{"id":"https://openalex.org/W7133340500","doi":"https://doi.org/10.1109/isscc49663.2026.11409143","title":"A 1ppm/\u00b0C and \u00b10.066% 3\u03c3 Accuracy Bandgap Reference with Temperature-Adaptive PTAT Scaling","display_name":"A 1ppm/\u00b0C and \u00b10.066% 3\u03c3 Accuracy Bandgap Reference with Temperature-Adaptive PTAT Scaling","publication_year":2026,"publication_date":"2026-02-15","ids":{"openalex":"https://openalex.org/W7133340500","doi":"https://doi.org/10.1109/isscc49663.2026.11409143"},"language":null,"primary_location":{"id":"doi:10.1109/isscc49663.2026.11409143","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc49663.2026.11409143","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5128017252","display_name":"Jiaqing Rui","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaqing Rui","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128026519","display_name":"Liangjian Lyu","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liangjian Lyu","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127874836","display_name":"Yuting Wan","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuting Wan","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127873848","display_name":"Kexin Shan","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kexin Shan","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128009407","display_name":"Wenxian Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenxian Gu","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124122081","display_name":"C. -J. Richard Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.-J. Richard Shi","raw_affiliation_strings":["University of Washington,Seattle,WA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Washington,Seattle,WA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078588077","display_name":"Xing Wu","orcid":"https://orcid.org/0000-0002-6646-820X"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Wu","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14423377,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"84","last_page":"86"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.35420000553131104,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.35420000553131104,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10728","display_name":"Pulmonary Hypertension Research and Treatments","score":0.05290000140666962,"subfield":{"id":"https://openalex.org/subfields/2740","display_name":"Pulmonary and Respiratory Medicine"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.04919999837875366,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6894000172615051},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6312000155448914},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.6284000277519226},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.5680999755859375},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.5095000267028809},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4666000008583069},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.45980000495910645},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4020000100135803}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6894000172615051},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6312000155448914},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.6284000277519226},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.5680999755859375},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.5095000267028809},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4666000008583069},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4643999934196472},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.45980000495910645},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.43470001220703125},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4336000084877014},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42989999055862427},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4020000100135803},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3626999855041504},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.3433000147342682},{"id":"https://openalex.org/C2988430800","wikidata":"https://www.wikidata.org/wiki/Q428971","display_name":"Scaling law","level":3,"score":0.34299999475479126},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.31769999861717224},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.2973000109195709},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.27709999680519104},{"id":"https://openalex.org/C144386022","wikidata":"https://www.wikidata.org/wiki/Q1332997","display_name":"Scale factor (cosmology)","level":5,"score":0.27639999985694885},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.263700008392334},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.26170000433921814}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc49663.2026.11409143","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc49663.2026.11409143","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6167393326759338,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G3654611107","display_name":null,"funder_award_id":"62204085","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W3095491424","https://openalex.org/W3115799550","https://openalex.org/W4205775315","https://openalex.org/W4406457903"],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,10,56],"process-independent,":[4],"curvature-compensated":[5],"bandgap":[6],"reference.":[7],"By":[8],"introducing":[9,27],"temperature-adaptive":[11],"duty-cycled":[12],"resistor":[13],"to":[14],"scale":[15],"the":[16,19,34],"PTAT":[17],"voltage,":[18],"design":[20],"effectively":[21],"compensates":[22],"for":[23],"CTAT":[24],"nonlinearity":[25],"without":[26],"offset":[28],"errors.":[29],"Fabricated":[30],"in$0.18":[31],"\\mu":[32,40],"\\mathrm{m}$CMOS,":[33],"prototype":[35],"chip":[36],"occupies$0.068":[37],"\\text{mm}^{2}$and":[38],"consumes$15":[39],"\\mathrm{A}$.":[41],"After":[42],"two-point":[43],"trimming,":[44],"it":[45],"achieves":[46],"an":[47],"average":[48],"temperature":[49],"coefficient":[50],"of$1":[51],"\\text{ppm}":[52],"/{":[53],"}^{\\circ}":[54],"\\mathrm{C}$and":[55],"3":[57],"o":[58],"output":[59],"accuracy":[60],"within$\\pm":[61],"0.066":[62],"{\\%}$.":[63]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-03-04T00:00:00"}