{"id":"https://openalex.org/W2008181086","doi":"https://doi.org/10.1109/isscc.2015.7063024","title":"14.4 A 5GHz −95dBc-reference-Spur 9.5mW digital fractional-N PLL using reference-multiplied time-to-digital converter and reference-spur cancellation in 65nm CMOS","display_name":"14.4 A 5GHz −95dBc-reference-Spur 9.5mW digital fractional-N PLL using reference-multiplied time-to-digital converter and reference-spur cancellation in 65nm CMOS","publication_year":2015,"publication_date":"2015-02-01","ids":{"openalex":"https://openalex.org/W2008181086","doi":"https://doi.org/10.1109/isscc.2015.7063024","mag":"2008181086"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2015.7063024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027218758","display_name":"Hyojun Kim","orcid":"https://orcid.org/0009-0008-5539-1017"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyojun Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063066618","display_name":"Jinwoo Sang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinwoo Sang","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103210975","display_name":"Hyunik Kim","orcid":"https://orcid.org/0000-0001-5065-8351"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunik Kim","raw_affiliation_strings":["KAIST, Daejeon, Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102920851","display_name":"Young\u2010Woo Jo","orcid":"https://orcid.org/0000-0002-3427-7257"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngwoo Jo","raw_affiliation_strings":["KAIST, Daejeon, Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058392128","display_name":"Tae-Ik Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeik Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101850552","display_name":"Hojin Park","orcid":"https://orcid.org/0000-0001-5581-6427"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hojin Park","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea",", Samsung Electronics, Hwaseong, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":", Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111638756","display_name":"Seong Hwan Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong Hwan Cho","raw_affiliation_strings":["KAIST, Daejeon, Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7782108187675476},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.7290349006652832},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6273233294487},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.6109101176261902},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.5881311893463135},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5109328627586365},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.48405665159225464},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4262947738170624},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4223184883594513},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.343014121055603},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2924419641494751}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7782108187675476},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.7290349006652832},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6273233294487},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.6109101176261902},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.5881311893463135},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5109328627586365},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.48405665159225464},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4262947738170624},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4223184883594513},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.343014121055603},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2924419641494751},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2015.7063024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7063024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2018588972","https://openalex.org/W2029794151","https://openalex.org/W2107514446","https://openalex.org/W2109963032","https://openalex.org/W2143702700","https://openalex.org/W2171297533","https://openalex.org/W2297991850"],"related_works":["https://openalex.org/W2421111280","https://openalex.org/W2601368767","https://openalex.org/W2170102475","https://openalex.org/W2108164987","https://openalex.org/W2154694501","https://openalex.org/W2129293548","https://openalex.org/W2087919622","https://openalex.org/W1580014081","https://openalex.org/W2168458874","https://openalex.org/W2116992382"],"abstract_inverted_index":{"Since":[0],"the":[1,19,47,75,91,97,101,109,117,121,129,147,182],"advent":[2],"of":[3,67,100,116,158],"digital":[4,82,139],"PLLs":[5],"(DPLLs),":[6],"various":[7,20],"techniques":[8],"have":[9],"been":[10],"proposed":[11],"fora":[12],"low-power,":[13],"low-noise":[14],"fractional-N":[15,140],"frequency":[16],"synthesizer.":[17],"Among":[18],"innovations,":[21],"a":[22,52,81,85,137,153,165],"reference-multiplied":[23,118,138],"architecture":[24],"offers":[25],"distinct":[26],"advantages":[27],"compared":[28],"to":[29,61,128],"conventional":[30],"DPLLs":[31],"[1].":[32],"First,":[33],"low":[34],"quantization":[35],"noise":[36,65,111],"(q-noise)":[37],"can":[38,103],"be":[39,104],"achieved":[40],"without":[41],"complex":[42],"q-noise":[43,58],"cancellation":[44],"schemes,":[45],"since":[46],"delta-sigma":[48],"modulator":[49],"(DSM)":[50],"has":[51,143],"high":[53],"oversampling":[54],"ratio":[55],"and":[56,125,164,194],"its":[57],"is":[59,78,93,120,170,185],"pushed":[60],"higher":[62],"frequencies.":[63],"Second,":[64],"requirements":[66],"PLL":[68,83,119,141],"building":[69],"blocks":[70],"become":[71],"less":[72],"stringent":[73],"as":[74],"division":[76],"value":[77],"reduced.":[79],"For":[80],"using":[84],"Nyquist-rate":[86],"time-to-digital":[87],"converter":[88],"(TDC),":[89],"if":[90],"reference":[92],"multiplied":[94],"by":[95,106,187],"N":[96],"time":[98],"resolution":[99],"TDC":[102,155,169,193],"reduced":[105],"\u221aN":[107],"for":[108],"same":[110],"level.":[112],"Unfortunately,":[113],"one":[114],"drawback":[115],"increase":[122],"in":[123,146],"power":[124],"complexity":[126],"due":[127],"reference-multiplying":[130,148],"circuit.":[131,149],"In":[132],"this":[133],"paper,":[134],"we":[135],"propose":[136],"that":[142],"negligible":[144],"overhead":[145],"To":[150],"save":[151],"power,":[152],"frequency-multiplied":[154],"(FMTDC)":[156],"consisting":[157],"an":[159,188],"open-loop":[160,183],"multiplying":[161],"DLL":[162],"(MDLL)":[163],"Vernier":[166],"delay-line":[167],"(VDL)":[168],"proposed,":[171],"which":[172],"share":[173],"their":[174],"delay":[175],"lines.":[176],"High":[177],"spurious":[178],"tone":[179],"coming":[180],"from":[181],"MDLL":[184],"canceled":[186],"adaptive":[189],"filter":[190],"located":[191],"between":[192],"loop":[195],"filter.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}