{"id":"https://openalex.org/W1977463470","doi":"https://doi.org/10.1109/isscc.2015.7062961","title":"7.3 A 28nm embedded SG-MONOS flash macro for automotive achieving 200MHz read operation and 2.0MB/S write throughput at T<inf>i</inf>, of 170°C","display_name":"7.3 A 28nm embedded SG-MONOS flash macro for automotive achieving 200MHz read operation and 2.0MB/S write throughput at T<inf>i</inf>, of 170°C","publication_year":2015,"publication_date":"2015-02-01","ids":{"openalex":"https://openalex.org/W1977463470","doi":"https://doi.org/10.1109/isscc.2015.7062961","mag":"1977463470"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2015.7062961","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7062961","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079433991","display_name":"Yasuhiko Taito","orcid":"https://orcid.org/0000-0001-6676-4853"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuhiko Taito","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075712824","display_name":"Masaya Nakano","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaya Nakano","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069225188","display_name":"Hiromi Okimoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiromi Okimoto","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033870884","display_name":"Daisuke Okada","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]},{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daisuke Okada","raw_affiliation_strings":["Renesas Electronics, Hitachinaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Hitachinaka, Japan","institution_ids":["https://openalex.org/I4210153176","https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051780556","display_name":"Takashi Ito","orcid":"https://orcid.org/0000-0001-7443-3157"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Ito","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103754118","display_name":"Takashi Kono","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Kono","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108416332","display_name":"Kenji Noguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenji Noguchi","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046126929","display_name":"Hideto Hidaka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideto Hidaka","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112249959","display_name":"T Yamauchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadaaki Yamauchi","raw_affiliation_strings":["Renesas Electronics, Japan","Renesas Electronics, Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electronics, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.0587,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.98962576,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5701349973678589},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5396812558174133},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5366204977035522},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5352087616920471},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5186114311218262},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.5055458545684814},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.494792640209198},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.46929579973220825},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4514332413673401},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.43800729513168335},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4308721721172333},{"id":"https://openalex.org/keywords/metal-gate","display_name":"Metal gate","score":0.4206061065196991},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3565477430820465},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29002952575683594},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1640608012676239},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.15457439422607422},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13488304615020752},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09375926852226257}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5701349973678589},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5396812558174133},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5366204977035522},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5352087616920471},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5186114311218262},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.5055458545684814},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.494792640209198},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.46929579973220825},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4514332413673401},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.43800729513168335},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4308721721172333},{"id":"https://openalex.org/C51140833","wikidata":"https://www.wikidata.org/wiki/Q6822740","display_name":"Metal gate","level":5,"score":0.4206061065196991},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3565477430820465},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29002952575683594},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1640608012676239},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.15457439422607422},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13488304615020752},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09375926852226257},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2015.7062961","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2015.7062961","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1999506977","https://openalex.org/W2029194273","https://openalex.org/W2535372975","https://openalex.org/W2986819486"],"related_works":["https://openalex.org/W2116397085","https://openalex.org/W2376668782","https://openalex.org/W2535372975","https://openalex.org/W2537636062","https://openalex.org/W2017101954","https://openalex.org/W2537420636","https://openalex.org/W1594494193","https://openalex.org/W2086578073","https://openalex.org/W2378293894","https://openalex.org/W2036350002"],"abstract_inverted_index":{"Accelerated":[0],"advances":[1],"in":[2,50,106,130],"automotive":[3,141],"technology,":[4],"such":[5],"as":[6],"sophisticated":[7],"real-time":[8],"engine":[9],"controls":[10],"for":[11,39,57,140,239],"higher":[12],"fuel":[13],"efficiency":[14],"and":[15,46,60,100,109,169,193],"advanced":[16,131],"driver-assistance":[17],"systems":[18,87],"(ADAS),":[19],"are":[20,53,113],"expanding":[21],"the":[22,73,83],"application":[23],"range":[24],"of":[25,70,85,176,209,222],"Flash":[26,31],"MCUs,":[27],"microcontrollers":[28],"with":[29,77,142,156,216,233],"embedded":[30],"memory":[32,48,94,191],"(eFlash).":[33],"In":[34],"addition":[35],"to":[36,163,186],"consistent":[37],"demands":[38],"faster":[40],"random":[41,167],"access,":[42],"shorter":[43],"rewrite":[44],"time":[45],"larger":[47],"capacity":[49],"eFlash,":[51],"there":[52],"increasingly":[54],"intense":[55],"requirements":[56],"robust":[58],"operations":[59],"high":[61,66,206,246],"data":[62],"reliability":[63,84],"under":[64],"extremely":[65],"junction":[67],"temperature":[68],"(Ti,)":[69],"170\u00b0C.":[71],"On":[72],"other":[74],"hand,":[75],"along":[76],"device":[78],"scaling":[79],"beyond":[80],"40nm":[81],"generation,":[82],"eFlash":[86,93,132,138],"is":[88,122,149],"constrained":[89],"by":[90,196,211,231],"not":[91],"only":[92],"cells":[95,192],"but":[96],"also":[97],"peripheral":[98,194],"transistors":[99],"metal":[101,111],"interconnections.":[102],"As":[103],"oxide":[104],"films":[105],"transistor":[107],"devices":[108,195],"between":[110],"interconnections":[112],"getting":[114],"thinner,":[115],"their":[116],"time-dependent":[117],"dielectric":[118],"breakdown":[119],"(TDDB)":[120],"lifetime":[121,175],"critically":[123],"degraded,":[124],"which":[125],"poses":[126],"a":[127,150,182,234,245],"great":[128],"challenge":[129],"design.":[133],"This":[134],"paper":[135],"presents":[136],"28nm":[137,151],"macros":[139],"four":[143],"key":[144],"features.":[145],"The":[146],"first":[147],"feature":[148],"split-gate":[152],"(SG)-MONOS":[153],"cell":[154],"array":[155],"temperature-adjusted":[157],"overdrive":[158],"wordline":[159],"(WL)":[160],"voltage":[161],"control":[162,184,201],"realize":[164],"both":[165],"200MHz":[166],"access":[168],"more":[170],"than":[171],"10\u00d7":[172],"longer":[173],"TDDB":[174],"WL":[177],"drivers.":[178],"Second,":[179],"we":[180,204,227],"implement":[181],"high-voltage":[183],"technique":[185,238],"relax":[187],"electrical":[188],"stress":[189],"on":[190],"temperature-adaptive":[197],"step":[198],"pulse":[199,224],"erase":[200],"(TASPEC).":[202],"Third,":[203],"achieve":[205],"write":[207,247],"throughput":[208],"2.0MB/s":[210],"source-side":[212],"injection":[213],"(SSI)":[214],"programming":[215],"negative":[217],"back-bias":[218],"achieving":[219,244],"63%":[220],"reduction":[221],"program":[223,241],"time.":[225],"Finally,":[226],"reduce":[228],"RF":[229],"noise":[230],"19dB":[232],"spread-spectrum":[235],"phase-shifted":[236],"clock-generation":[237],"over-the-air":[240],"updates":[242],"while":[243],"throughput.":[248]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":12},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}