{"id":"https://openalex.org/W3135119737","doi":"https://doi.org/10.1109/isscc42613.2021.9365991","title":"SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers","display_name":"SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers","publication_year":2021,"publication_date":"2021-02-13","ids":{"openalex":"https://openalex.org/W3135119737","doi":"https://doi.org/10.1109/isscc42613.2021.9365991","mag":"3135119737"},"language":"en","primary_location":{"id":"doi:10.1109/isscc42613.2021.9365991","is_oa":true,"landing_page_url":"https://doi.org/10.1109/isscc42613.2021.9365991","pdf_url":"https://ieeexplore.ieee.org/ielx7/9365732/9365735/09365991.pdf","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/9365732/9365735/09365991.pdf","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059037025","display_name":"Ramesh Harjani","orcid":"https://orcid.org/0000-0001-7691-566X"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramesh Harjani","raw_affiliation_strings":["University of Minnesota,Minneapolis,MN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Minnesota,Minneapolis,MN","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075337538","display_name":"Mike Y. Chen","orcid":"https://orcid.org/0000-0001-5410-652X"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike Chen","raw_affiliation_strings":["University of Southern California,Los Angeles,LA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southern California,Los Angeles,LA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018199878","display_name":"Marco Berkhout","orcid":"https://orcid.org/0000-0002-2166-5242"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Marco Berkhout","raw_affiliation_strings":["Goodix Technology,Nijmegen,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Goodix Technology,Nijmegen,The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088966485","display_name":"Johan Vanderhaegan","orcid":null},"institutions":[{"id":"https://openalex.org/I1291425158","display_name":"Google (United States)","ror":"https://ror.org/00njsd438","country_code":"US","type":"company","lineage":["https://openalex.org/I1291425158","https://openalex.org/I4210128969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Johan Vanderhaegan","raw_affiliation_strings":["Google,Mountain View,CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Google,Mountain View,CA","institution_ids":["https://openalex.org/I1291425158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102823919","display_name":"Thomas H. Lee","orcid":"https://orcid.org/0000-0003-0635-2990"},"institutions":[{"id":"https://openalex.org/I1743320","display_name":"Palo Alto University","ror":"https://ror.org/04f812k67","country_code":"US","type":"education","lineage":["https://openalex.org/I1743320"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas H. Lee","raw_affiliation_strings":["Stanford University,Palo Alto,CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stanford University,Palo Alto,CA","institution_ids":["https://openalex.org/I1743320","https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027017637","display_name":"Robert Bogdan Staszewski","orcid":"https://orcid.org/0000-0001-9848-1129"},"institutions":[{"id":"https://openalex.org/I100930933","display_name":"University College Dublin","ror":"https://ror.org/05m7pjf47","country_code":"IE","type":"education","lineage":["https://openalex.org/I100930933"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"Robert Bogdan Staszewski","raw_affiliation_strings":["University College Dublin,Dublin,Ireland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University College Dublin,Dublin,Ireland","institution_ids":["https://openalex.org/I100930933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112395377","display_name":"Kathleen Philips","orcid":null},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kathleen Philips","raw_affiliation_strings":["IMEC,Eindhoven,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC,Eindhoven,The Netherlands","institution_ids":["https://openalex.org/I196972281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017948476","display_name":"Howard C. Luong","orcid":"https://orcid.org/0000-0003-1501-9313"},"institutions":[{"id":"https://openalex.org/I200769079","display_name":"Hong Kong University of Science and Technology","ror":"https://ror.org/00q4vv597","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Howard C. Luong","raw_affiliation_strings":["HKUST, Kowloon,Hong Kong,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HKUST, Kowloon,Hong Kong,China","institution_ids":["https://openalex.org/I200769079","https://openalex.org/I889458895"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103899849","display_name":"\u0412. \u041f. \u0418\u0432\u0430\u043d\u043e\u0432","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vadim Ivanov","raw_affiliation_strings":["Texas Instruments,Tucson,AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments,Tucson,AZ","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"541","last_page":"542"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","score":0.980400025844574,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","score":0.980400025844574,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.7446862459182739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6351035237312317},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.6215348243713379},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.621504545211792},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.41023680567741394},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3674580454826355},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.34225547313690186},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3326219618320465},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25737208127975464},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.11270776391029358}],"concepts":[{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.7446862459182739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6351035237312317},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.6215348243713379},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.621504545211792},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.41023680567741394},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3674580454826355},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.34225547313690186},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3326219618320465},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25737208127975464},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.11270776391029358},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc42613.2021.9365991","is_oa":true,"landing_page_url":"https://doi.org/10.1109/isscc42613.2021.9365991","pdf_url":"https://ieeexplore.ieee.org/ielx7/9365732/9365735/09365991.pdf","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/isscc42613.2021.9365991","is_oa":true,"landing_page_url":"https://doi.org/10.1109/isscc42613.2021.9365991","pdf_url":"https://ieeexplore.ieee.org/ielx7/9365732/9365735/09365991.pdf","source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1585007175","https://openalex.org/W2382521049","https://openalex.org/W2144385241","https://openalex.org/W2165950148","https://openalex.org/W4253593777","https://openalex.org/W2951497643","https://openalex.org/W4300101996","https://openalex.org/W2142393343","https://openalex.org/W3101625811","https://openalex.org/W2338854850"],"abstract_inverted_index":{"This":[0],"special":[1],"event":[2],"will":[3,51],"focus":[4],"on":[5],"typical":[6],"mistakes":[7],"that":[8],"all":[9],"starting":[10],"graduate":[11],"students":[12],"seem":[13],"to":[14],"make":[15],"when":[16],"they":[17,33],"first":[18],"start":[19],"designing":[20],"circuits.":[21],"Many":[22],"of":[23,43,58],"these":[24],"errors":[25,37],"are":[26,34],"simple":[27],"and":[28,47,55],"easily":[29],"avoided":[30],"if":[31],"only":[32],"pre-warned.":[35],"These":[36],"show":[38],"up":[39],"at":[40],"different":[41],"phases":[42],"design,":[44],"simulation,":[45],"layout":[46],"testing.":[48],"Renowned":[49],"speakers":[50],"share":[52],"their":[53,59],"experience":[54],"provide":[56],"examples":[57],"own":[60],"mistakes!":[61]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}