{"id":"https://openalex.org/W2921395474","doi":"https://doi.org/10.1109/isscc.2019.8662534","title":"15.8 A 4.5V/ns Active Slew-Rate-Controlling Gate Driver with Robust Discrete-Time Feedback Technique for 600V Superjunction MOSFETs","display_name":"15.8 A 4.5V/ns Active Slew-Rate-Controlling Gate Driver with Robust Discrete-Time Feedback Technique for 600V Superjunction MOSFETs","publication_year":2019,"publication_date":"2019-02-01","ids":{"openalex":"https://openalex.org/W2921395474","doi":"https://doi.org/10.1109/isscc.2019.8662534","mag":"2921395474"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2019.8662534","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2019.8662534","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078039951","display_name":"Shusuke Kawai","orcid":"https://orcid.org/0000-0003-1070-7213"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shusuke Kawai","raw_affiliation_strings":["Toshiba, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102254480","display_name":"Takeshi Ueno","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Ueno","raw_affiliation_strings":["Toshiba, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112631683","display_name":"Kohei Onizuka","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kohei Onizuka","raw_affiliation_strings":["Toshiba, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5078039951"],"corresponding_institution_ids":["https://openalex.org/I1292669757"],"apc_list":null,"apc_paid":null,"fwci":0.843,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.73431858,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"252","last_page":"254"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.7014687061309814},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48619455099105835},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4274396598339081},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42394447326660156},{"id":"https://openalex.org/keywords/gate-driver","display_name":"Gate driver","score":0.4237006604671478},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3548903465270996},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3390766382217407},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.28738683462142944},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22786763310432434},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19096305966377258}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.7014687061309814},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48619455099105835},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4274396598339081},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42394447326660156},{"id":"https://openalex.org/C179141203","wikidata":"https://www.wikidata.org/wiki/Q1495747","display_name":"Gate driver","level":3,"score":0.4237006604671478},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3548903465270996},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3390766382217407},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.28738683462142944},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22786763310432434},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19096305966377258},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2019.8662534","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2019.8662534","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.44999998807907104,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1717891563","https://openalex.org/W1976681292","https://openalex.org/W2461936611","https://openalex.org/W2590160051","https://openalex.org/W2790638037","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2014419659","https://openalex.org/W2029904754","https://openalex.org/W2918122836","https://openalex.org/W2795900847","https://openalex.org/W4284898111","https://openalex.org/W3135654545","https://openalex.org/W4386076758","https://openalex.org/W1528250583","https://openalex.org/W2146952725"],"abstract_inverted_index":{"Active":[0],"gate":[1,27,70,140,145],"control":[2,141],"is":[3,29,99,128],"an":[4],"emerging":[5],"technique":[6],"to":[7,73],"minimize":[8],"the":[9,32,37,42,69,81,88,92,97,121,138],"switching":[10,84,150],"loss":[11,85,133],"of":[12,26,41,102,120],"high-power":[13],"converters":[14],"facing":[15],"noise-suppression":[16],"challenges.":[17],"In":[18],"a":[19,23],"conventional":[20],"gate-driver":[21],"design,":[22],"fixed":[24],"value":[25],"resistance":[28,71],"chosen":[30],"by":[31,111],"converter":[33,94],"designers":[34],"so":[35],"that":[36,142],"slew":[38],"rate":[39],"(SR)":[40],"drain":[43],"voltage":[44],"V":[45,115],"<sub":[46,52,76,105,116],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[47,53,77,106,117],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">d</sub>":[48,54,78,107],",":[49],"namely":[50],"dV":[51,75,104],"/dt,":[55],"does":[56],"not":[57],"exceed":[58],"noise-aware":[59],"design":[60],"guidelines":[61],"in":[62,83,125],"each":[63],"application":[64],"and":[65,80,114,134],"use":[66],"case.":[67],"Minimizing":[68],"leads":[72],"high":[74],"/dt":[79,108],"reduction":[82],"while":[86],"shortening":[87],"turn-on":[89],"delay":[90],"for":[91,131,137],"overall":[93],"performance.":[95],"However,":[96],"impact":[98],"limited":[100],"because":[101],"uncontrollable":[103],"drift":[109],"caused":[110],"load-current,":[112],"temperature,":[113],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</sub>":[118],"variations":[119],"power":[122],"transistors.":[123],"Thus,":[124],"practice":[126],"there":[127],"significant":[129],"room":[130],"further":[132],"turn-on-delay":[135],"minimization":[136],"active":[139],"adaptively":[143],"modulates":[144],"driving":[146],"ability":[147],"within":[148],"every":[149],"cycle.":[151]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-05T09:29:38.588285","created_date":"2025-10-10T00:00:00"}