{"id":"https://openalex.org/W2042521777","doi":"https://doi.org/10.1109/isscc.2015.7063056","title":"17.7 A digital DLL with hybrid DCC using 2-step duty error extraction and 180° phase aligner for 2.67Gb/S/pin 16Gb 4-H stack DDR4 SDRAM with TSVs","display_name":"17.7 A digital DLL with hybrid DCC using 2-step duty error extraction and 180° phase aligner for 2.67Gb/S/pin 16Gb 4-H stack DDR4 SDRAM with TSVs","publication_year":2015,"publication_date":"2015-02-01","ids":{"openalex":"https://openalex.org/W2042521777","doi":"https://doi.org/10.1109/isscc.2015.7063056","mag":"2042521777"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2015.7063056","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063056","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100993148","display_name":"Won-Joo Yun","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Won-Joo Yun","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057752465","display_name":"Indal Song","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Indal Song","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063045257","display_name":"Hanki Jeoung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hanki Jeoung","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019349644","display_name":"Hundae Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hundae Choi","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seok-Ho Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seok-Ho Lee","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069007326","display_name":"Jun-Bae Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun-Bae Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089492937","display_name":"Chi-Wook Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chi-Wook Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038856252","display_name":"Jung-Hwan Choi","orcid":"https://orcid.org/0000-0002-3611-4734"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Hwan Choi","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111921292","display_name":"Seong-Jin Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Jin Jang","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110755494","display_name":"Joo Sun Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joo Sun Choi","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5100993148"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.8029,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.76541198,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6331905722618103},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.5200388431549072},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49327629804611206},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.4362800419330597},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3336571455001831},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2387850284576416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2271825671195984},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19973433017730713}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6331905722618103},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.5200388431549072},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49327629804611206},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.4362800419330597},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3336571455001831},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2387850284576416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2271825671195984},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19973433017730713}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2015.7063056","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063056","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1990497714","https://openalex.org/W2052293768","https://openalex.org/W2092075230","https://openalex.org/W2136075142","https://openalex.org/W2160173333","https://openalex.org/W2161511118","https://openalex.org/W6673541384","https://openalex.org/W6679947235"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2357924899","https://openalex.org/W4200598596","https://openalex.org/W4292070332"],"abstract_inverted_index":{"As":[0],"the":[1,18,168,212],"demand":[2],"for":[3,141,150,172,255],"high-frequency":[4,107],"DDR":[5,174],"SDRAM":[6],"increases,":[7],"duty-cycle":[8],"correction":[9,151],"circuits":[10],"(DCC)":[11],"become":[12],"a":[13,26,52,62,154,199,251],"key":[14],"element":[15],"to":[16,58,65,100,110,167],"widen":[17],"data-valid":[19],"window":[20],"(tDV).":[21],"For":[22,69,207],"duty":[23,59,157,209],"detection":[24,142,169],"in":[25,80,182,204],"DCC,":[27],"analog":[28],"schemes":[29,36],"using":[30,37],"charge":[31],"pumps":[32],"[1]":[33],"and":[34,121,126,135,143,158,163,197,214,227,237,250],"digital":[35],"DLL":[38,93,247],"locking":[39,94,128,188,194,216],"[2]":[40],"or":[41,61,74,95,123],"time-to-digital":[42],"converters":[43],"(TDC)":[44],"[3]":[45],"are":[46,90,165],"widely":[47],"used.":[48],"However,":[49,171],"they":[50],"require":[51],"certain":[53],"amount":[54],"of":[55],"time":[56],"proportional":[57],"errors":[60,260],"high-resolution":[63],"TDC":[64,96,236],"resolve":[66,191],"quantization":[67,259],"errors.":[68],"correction,":[70],"an":[71,232,238],"edge":[72,84,240],"combiner":[73,85,241],"slew-rate-changing":[75,115,252],"inverter":[76,116],"is":[77,202],"commonly":[78],"used":[79,149],"DRAM":[81],"applications.":[82],"An":[83],"utilizes":[86],"180\u00b0-phase-shifted":[87],"clocks,":[88],"which":[89],"obtained":[91],"by":[92,262],"code":[97],"calculation":[98],"[4-5],":[99],"generate":[101],"both":[102,132],"edges,":[103],"but":[104],"it":[105],"has":[106,117],"limitations":[108],"due":[109],"gate-delay-based":[111],"short-pulse":[112],"generation.":[113],"The":[114],"trade-offs":[118],"between":[119,124,161],"range":[120,134,177],"resolutions":[122,125],"DCC":[127,201,215,234,244,253],"time.":[129,189],"To":[130,190],"achieve":[131],"wide":[133],"fast":[136,243],"locking,":[137,249],"asynchronous":[138],"binary":[139],"search":[140],"receiver":[144],"tail-current":[145],"tuning":[146],"can":[147],"be":[148,179,219],"[6].":[152],"In":[153,229],"WCK-based":[155],"system,":[156],"phase":[159,213],"skew":[160],"iclk":[162],"qclk":[164],"related":[166],"range.":[170],"normal":[173],"DRAM,":[175],"this":[176,205,230],"should":[178,218],"doubled":[180],"resulting":[181],"more":[183],"area":[184],"as":[185,187],"well":[186],"problems":[192],"with":[193,235],"time,":[195],"coverage,":[196],"resolution,":[198],"hybrid":[200],"presented":[203],"paper.":[206],"precise":[208],"error":[210],"detection,":[211],"processes":[217],"separated,":[220],"because":[221],"delay":[222],"updating":[223],"disturbs":[224],"duty-error":[225],"detecting":[226],"averaging.":[228],"paper,":[231],"all-digital":[233,263],"enhanced":[239],"performs":[242],"operation":[245],"before":[246],"coarse":[248],"optimized":[254],"fine":[256],"resolution":[257],"compensates":[258],"caused":[261],"operation.":[264]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}