{"id":"https://openalex.org/W2155501769","doi":"https://doi.org/10.1109/issre.2003.1251036","title":"An empirical study on testing and fault tolerance for software reliability engineering","display_name":"An empirical study on testing and fault tolerance for software reliability engineering","publication_year":2005,"publication_date":"2005-04-25","ids":{"openalex":"https://openalex.org/W2155501769","doi":"https://doi.org/10.1109/issre.2003.1251036","mag":"2155501769"},"language":"en","primary_location":{"id":"doi:10.1109/issre.2003.1251036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issre.2003.1251036","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th International Symposium on Software Reliability Engineering, 2003. ISSRE 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069596903","display_name":"Michael R. Lyu","orcid":"https://orcid.org/0000-0002-3666-5798"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"M.R. Lyu","raw_affiliation_strings":["Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111971544","display_name":"Zubin Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zubin Huang","raw_affiliation_strings":["Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073467093","display_name":"Sam Sze","orcid":null},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"S.K.S. Sze","raw_affiliation_strings":["Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100894698","display_name":"Xia Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xia Cai","raw_affiliation_strings":["Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chinese University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I177725633"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5069596903"],"corresponding_institution_ids":["https://openalex.org/I177725633"],"apc_list":null,"apc_paid":null,"fwci":5.9447,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.96561912,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"119","last_page":"130"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.7923142910003662},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6511144638061523},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.6328918933868408},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.6323293447494507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6164538264274597},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.6049000024795532},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.5300374031066895},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.5005288124084473},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.4938724637031555},{"id":"https://openalex.org/keywords/verification-and-validation","display_name":"Verification and validation","score":0.486275315284729},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.45148852467536926},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.43814441561698914},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.4364435374736786},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.41631895303726196},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4123859405517578},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.379898339509964},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3604907989501953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18743807077407837},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11119499802589417}],"concepts":[{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.7923142910003662},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6511144638061523},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.6328918933868408},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6323293447494507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6164538264274597},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.6049000024795532},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.5300374031066895},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.5005288124084473},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.4938724637031555},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.486275315284729},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.45148852467536926},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.43814441561698914},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.4364435374736786},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.41631895303726196},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4123859405517578},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.379898339509964},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3604907989501953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18743807077407837},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11119499802589417},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/issre.2003.1251036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issre.2003.1251036","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th International Symposium on Software Reliability Engineering, 2003. ISSRE 2003.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.73.9272","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.73.9272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cse.cuhk.edu.hk/~lyu/paper_pdf/issre2003.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W98171137","https://openalex.org/W1829945313","https://openalex.org/W1909785402","https://openalex.org/W1963924029","https://openalex.org/W1981060754","https://openalex.org/W1985551847","https://openalex.org/W1999606248","https://openalex.org/W1999823724","https://openalex.org/W2000077198","https://openalex.org/W2031044809","https://openalex.org/W2075592454","https://openalex.org/W2100116658","https://openalex.org/W2111387676","https://openalex.org/W2112749178","https://openalex.org/W2119127526","https://openalex.org/W2121084350","https://openalex.org/W2121669067","https://openalex.org/W2124019729","https://openalex.org/W2124554619","https://openalex.org/W2129262519","https://openalex.org/W2129376593","https://openalex.org/W2130274814","https://openalex.org/W2135056756","https://openalex.org/W2136593250","https://openalex.org/W2139763472","https://openalex.org/W2146408397","https://openalex.org/W2148815373","https://openalex.org/W2152228029","https://openalex.org/W2152230627","https://openalex.org/W2153242493","https://openalex.org/W2153513325","https://openalex.org/W2157657084","https://openalex.org/W2157755550","https://openalex.org/W2163466402","https://openalex.org/W2164179203","https://openalex.org/W3196007370","https://openalex.org/W4229850662","https://openalex.org/W4285719527","https://openalex.org/W6676529506","https://openalex.org/W6683981820"],"related_works":["https://openalex.org/W2362944210","https://openalex.org/W3133844515","https://openalex.org/W2106585589","https://openalex.org/W2358894931","https://openalex.org/W2541762924","https://openalex.org/W2187840912","https://openalex.org/W3028882990","https://openalex.org/W2547425497","https://openalex.org/W627857668","https://openalex.org/W3154845713"],"abstract_inverted_index":{"Software":[0],"testing":[1,64,98,112,129,180],"and":[2,50,65,85,170],"software":[3,13,42,63,66,106,146,157,179],"fault":[4,67,147],"tolerance":[5,148],"are":[6,19,140],"two":[7],"major":[8,31],"techniques":[9],"for":[10,44,156,166,178],"developing":[11],"reliable":[12],"systems,":[14],"yet":[15],"limited":[16],"empirical":[17],"data":[18],"available":[20],"in":[21,54,77],"the":[22,60,78,109],"literature":[23],"to":[24,33,38,104,117],"evaluate":[25,59],"their":[26],"effectiveness.":[27],"We":[28,131],"conducted":[29,162],"a":[30,124,153,175],"experiment":[32],"engage":[34],"34":[35],"programming":[36],"teams":[37],"independently":[39],"develop":[40],"multiple":[41],"versions":[43,139],"an":[45,101],"industry-scale":[46],"critical":[47],"flight":[48],"application,":[49],"collected":[51],"faults":[52,75,89,136],"detected":[53],"these":[55,88],"program":[56],"versions.":[57],"To":[58],"effectiveness":[61,110],"of":[62,87,111,119,128],"tolerance,":[68],"mutants":[69],"were":[70,90],"created":[71],"by":[72,149],"injecting":[73],"real":[74],"occurred":[76],"development":[79],"stage.":[80],"The":[81,93],"nature,":[82],"manifestation,":[83],"detection,":[84],"correlation":[86],"carefully":[91],"investigated.":[92],"results":[94],"show":[95],"that":[96,118,134,172],"coverage":[97,113],"is":[99,114,123,174],"generally":[100],"effective":[102],"means":[103],"detecting":[105],"faults,":[107],"but":[108],"not":[115],"equivalent":[116],"mutation":[120],"coverage,":[121],"which":[122],"more":[125],"truthful":[126],"indicator":[127],"quality.":[130],"also":[132],"found":[133,137],"exact":[135],"among":[138],"very":[141],"limited.":[142],"This":[143],"result":[144],"supports":[145],"design":[150],"diversity":[151],"as":[152],"creditable":[154],"approach":[155,165],"reliability":[158],"engineering.":[159],"Finally":[160],"we":[161],"domain":[163],"analysis":[164],"test":[167],"case":[168],"generation,":[169],"concluded":[171],"it":[173],"promising":[176],"technique":[177],"purpose.":[181]},"counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":5}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}