{"id":"https://openalex.org/W2594706451","doi":"https://doi.org/10.1109/isscc.2017.7870448","title":"Session 26 overview: Processor-power management and clocking","display_name":"Session 26 overview: Processor-power management and clocking","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2594706451","doi":"https://doi.org/10.1109/isscc.2017.7870448","mag":"2594706451"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2017.7870448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2017.7870448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040206910","display_name":"Kathy Wilcox","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Kathy Wilcox","raw_affiliation_strings":["AMD, Boxborough, MA, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AMD, Boxborough, MA, United States of America","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069448134","display_name":"Youngmin Shin","orcid":"https://orcid.org/0000-0003-3457-2720"},"institutions":[{"id":"https://openalex.org/I4210088807","display_name":"Samsung Pharm (South Korea)","ror":"https://ror.org/003eds368","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210088807"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngmin Shin","raw_affiliation_strings":["Samsung, Hwaseong, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung, Hwaseong, Korea","institution_ids":["https://openalex.org/I4210088807"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089989063","display_name":"\u00c9dith Beign\u00e9","orcid":"https://orcid.org/0000-0001-6350-1054"},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Edith Beigne","raw_affiliation_strings":["CEA-LETI, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-LETI, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040206910"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01678773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"436","last_page":"437"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9563000202178955,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9563000202178955,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9459999799728394,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9304999709129333,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7528936862945557},{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.7501752972602844},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.686269223690033},{"id":"https://openalex.org/keywords/bandwidth-throttling","display_name":"Bandwidth throttling","score":0.656000018119812},{"id":"https://openalex.org/keywords/power-management","display_name":"Power management","score":0.6355735063552856},{"id":"https://openalex.org/keywords/data-center","display_name":"Data center","score":0.5822080373764038},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5397322177886963},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4949881434440613},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.43371161818504333},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4265438914299011},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3605427145957947},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.33725106716156006},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17474281787872314}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7528936862945557},{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.7501752972602844},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.686269223690033},{"id":"https://openalex.org/C173061102","wikidata":"https://www.wikidata.org/wiki/Q478819","display_name":"Bandwidth throttling","level":3,"score":0.656000018119812},{"id":"https://openalex.org/C2778774385","wikidata":"https://www.wikidata.org/wiki/Q4437810","display_name":"Power management","level":3,"score":0.6355735063552856},{"id":"https://openalex.org/C153740404","wikidata":"https://www.wikidata.org/wiki/Q671224","display_name":"Data center","level":2,"score":0.5822080373764038},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5397322177886963},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4949881434440613},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.43371161818504333},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4265438914299011},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3605427145957947},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.33725106716156006},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17474281787872314},{"id":"https://openalex.org/C131097465","wikidata":"https://www.wikidata.org/wiki/Q178898","display_name":"Gas compressor","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2017.7870448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2017.7870448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2393348554","https://openalex.org/W2349133582","https://openalex.org/W2733481536","https://openalex.org/W2765340260","https://openalex.org/W2770705885","https://openalex.org/W2552083296","https://openalex.org/W2794470368","https://openalex.org/W1587397813","https://openalex.org/W808103542"],"abstract_inverted_index":{"The":[0,37],"first":[1],"paper":[2,21],"in":[3],"this":[4],"session":[5],"considers":[6],"optimization":[7],"of":[8,46,55],"computing":[9],"systems":[10],"at":[11],"multiple":[12],"levels":[13],"from":[14],"silicon":[15],"to":[16,23,33],"data":[17],"center.":[18],"A":[19],"second":[20],"pertains":[22],"power":[24,45],"delivery":[25],"network":[26,49],"reliability":[27],"and":[28,58],"presents":[29],"a":[30],"software":[31],"approach":[32],"mitigating":[34],"worst-case":[35],"droop.":[36],"remaining":[38],"three":[39],"papers":[40],"deal":[41],"with":[42],"improving":[43],"the":[44,47],"clock":[48],"by":[50],"making":[51],"it":[52],"reconfigurable,":[53],"use":[54],"adiabatic":[56],"techniques":[57],"through":[59],"adaptive":[60],"frequency":[61],"throttling.":[62]},"counts_by_year":[],"updated_date":"2026-05-04T08:30:34.212998","created_date":"2025-10-10T00:00:00"}