{"id":"https://openalex.org/W2036497477","doi":"https://doi.org/10.1109/isscc.2015.7063154","title":"SC1: Circuit design in advanced CMOS technologies: How to design with lower supply voltages","display_name":"SC1: Circuit design in advanced CMOS technologies: How to design with lower supply voltages","publication_year":2015,"publication_date":"2015-02-01","ids":{"openalex":"https://openalex.org/W2036497477","doi":"https://doi.org/10.1109/isscc.2015.7063154","mag":"2036497477"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2015.7063154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076274517","display_name":"Wim Dehaene","orcid":"https://orcid.org/0000-0002-6792-7965"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Wim Dehaene","raw_affiliation_strings":["KU Leuven, Leuven, Belgium","KU Leuven, Leuven (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"KU Leuven, Leuven (Belgium)","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5076274517"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.12060247,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9581999778747559,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9581999778747559,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9296000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8289294838905334},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6087051630020142},{"id":"https://openalex.org/keywords/swing","display_name":"Swing","score":0.5907683372497559},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5739874243736267},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.53957200050354},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.533018171787262},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.5303032398223877},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5261960625648499},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4921357035636902},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.4708912968635559},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4654902219772339},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4255119860172272},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37370169162750244}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8289294838905334},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6087051630020142},{"id":"https://openalex.org/C65655974","wikidata":"https://www.wikidata.org/wiki/Q14867674","display_name":"Swing","level":2,"score":0.5907683372497559},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5739874243736267},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.53957200050354},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.533018171787262},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.5303032398223877},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5261960625648499},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4921357035636902},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.4708912968635559},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4654902219772339},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4255119860172272},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37370169162750244},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2015.7063154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2070694218","https://openalex.org/W2532822217","https://openalex.org/W2081795747","https://openalex.org/W2093304652","https://openalex.org/W2098316714","https://openalex.org/W4389672975","https://openalex.org/W1987513258","https://openalex.org/W1963851171","https://openalex.org/W2134664711","https://openalex.org/W2109207559"],"abstract_inverted_index":{"Technology":[0],"scaling":[1],"brings":[2],"lower":[3],"supply":[4],"voltages.":[5],"For":[6],"advanced":[7],"CMOS":[8],"technology":[9],"nodes":[10],"of":[11],"40nm":[12],"and":[13,28,56],"beyond,":[14],"this":[15,60],"leads":[16],"to":[17],"specific":[18],"challenges.":[19],"In":[20],"particular,":[21],"analog":[22],"circuits":[23],"require":[24],"specialized":[25],"design":[26],"approaches":[27],"innovative":[29],"techniques.":[30],"Maintaining":[31],"high":[32],"precision":[33],"with":[34],"reduced":[35],"available":[36],"signal":[37],"swing":[38],"while":[39],"keeping":[40],"energy":[41],"consumption":[42],"within":[43],"reasonable":[44],"bounds":[45],"has":[46],"presented":[47],"challenges":[48],"for":[49],"many":[50],"circuit":[51],"designers.":[52],"Increased":[53],"technological":[54],"variability":[55],"leakage":[57],"only":[58],"make":[59],"worse.":[61]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}