{"id":"https://openalex.org/W2002047763","doi":"https://doi.org/10.1109/isscc.2015.7063139","title":"27.8 A 4600μm<sup>2</sup> 1.5°C (3σ) 0.9kS/s thermal-diffusivity temperature sensor with VCO-based readout","display_name":"27.8 A 4600μm<sup>2</sup> 1.5°C (3σ) 0.9kS/s thermal-diffusivity temperature sensor with VCO-based readout","publication_year":2015,"publication_date":"2015-02-01","ids":{"openalex":"https://openalex.org/W2002047763","doi":"https://doi.org/10.1109/isscc.2015.7063139","mag":"2002047763"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2015.7063139","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063139","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056688063","display_name":"Rui Quan","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Rui Quan","raw_affiliation_strings":["Delft University of Technology, Delft, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062147405","display_name":"U\u011fur S\u00f6nmez","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ugur Sonmez","raw_affiliation_strings":["Delft University of Technology, Delft, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101784340","display_name":"Fabio Sebastiano","orcid":"https://orcid.org/0000-0002-8489-9409"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Fabio Sebastiano","raw_affiliation_strings":["Delft University of Technology, Delft, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A. A. Makinwa","raw_affiliation_strings":["Delft University of Technology, Delft, The Netherlands","Delft Univ. of Tech., Delft, The Netherlands#TAB#"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Tech., Delft, The Netherlands#TAB#","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5056688063"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.7891,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.75914607,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermopile","display_name":"Thermopile","score":0.8708759546279907},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7102997303009033},{"id":"https://openalex.org/keywords/thermal-diffusivity","display_name":"Thermal diffusivity","score":0.6104546189308167},{"id":"https://openalex.org/keywords/microheater","display_name":"Microheater","score":0.5963277816772461},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5232825875282288},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5000977516174316},{"id":"https://openalex.org/keywords/millisecond","display_name":"Millisecond","score":0.488505482673645},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4286131262779236},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4198463261127472},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.41781628131866455},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.41179677844047546},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.40224581956863403},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.389363557100296},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.378610759973526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2955290675163269},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.260246217250824}],"concepts":[{"id":"https://openalex.org/C47279676","wikidata":"https://www.wikidata.org/wiki/Q915693","display_name":"Thermopile","level":3,"score":0.8708759546279907},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7102997303009033},{"id":"https://openalex.org/C37668627","wikidata":"https://www.wikidata.org/wiki/Q3381809","display_name":"Thermal diffusivity","level":2,"score":0.6104546189308167},{"id":"https://openalex.org/C2779426163","wikidata":"https://www.wikidata.org/wiki/Q17123760","display_name":"Microheater","level":4,"score":0.5963277816772461},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5232825875282288},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5000977516174316},{"id":"https://openalex.org/C60327585","wikidata":"https://www.wikidata.org/wiki/Q723733","display_name":"Millisecond","level":2,"score":0.488505482673645},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4286131262779236},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4198463261127472},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.41781628131866455},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.41179677844047546},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40224581956863403},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.389363557100296},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.378610759973526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2955290675163269},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.260246217250824},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.0},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2015.7063139","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063139","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1966656109","https://openalex.org/W1998561139","https://openalex.org/W2042707879","https://openalex.org/W2086489180","https://openalex.org/W2090351433","https://openalex.org/W2125240972"],"related_works":["https://openalex.org/W1598554143","https://openalex.org/W2317523189","https://openalex.org/W2315245353","https://openalex.org/W4304813554","https://openalex.org/W4366975854","https://openalex.org/W2408585145","https://openalex.org/W2358088046","https://openalex.org/W2911355857","https://openalex.org/W2133468814","https://openalex.org/W2053673665"],"abstract_inverted_index":{"Temperature":[0],"sensors":[1,23,58,65,138],"are":[2,15,148],"widely":[3],"used":[4],"in":[5,85,125],"microprocessors":[6],"to":[7,17,28,34,42,44,152],"monitor":[8],"on-chip":[9],"temperature":[10,102],"gradients":[11],"and":[12,39,155],"hot-spots,":[13],"which":[14,124,147,156],"known":[16],"negatively":[18],"impact":[19],"reliability":[20],"[1-4].":[21],"Such":[22],"should":[24],"be:":[25],"1)":[26],"Small":[27],"facilitate":[29],"floor":[30],"planning;":[31],"2)":[32],"Fast":[33],"track":[35],"millisecond":[36],"thermal":[37,55],"transients":[38],"3)":[40],"Easy":[41],"trim":[43],"reduce":[45],"the":[46,69,74,118,121,132,162],"associated":[47,72],"costs.":[48],"Recently,":[49],"it":[50,113],"has":[51,139],"been":[52,140],"shown":[53],"that":[54],"diffusivity":[56],"(TD)":[57],"can":[59,88],"meet":[60],"these":[61],"requirements":[62],"[5].":[63,165],"TD":[64,137],"operate":[66],"by":[67,97,117,129],"digitizing":[68],"temperature-dependent":[70],"delay":[71],"with":[73,108],"diffusion":[75],"of":[76,120,135],"heat":[77],"pulses":[78],"through":[79],"an":[80],"electro-thermal":[81],"filter":[82],"(ETF),":[83],"which,":[84],"standard":[86],"CMOS,":[87],"be":[89],"readily":[90],"implemented":[91],"as":[92],"a":[93,98],"resistive":[94],"heater":[95],"surrounded":[96],"thermopile.":[99],"Unlike":[100],"BJT-based":[101],"sensors,":[103],"their":[104],"accuracy":[105,119],"actually":[106],"improves":[107],"CMOS":[109],"scaling":[110],"[6],":[111],"since":[112],"is":[114,127],"mainly":[115],"limited":[116],"heater/thermopile":[122],"spacing,":[123],"turn":[126],"determined":[128],"lithography.":[130],"However,":[131],"readout":[133],"circuitry":[134],"prior":[136],"based":[141],"on":[142],"analog":[143],"phase-domain":[144],"\u0394\u03a3":[145],"ADCs,":[146],"not":[149],"easily":[150],"ported":[151],"low-voltage":[153],"technologies,":[154],"occupy":[157],"much":[158],"more":[159],"area":[160],"than":[161],"ETF":[163],"itself":[164]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}