{"id":"https://openalex.org/W2073252814","doi":"https://doi.org/10.1109/issre.2013.6698910","title":"Quantifying software test process and product reliability simultaneously","display_name":"Quantifying software test process and product reliability simultaneously","publication_year":2013,"publication_date":"2013-11-01","ids":{"openalex":"https://openalex.org/W2073252814","doi":"https://doi.org/10.1109/issre.2013.6698910","mag":"2073252814"},"language":"en","primary_location":{"id":"doi:10.1109/issre.2013.6698910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issre.2013.6698910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023378776","display_name":"Shinya Ikemoto","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shinya Ikemoto","raw_affiliation_strings":["Department of Information Engineering, Hiroshima University, Higashi-Hiroshima, Japan","[Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Hiroshima University, Higashi-Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"[Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan]","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077724142","display_name":"Tadashi Dohi","orcid":"https://orcid.org/0000-0003-2954-0388"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadashi Dohi","raw_affiliation_strings":["Department of Information Engineering, Hiroshima University, Higashi-Hiroshima, Japan","[Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Hiroshima University, Higashi-Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"[Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan]","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023917662","display_name":"Hiroyuki Okamura","orcid":"https://orcid.org/0000-0001-6881-0593"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyukii Okamura","raw_affiliation_strings":["Department of Information Engineering, Hiroshima University, Higashi-Hiroshima, Japan","[Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Hiroshima University, Higashi-Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"[Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan]","institution_ids":["https://openalex.org/I113306721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5023378776"],"corresponding_institution_ids":["https://openalex.org/I113306721"],"apc_list":null,"apc_paid":null,"fwci":0.4862,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.69921316,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"108","last_page":"117"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6712220311164856},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.6412236094474792},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.6356176733970642},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6074426174163818},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5762695074081421},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5199897885322571},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5159648060798645},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.4721893072128296},{"id":"https://openalex.org/keywords/risk-based-testing","display_name":"Risk-based testing","score":0.4404318928718567},{"id":"https://openalex.org/keywords/software-metric","display_name":"Software metric","score":0.43302029371261597},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.4222554564476013},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3227466940879822},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.2936554551124573},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.24586382508277893},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.24402892589569092},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.21535897254943848},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16224101185798645},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11455079913139343}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6712220311164856},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6412236094474792},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.6356176733970642},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6074426174163818},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5762695074081421},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5199897885322571},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5159648060798645},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.4721893072128296},{"id":"https://openalex.org/C37945671","wikidata":"https://www.wikidata.org/wiki/Q7336207","display_name":"Risk-based testing","level":5,"score":0.4404318928718567},{"id":"https://openalex.org/C82214349","wikidata":"https://www.wikidata.org/wiki/Q657339","display_name":"Software metric","level":5,"score":0.43302029371261597},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.4222554564476013},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3227466940879822},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.2936554551124573},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.24586382508277893},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.24402892589569092},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.21535897254943848},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16224101185798645},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11455079913139343},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/issre.2013.6698910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issre.2013.6698910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1554758995","https://openalex.org/W1965970907","https://openalex.org/W1968903302","https://openalex.org/W1969276979","https://openalex.org/W1971249471","https://openalex.org/W1974055215","https://openalex.org/W1977030523","https://openalex.org/W1980595883","https://openalex.org/W1985870998","https://openalex.org/W1996292175","https://openalex.org/W1996854731","https://openalex.org/W2001355653","https://openalex.org/W2016852325","https://openalex.org/W2025771420","https://openalex.org/W2038629513","https://openalex.org/W2043298287","https://openalex.org/W2059158598","https://openalex.org/W2069954516","https://openalex.org/W2073810962","https://openalex.org/W2075582918","https://openalex.org/W2079595410","https://openalex.org/W2086446964","https://openalex.org/W2102139904","https://openalex.org/W2107962360","https://openalex.org/W2117039703","https://openalex.org/W2133403811","https://openalex.org/W2137479542","https://openalex.org/W2139121463","https://openalex.org/W2142510083","https://openalex.org/W2144956041","https://openalex.org/W2153242493","https://openalex.org/W2153808350","https://openalex.org/W3146038483"],"related_works":["https://openalex.org/W2362944210","https://openalex.org/W2749345883","https://openalex.org/W2187840912","https://openalex.org/W2029555411","https://openalex.org/W4285242372","https://openalex.org/W3206587736","https://openalex.org/W3133844515","https://openalex.org/W1977030523","https://openalex.org/W2558027728","https://openalex.org/W2012057830"],"abstract_inverted_index":{"Software":[0],"reliability":[1,9,35],"models":[2],"(SRMs)":[3],"are":[4],"used":[5],"to":[6,11,41,47,71,93,117],"assess":[7],"software":[8,14,30,84,97,101,121],"and":[10,23,33,65,100,104],"control":[12],"quantitatively":[13],"testing.":[15],"In":[16],"this":[17],"paper":[18],"we":[19],"consider":[20],"metrics-based":[21],"SRMs":[22,64],"tackle":[24],"a":[25,54],"statistical":[26],"estimation":[27],"of":[28,77,96,112,120],"both":[29,95],"test":[31,98,113],"process":[32,99,114],"product":[34,102,122],"simultaneously.":[36],"The":[37],"basic":[38],"idea":[39],"is":[40,91],"apply":[42],"the":[43,49,67,73,107,110,118],"Markov-dependent":[44,61],"Poisson":[45,62],"regression":[46],"describe":[48],"random":[50],"testing":[51],"environment":[52],"by":[53],"discrete-time":[55],"Markov":[56],"chain.":[57],"We":[58],"formulate":[59],"four":[60],"regression-based":[63],"develop":[66],"EM":[68],"(expectation-maximization)":[69],"algorithms":[70],"estimate":[72],"maximum":[74],"likelihood":[75],"estimates":[76],"model":[78],"parameters.":[79],"Numerical":[80],"examples":[81],"with":[82],"real":[83],"project":[85],"data":[86],"show":[87],"that":[88],"our":[89],"approach":[90],"useful":[92],"quantify":[94],"reliability,":[103],"can":[105,115],"answer":[106],"question":[108],"why":[109],"stability":[111],"lead":[116],"improvement":[119],"reliability.":[123]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}