{"id":"https://openalex.org/W2593522389","doi":"https://doi.org/10.1109/isscc.2017.7870407","title":"21.2 A 1.4m\u2126-sensitivity 94dB-dynamic-range electrical impedance tomography SoC and 48-channel Hub SoC for 3D lung ventilation monitoring system","display_name":"21.2 A 1.4m\u2126-sensitivity 94dB-dynamic-range electrical impedance tomography SoC and 48-channel Hub SoC for 3D lung ventilation monitoring system","publication_year":2017,"publication_date":"2017-02-01","ids":{"openalex":"https://openalex.org/W2593522389","doi":"https://doi.org/10.1109/isscc.2017.7870407","mag":"2593522389"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2017.7870407","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2017.7870407","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100671475","display_name":"Minseo Kim","orcid":"https://orcid.org/0000-0002-9933-9789"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Minseo Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101574426","display_name":"Hyunki Kim","orcid":"https://orcid.org/0000-0001-5949-9238"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunki Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023250057","display_name":"Jaeeun Jang","orcid":"https://orcid.org/0000-0002-1311-7721"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeeun Jang","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048898383","display_name":"Ji Hee Lee","orcid":"https://orcid.org/0000-0003-1440-9088"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihee Lee","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011205347","display_name":"Jaehyuk Lee","orcid":"https://orcid.org/0000-0001-7113-1161"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyuk Lee","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043618783","display_name":"Jiwon Lee","orcid":"https://orcid.org/0000-0003-3738-4872"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jiwon Lee","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039942603","display_name":"Kyungrog Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungrog Lee","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048657794","display_name":"Kwantae Kim","orcid":"https://orcid.org/0000-0001-8962-4554"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kwantae Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101773264","display_name":"Yongsu Lee","orcid":"https://orcid.org/0000-0001-8174-3444"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongsu Lee","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-jun Yoo","raw_affiliation_strings":["KAIST, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5100671475"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.47487619,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.957686722278595},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6535191535949707},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.53025883436203},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5215180516242981},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45066559314727783},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4433036148548126},{"id":"https://openalex.org/keywords/ventilation","display_name":"Ventilation (architecture)","score":0.41765648126602173},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.41446250677108765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37852638959884644},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3779852092266083},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3211039900779724},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23563894629478455}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.957686722278595},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6535191535949707},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.53025883436203},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5215180516242981},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45066559314727783},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4433036148548126},{"id":"https://openalex.org/C200457457","wikidata":"https://www.wikidata.org/wiki/Q584049","display_name":"Ventilation (architecture)","level":2,"score":0.41765648126602173},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.41446250677108765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37852638959884644},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3779852092266083},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3211039900779724},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23563894629478455},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2017.7870407","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2017.7870407","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6700000166893005,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1480858673","https://openalex.org/W1980893811","https://openalex.org/W1998025986","https://openalex.org/W2020733548","https://openalex.org/W2057438408"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W4285180073","https://openalex.org/W2051428347","https://openalex.org/W2752613076","https://openalex.org/W2944246511","https://openalex.org/W2766191795","https://openalex.org/W1799225360"],"abstract_inverted_index":{"Electrical":[0],"impedance":[1,98,131,172],"tomography":[2],"(EIT)":[3],"has":[4,65,74],"been":[5,67],"studied":[6],"to":[7,54,124,134,141,152,164,177],"monitor":[8],"lung":[9,17,39,70,111],"ventilation":[10,112],"because":[11,72],"it":[12,73],"is":[13],"the":[14,38,47,55,63,179],"only":[15],"real-time":[16,110],"imaging":[18],"method":[19],"without":[20],"large":[21,96],"equipment":[22],"[1\u20132].":[23],"However,":[24],"previous":[25],"EIT":[26,51,146],"systems":[27],"just":[28],"provided":[29],"2D":[30,50],"cross-sectional":[31],"image":[32],"with":[33,114,170],"limited":[34],"spatial":[35],"information":[36],"of":[37,49,60,168,183],"and":[40,93,95,147,151,173],"unneglectable":[41],"volume":[42],"detection":[43],"error":[44],"depending":[45],"on":[46],"location":[48],"belt":[52],"relative":[53],"patient's":[56],"lung.":[57],"In":[58,100],"spite":[59],"its":[61],"importance,":[62],"3D-EIT":[64,107],"not":[66],"realized":[68],"in":[69,90],"monitoring":[71,113],"many":[75],"design":[76],"challenges":[77],"such":[78],"as":[79],"noises":[80],"incurred":[81],"by":[82],"complicated":[83],"wiring,":[84],"long":[85],"cable":[86],"length,":[87],"wide":[88],"variation":[89],"electrode":[91],"contact":[92],"signal,":[94],"personal-to-person":[97],"variation.":[99],"this":[101],"paper,":[102],"we":[103],"present":[104],"a":[105],"portable":[106],"SoC":[108],"for":[109,157],"following":[115],"5":[116],"features:":[117],"1)":[118],"The":[119],"active":[120],"electrodes":[121],"(AEs)":[122],"system":[123],"reduce":[125,178],"coupling":[126],"noise,":[127],"2)":[128],"High":[129],"output":[130],"current":[132],"stimulator":[133],"inject":[135],"stable":[136],"current,":[137],"3)":[138],"Impedance":[139],"spectroscopy":[140],"enable":[142],"both":[143],"time-difference":[144],"(TD)":[145],"frequency-difference":[148],"(FD)":[149],"EIT,":[150],"select":[153],"an":[154],"optimal":[155],"frequency":[156],"TD-EIT,":[158],"4)":[159],"Wide-dynamic":[160],"range":[161],"front-end":[162],"circuit":[163],"detect":[165],"variable":[166],"ranges":[167],"signal":[169],"high-input":[171],"CMRR,":[174],"5)":[175],"Calibration":[176],"electrical":[180],"characteristics":[181],"variations":[182],"AEs.":[184]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}