{"id":"https://openalex.org/W2289333215","doi":"https://doi.org/10.1109/isscc.2016.7417956","title":"8.8 iRazor: 3-transistor current-based error detection and correction in an ARM Cortex-R4 processor","display_name":"8.8 iRazor: 3-transistor current-based error detection and correction in an ARM Cortex-R4 processor","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2289333215","doi":"https://doi.org/10.1109/isscc.2016.7417956","mag":"2289333215"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2016.7417956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2016.7417956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100329228","display_name":"Yiqun Zhang","orcid":"https://orcid.org/0000-0001-5584-6503"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiqun Zhang","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058199211","display_name":"Mahmood Khayatzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahmood Khayatzadeh","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076619099","display_name":"Kaiyuan Yang","orcid":"https://orcid.org/0000-0001-7220-9389"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kaiyuan Yang","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007702824","display_name":"Mehdi Saligane","orcid":"https://orcid.org/0000-0003-0237-4690"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mehdi Saligane","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050270997","display_name":"Nathaniel Pinckney","orcid":"https://orcid.org/0000-0001-6159-8964"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nathaniel Pinckney","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052037141","display_name":"Massimo Alioto","orcid":"https://orcid.org/0000-0002-4127-8258"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Massimo Alioto","raw_affiliation_strings":["University of Singapore, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Singapore, Singapore","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026311377","display_name":"David Blaauw","orcid":"https://orcid.org/0000-0001-6744-7075"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Blaauw","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000767141","display_name":"Dennis Sylvester","orcid":"https://orcid.org/0000-0003-2598-0458"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dennis Sylvester","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":18.9704,"has_fulltext":false,"cited_by_count":57,"citation_normalized_percentile":{"value":0.9980136,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"160","last_page":"162"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/arm-architecture","display_name":"ARM architecture","score":0.6796616315841675},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6580560207366943},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6254202127456665},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4632251262664795},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4267209768295288},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.418855220079422},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4031546711921692},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14523380994796753},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13981136679649353},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12847810983657837}],"concepts":[{"id":"https://openalex.org/C26771161","wikidata":"https://www.wikidata.org/wiki/Q16980","display_name":"ARM architecture","level":2,"score":0.6796616315841675},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6580560207366943},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6254202127456665},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4632251262664795},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4267209768295288},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.418855220079422},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4031546711921692},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14523380994796753},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13981136679649353},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12847810983657837}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2016.7417956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2016.7417956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2015917466","https://openalex.org/W2039559700","https://openalex.org/W2106648230","https://openalex.org/W2156667996","https://openalex.org/W2178304595","https://openalex.org/W3141370589","https://openalex.org/W3142757892","https://openalex.org/W6660155203"],"related_works":["https://openalex.org/W1982412832","https://openalex.org/W2937608115","https://openalex.org/W4244464241","https://openalex.org/W2384573129","https://openalex.org/W2351224547","https://openalex.org/W2358945257","https://openalex.org/W2354534486","https://openalex.org/W2354675835","https://openalex.org/W2887872171","https://openalex.org/W2359933272"],"abstract_inverted_index":{"It":[0],"is":[1,32],"well":[2],"known":[3],"that":[4,13,41],"technology":[5],"scaling":[6],"has":[7,107],"led":[8],"to":[9,26,114],"increasing":[10],"process/voltage/temperature/aging":[11],"margins":[12,31],"substantially":[14],"degrade":[15],"performance":[16,102],"and":[17,22,45,123],"power":[18],"in":[19,58,112],"modern":[20],"processors":[21],"SoCs.":[23],"One":[24],"approach":[25],"address":[27],"these":[28],"large":[29,66],"timing":[30],"the":[33,51,101],"use":[34],"of":[35,93],"specialized":[36],"registers":[37],"on":[38],"critical":[39],"paths":[40],"perform":[42],"error":[43],"detection":[44],"correction":[46],"(EDAC)":[47],"[1-5].":[48],"While":[49],"promising,":[50],"previously":[52],"proposed":[53],"implementations":[54,92],"have":[55,88],"been":[56,89,109],"limited":[57],"several":[59],"ways.":[60],"Most":[61],"notably,":[62],"they":[63],"often":[64],"incur":[65],"overheads":[67],"beyond":[68],"conventional":[69],"register":[70],"designs":[71,84],"(e.g.,":[72],"8-to-44":[73],"additional":[74],"transistors":[75],"per":[76],"register).":[77],"This":[78],"becomes":[79],"an":[80],"obstacle":[81],"for":[82],"commercial":[83,98],"and,":[85],"hence,":[86],"there":[87],"no":[90],"reported":[91],"EDAC":[94,105],"approaches":[95,106,118],"within":[96],"substantial":[97],"processors.":[99],"Finally,":[100],"gain":[103],"from":[104],"not":[108],"thoroughly":[110],"quantified":[111],"relation":[113],"competing,":[115],"lower":[116],"overhead":[117],"such":[119],"as":[120],"frequency":[121],"binning":[122],"canary":[124],"circuits/critical":[125],"path":[126],"monitors":[127],"[6].":[128]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":21},{"year":2016,"cited_by_count":6}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}