{"id":"https://openalex.org/W2790300251","doi":"https://doi.org/10.1109/isscc.2018.8310198","title":"A 33Mpixel CMOS imager with multi-functional 3-stage pipeline ADC for 480fps high-speed mode and 120fps low-noise mode","display_name":"A 33Mpixel CMOS imager with multi-functional 3-stage pipeline ADC for 480fps high-speed mode and 120fps low-noise mode","publication_year":2018,"publication_date":"2018-02-01","ids":{"openalex":"https://openalex.org/W2790300251","doi":"https://doi.org/10.1109/isscc.2018.8310198","mag":"2790300251"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2018.8310198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2018.8310198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Solid - State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064340316","display_name":"Toshio Yasue","orcid":"https://orcid.org/0000-0001-8097-6211"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Toshio Yasue","raw_affiliation_strings":["NHK Science & Technology Research Laboratories, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084866690","display_name":"K. Tomioka","orcid":"https://orcid.org/0000-0002-2504-1154"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kohei Tomioka","raw_affiliation_strings":["Nihon Hoso Kyokai, Shibuya-ku, Tokyo, JP"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nihon Hoso Kyokai, Shibuya-ku, Tokyo, JP","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038513995","display_name":"Ryohei Funatsu","orcid":"https://orcid.org/0000-0002-9334-8545"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ryohei Funatsu","raw_affiliation_strings":["NHK Science & Technology Research Laboratories, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081232045","display_name":"Tomohiro Nakamura","orcid":"https://orcid.org/0000-0002-7220-7081"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tomohiro Nakamura","raw_affiliation_strings":["NHK Science & Technology Research Laboratories, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102827425","display_name":"Takahiro Yamasaki","orcid":"https://orcid.org/0000-0002-1915-7820"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takahiro Yamasaki","raw_affiliation_strings":["NHK Science & Technology Research Laboratories, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011804609","display_name":"Hiroshi Shimamoto","orcid":"https://orcid.org/0000-0001-8249-6588"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroshi Shimamoto","raw_affiliation_strings":["Nihon Hoso Kyokai, Shibuya-ku, Tokyo, JP"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nihon Hoso Kyokai, Shibuya-ku, Tokyo, JP","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102194619","display_name":"Tomohiko Kosugi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tomohiko Kosugi","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056554453","display_name":"Sung-Wook Jun","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sung-Wook Jun","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101499939","display_name":"Takashi Watanabe","orcid":"https://orcid.org/0000-0002-9380-8193"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takashi Watanabe","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060728270","display_name":"Masanori Nagase","orcid":"https://orcid.org/0000-0001-6260-203X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masanori Nagase","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058885472","display_name":"Toshiaki Kitajima","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Toshiaki Kitajima","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110719675","display_name":"Satoshi Aoyama","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Satoshi Aoyama","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065338590","display_name":"Shoji Kawahito","orcid":"https://orcid.org/0000-0003-4456-5006"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji Kawahito","raw_affiliation_strings":["Brookman Technology, Hamamatsu, Japan","Shizuoka University, Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Hamamatsu, Japan","institution_ids":[]},{"raw_affiliation_string":"Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5064340316"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3564,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.89024492,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"90","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7235971689224243},{"id":"https://openalex.org/keywords/gamut","display_name":"Gamut","score":0.6626218557357788},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5897011160850525},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.510532021522522},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5090634226799011},{"id":"https://openalex.org/keywords/high-dynamic-range","display_name":"High dynamic range","score":0.49460193514823914},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.4930085837841034},{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.47725650668144226},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4730467200279236},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4728396534919739},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.46593040227890015},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4570586085319519},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4441741406917572},{"id":"https://openalex.org/keywords/rolling-shutter","display_name":"Rolling shutter","score":0.43494734168052673},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30052945017814636},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18348869681358337},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.17925426363945007},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14802107214927673}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7235971689224243},{"id":"https://openalex.org/C2780061478","wikidata":"https://www.wikidata.org/wiki/Q375857","display_name":"Gamut","level":2,"score":0.6626218557357788},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5897011160850525},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.510532021522522},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5090634226799011},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.49460193514823914},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.4930085837841034},{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.47725650668144226},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4730467200279236},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4728396534919739},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.46593040227890015},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4570586085319519},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4441741406917572},{"id":"https://openalex.org/C2776166537","wikidata":"https://www.wikidata.org/wiki/Q2164193","display_name":"Rolling shutter","level":3,"score":0.43494734168052673},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30052945017814636},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18348869681358337},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.17925426363945007},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14802107214927673},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2776871301","wikidata":"https://www.wikidata.org/wiki/Q691823","display_name":"Shutter","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2018.8310198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2018.8310198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Solid - State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1975545060","https://openalex.org/W1984910794","https://openalex.org/W2053943475","https://openalex.org/W2292489093","https://openalex.org/W2524303370","https://openalex.org/W2575486884","https://openalex.org/W6663899772","https://openalex.org/W6727241211","https://openalex.org/W6939887292"],"related_works":["https://openalex.org/W3033884118","https://openalex.org/W2318442036","https://openalex.org/W3092138191","https://openalex.org/W3006819602","https://openalex.org/W2328736027","https://openalex.org/W3157016129","https://openalex.org/W4319599328","https://openalex.org/W2977050028","https://openalex.org/W4387575806","https://openalex.org/W4390783470"],"abstract_inverted_index":{"High-resolution":[0],"video":[1,24],"has":[2,46],"rapidly":[3],"integrated":[4],"into":[5],"our":[6],"daily":[7],"life":[8],"in":[9,14],"the":[10,69,83,88],"context":[11],"of":[12,71,77,82,87,110],"progress":[13],"camera,":[15],"display,":[16],"signal":[17],"processing,":[18],"and":[19,36,75,97,104],"communication":[20],"technologies.":[21],"The":[22],"uppermost":[23],"parameters":[25,45],"standardized":[26],"at":[27],"this":[28],"moment":[29],"include":[30],"8K,":[31],"120-fps,":[32],"12b":[33],"RGB,":[34],"wide-color-gamut,":[35],"HDR.":[37],"Although":[38],"a":[39,57,106],"camera":[40],"that":[41],"fulfills":[42],"all":[43],"these":[44,102],"been":[47],"reported":[48],"based":[49],"on":[50,101],"1.7-inch":[51],"33-Mpixel":[52],"CMOS":[53],"imagers":[54],"[1],":[55],"achieving":[56],"smaller":[58],"form":[59],"factor":[60],"while":[61],"also":[62],"maintaining":[63],"image":[64,89],"quality":[65,90],"is":[66],"required":[67],"from":[68],"standpoint":[70],"mobility,":[72],"lens":[73],"design,":[74],"depth":[76],"focus.":[78],"In":[79],"general,":[80],"miniaturization":[81],"imager":[84],"causes":[85],"degradation":[86],"metrics":[91],"such":[92],"as":[93],"sensitivity,":[94],"dynamic":[95],"range,":[96],"resolution.":[98],"We":[99],"deliberated":[100],"difficulties,":[103],"set":[105],"target":[107],"optical":[108],"format":[109],"1.25":[111],"inch.":[112]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":3}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}