{"id":"https://openalex.org/W7133337620","doi":"https://doi.org/10.1109/isscc49663.2026.11409005","title":"TinyPAD: A 166\u03bcm <sup>2</sup> /Lane Variation-Tolerant Probing-Attack Detector for an 8Gb/s/Lane Chip-to-Chip Interface in 16nm FinFET","display_name":"TinyPAD: A 166\u03bcm <sup>2</sup> /Lane Variation-Tolerant Probing-Attack Detector for an 8Gb/s/Lane Chip-to-Chip Interface in 16nm FinFET","publication_year":2026,"publication_date":"2026-02-15","ids":{"openalex":"https://openalex.org/W7133337620","doi":"https://doi.org/10.1109/isscc49663.2026.11409005"},"language":null,"primary_location":{"id":"doi:10.1109/isscc49663.2026.11409005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc49663.2026.11409005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100786430","display_name":"Mao Li","orcid":"https://orcid.org/0009-0009-5968-7250"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mao Li","raw_affiliation_strings":["Columbia University,New York,NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Columbia University,New York,NY","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127987206","display_name":"Rentao Wan","orcid":null},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rentao Wan","raw_affiliation_strings":["Columbia University,New York,NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Columbia University,New York,NY","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039276616","display_name":"Sanu Mathew","orcid":"https://orcid.org/0000-0003-1344-7533"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanu K Mathew","raw_affiliation_strings":["Intel,Hillsboro,OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel,Hillsboro,OR","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076642880","display_name":"Vivek De","orcid":"https://orcid.org/0000-0001-5207-1079"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vivek De","raw_affiliation_strings":["Intel,Hillsboro,OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel,Hillsboro,OR","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050497188","display_name":"Mingoo Seok","orcid":null},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Columbia University,New York,NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Columbia University,New York,NY","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22384348,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"436","last_page":"438"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.8481000065803528,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.8481000065803528,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.03350000083446503,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.01759999990463257,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.645799994468689},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.631600022315979},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47290000319480896},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.45170000195503235},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.39399999380111694},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.2797999978065491}],"concepts":[{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.645799994468689},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.631600022315979},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5210000276565552},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47290000319480896},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.45170000195503235},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.39399999380111694},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.388700008392334},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3343000113964081},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33390000462532043},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32359999418258667},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2797999978065491},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.2700999975204468},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.2563999891281128},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.2535000145435333},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.2500999867916107}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc49663.2026.11409005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc49663.2026.11409005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6172930598258972,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1985147001","https://openalex.org/W2101647015","https://openalex.org/W2120147158","https://openalex.org/W2394993236","https://openalex.org/W2951836184","https://openalex.org/W3106581868","https://openalex.org/W3158373903","https://openalex.org/W3170969852","https://openalex.org/W4313886962","https://openalex.org/W4376131456","https://openalex.org/W4386280869","https://openalex.org/W4398187583","https://openalex.org/W4406170905","https://openalex.org/W4408181949","https://openalex.org/W4408182995","https://openalex.org/W4408183510","https://openalex.org/W4410491852","https://openalex.org/W4412964739"],"related_works":[],"abstract_inverted_index":{"We":[0,45],"present":[1],"TinyPAD,":[2],"a":[3,41,49],"<tex":[4,51,68,75,87,95,102],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[5,52,69,76,88,96,103],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$166":[6],"\\mu":[7],"\\mathrm{m}^{2}":[8],"/$</tex>":[9,57],"lane":[10,58],"probing-attack":[11],"detector":[12],"in":[13,48],"16":[14],"nm":[15],"FinFET":[16],"with":[17],"82pF":[18],"maximum":[19,72],"supported":[20,73],"loading":[21],"as":[22,24],"well":[23],"0.2":[25],"pF":[26],"minimum":[27],"detectable":[28],"capacitance":[29],"(MDC)":[30],"that":[31],"operates":[32],"robustly":[33],"over":[34,81],"\u221240":[35],"to":[36,62],"125":[37],"\u00b0C":[38],"and":[39,84],"from":[40],"0.65-to-1.2":[42],"V":[43],"supply.":[44],"integrate":[46],"TinyPAD":[47,66],"5-lane":[50],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$8":[53],"\\text{Gb}":[54],"/":[55],"\\mathrm{s}":[56],"chip-to-chip":[59],"interface.":[60],"Compared":[61],"the":[63],"prior":[64],"arts,":[65],"achieves":[67],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$3.3":[70],"\\times$</tex>":[71,78,90,98,105],"loading,":[74],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$2.5":[77],"smaller":[79,106],"MDC":[80],"all":[82],"voltage":[83],"temperature":[85],"conditions,":[86],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$1.3":[89],"wider":[91],"range":[92],"for":[93,99],"temperature,":[94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$1.2":[97],"voltage,":[100],"at":[101],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$11":[104],"area":[107],"overhead.":[108]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-03-04T00:00:00"}