose":[63],"verification":[68,146],"framework":[69,131,152],"based":[70],"on":[71,125,177],"sequence":[73,83],"diagrams.":[74],"The":[75,130,151],"idea":[76],"to":[78,97,140,161],"create":[79],"models":[81],"from":[82],"diagrams":[84],"as":[85,87],"well":[86],"predefined":[88],"models,":[90],"then":[92,144],"run":[93],"checker":[96],"check":[98],"if":[99],"specific":[100],"properties":[101],"are":[102,191],"violated.":[103],"With":[104],"an":[105,178],"exhaustive":[106],"exploration":[107],"system\u2019s":[110],"states":[111],"space":[114],"by":[115,184],"checker,":[118],"approach":[120],"ensures":[121],"complete,":[122],"reasoning":[124],"failure":[126],"modes":[127],"effects.":[129],"also":[132],"allows":[133],"designs":[135],"additional":[137],"recovery":[138],"actions":[139],"tolerate":[141],"faults":[142],"updated":[149],"models.":[150],"separates":[153],"manual":[154],"activities,":[157],"providing":[158],"guide":[160],"practices":[163],"developers":[165],"development":[168],"tool.":[172],"We":[173],"conduct":[174],"study":[176],"industrial":[179],"case":[180],"demonstrate":[182],"proposed":[186],"approach,":[187],"critical":[188],"design":[189],"flaws":[190],"revealed.":[192]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}