{"id":"https://openalex.org/W2545201788","doi":"https://doi.org/10.1109/issoc.2003.1267732","title":"Multiple-objective backtrace for solving test generation constraints","display_name":"Multiple-objective backtrace for solving test generation constraints","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W2545201788","doi":"https://doi.org/10.1109/issoc.2003.1267732","mag":"2545201788"},"language":"en","primary_location":{"id":"doi:10.1109/issoc.2003.1267732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issoc.2003.1267732","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 2003 International Symposium on System-on-Chip (IEEE Cat. No.03EX748)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090451161","display_name":"A. Mekler","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"A. Mekler","raw_affiliation_strings":["Tallinn Technical University, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn Technical University, Estonia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Raik","raw_affiliation_strings":["Tallinn Technical University, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn Technical University, Estonia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5090451161"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.30262299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":null,"first_page":"123","last_page":"126"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7100853323936462},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5876954197883606},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.5651264786720276},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5342696309089661},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4520573019981384},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.42736053466796875},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40379321575164795},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3628157675266266},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17750045657157898},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.13854578137397766},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09934023022651672},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09660634398460388}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7100853323936462},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5876954197883606},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.5651264786720276},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5342696309089661},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4520573019981384},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42736053466796875},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40379321575164795},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3628157675266266},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17750045657157898},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13854578137397766},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09934023022651672},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09660634398460388},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/issoc.2003.1267732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/issoc.2003.1267732","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 2003 International Symposium on System-on-Chip (IEEE Cat. No.03EX748)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.5099999904632568,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1539901529","https://openalex.org/W1562299068","https://openalex.org/W2124628240","https://openalex.org/W2130554687","https://openalex.org/W2132086613","https://openalex.org/W2133269209","https://openalex.org/W2135931142","https://openalex.org/W2149107969","https://openalex.org/W2152889194","https://openalex.org/W4230587734","https://openalex.org/W6678608646"],"related_works":["https://openalex.org/W4254560580","https://openalex.org/W2156691306","https://openalex.org/W2127167802","https://openalex.org/W2131559056","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2109192674","https://openalex.org/W1600330381","https://openalex.org/W2009690023","https://openalex.org/W3174838144"],"abstract_inverted_index":{"Current":[0],"paper":[1],"presents":[2],"a":[3,81],"new":[4],"method":[5,51],"for":[6],"solving":[7,70],"hierarchical":[8,48,77],"test":[9,59,78,89],"generation":[10,60],"constraints.":[11,29,61],"Unlike":[12],"most":[13],"of":[14,27,46],"the":[15,18,23,28,43,47,67,73],"previous":[16],"solvers,":[17],"proposed":[19,68],"approach":[20],"relies":[21],"on":[22,57],"low-level":[24,31],"model":[25,32],"description":[26],"The":[30,50],"used":[33],"is":[34],"structurally":[35],"synthesized":[36],"BDDs,":[37],"which":[38],"are":[39],"generated":[40],"directly":[41],"from":[42],"gate-level":[44],"descriptions":[45],"modules.":[49],"has":[52],"been":[53],"implemented":[54],"and":[55,72],"verified":[56],"realistic":[58],"Preliminary":[62],"experiments":[63],"show":[64],"that":[65],"both,":[66],"constraint":[69],"engine":[71],"decision":[74],"diagram":[75],"based":[76],"generator":[79],"achieve":[80],"very":[82],"fast":[83],"performance":[84],"in":[85],"comparison":[86],"to":[87],"well-known":[88],"tools.":[90]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}