{"id":"https://openalex.org/W2051108935","doi":"https://doi.org/10.1109/isscc.2014.6757392","title":"10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications","display_name":"10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications","publication_year":2014,"publication_date":"2014-02-01","ids":{"openalex":"https://openalex.org/W2051108935","doi":"https://doi.org/10.1109/isscc.2014.6757392","mag":"2051108935"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2014.6757392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2014.6757392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046800775","display_name":"Noboru Sakimura","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noboru Sakimura","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005055352","display_name":"Y. Tsuji","orcid":"https://orcid.org/0000-0003-4814-2887"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukihide Tsuji","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075000622","display_name":"Ryusuke Nebashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryusuke Nebashi","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035295738","display_name":"H. Honjo","orcid":"https://orcid.org/0000-0002-5742-108X"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Honjo","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108467315","display_name":"A. Morioka","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ayuka Morioka","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055084076","display_name":"Kunihiko Ishihara","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiko Ishihara","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Keizo Kinoshita","orcid":null},"institutions":[{"id":"https://openalex.org/I103605164","display_name":"Tohoku Institute of Technology","ror":"https://ror.org/01phqre83","country_code":"JP","type":"education","lineage":["https://openalex.org/I103605164"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keizo Kinoshita","raw_affiliation_strings":["Tohoku Daigaku, Sendai, Miyagi, JP","Tohoku University Sendai, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku Daigaku, Sendai, Miyagi, JP","institution_ids":["https://openalex.org/I103605164"]},{"raw_affiliation_string":"Tohoku University Sendai, Japan#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069574310","display_name":"Shunsuke Fukami","orcid":"https://orcid.org/0000-0001-5750-2990"},"institutions":[{"id":"https://openalex.org/I103605164","display_name":"Tohoku Institute of Technology","ror":"https://ror.org/01phqre83","country_code":"JP","type":"education","lineage":["https://openalex.org/I103605164"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunsuke Fukami","raw_affiliation_strings":["Tohoku Daigaku, Sendai, Miyagi, JP","Tohoku University Sendai, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku Daigaku, Sendai, Miyagi, JP","institution_ids":["https://openalex.org/I103605164"]},{"raw_affiliation_string":"Tohoku University Sendai, Japan#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046409450","display_name":"S. Miura","orcid":"https://orcid.org/0000-0001-5603-3205"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sadahiko Miura","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113667570","display_name":"N. Kasai","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoki Kasai","raw_affiliation_strings":["Tohoku University, Sendai, Japan","Tohoku University Sendai, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku University Sendai, Japan#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083722186","display_name":"Tetsuo Endoh","orcid":"https://orcid.org/0000-0002-5583-3283"},"institutions":[{"id":"https://openalex.org/I103605164","display_name":"Tohoku Institute of Technology","ror":"https://ror.org/01phqre83","country_code":"JP","type":"education","lineage":["https://openalex.org/I103605164"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuo Endoh","raw_affiliation_strings":["Tohoku Daigaku, Sendai, Miyagi, JP","Tohoku University Sendai, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku Daigaku, Sendai, Miyagi, JP","institution_ids":["https://openalex.org/I103605164"]},{"raw_affiliation_string":"Tohoku University Sendai, Japan#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081983682","display_name":"Hideo Ohno","orcid":"https://orcid.org/0000-0001-9688-8259"},"institutions":[{"id":"https://openalex.org/I103605164","display_name":"Tohoku Institute of Technology","ror":"https://ror.org/01phqre83","country_code":"JP","type":"education","lineage":["https://openalex.org/I103605164"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideo Ohno","raw_affiliation_strings":["Tohoku Daigaku, Sendai, Miyagi, JP","Tohoku University Sendai, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku Daigaku, Sendai, Miyagi, JP","institution_ids":["https://openalex.org/I103605164"]},{"raw_affiliation_string":"Tohoku University Sendai, Japan#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062434040","display_name":"Takahiro Hanyu","orcid":"https://orcid.org/0000-0002-4397-8290"},"institutions":[{"id":"https://openalex.org/I103605164","display_name":"Tohoku Institute of Technology","ror":"https://ror.org/01phqre83","country_code":"JP","type":"education","lineage":["https://openalex.org/I103605164"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Hanyu","raw_affiliation_strings":["Tohoku Daigaku, Sendai, Miyagi, JP","Tohoku University Sendai, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tohoku Daigaku, Sendai, Miyagi, JP","institution_ids":["https://openalex.org/I103605164"]},{"raw_affiliation_string":"Tohoku University Sendai, Japan#TAB#","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111921651","display_name":"Tadahiko Sugibayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadahiko Sugibayashi","raw_affiliation_strings":["NEC, Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":12.1374,"has_fulltext":false,"cited_by_count":105,"citation_normalized_percentile":{"value":0.98949776,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"184","last_page":"185"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.8811084032058716},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7206966280937195},{"id":"https://openalex.org/keywords/ferroelectric-ram","display_name":"Ferroelectric RAM","score":0.6458566188812256},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6278232932090759},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6093952059745789},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5184352397918701},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5020174980163574},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4619143009185791},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39497965574264526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2685806155204773},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.17898684740066528},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09892585873603821}],"concepts":[{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.8811084032058716},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7206966280937195},{"id":"https://openalex.org/C161164327","wikidata":"https://www.wikidata.org/wiki/Q703656","display_name":"Ferroelectric RAM","level":4,"score":0.6458566188812256},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6278232932090759},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6093952059745789},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5184352397918701},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5020174980163574},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4619143009185791},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39497965574264526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2685806155204773},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.17898684740066528},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09892585873603821}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2014.6757392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2014.6757392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8500000238418579,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337392","display_name":"Division of Electrical, Communications and Cyber Systems","ror":"https://ror.org/01krpsy48"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1975649424","https://openalex.org/W1998340208","https://openalex.org/W2014744284","https://openalex.org/W2024335183","https://openalex.org/W2115598106"],"related_works":["https://openalex.org/W2140856170","https://openalex.org/W2099729013","https://openalex.org/W2079003009","https://openalex.org/W2113422672","https://openalex.org/W2004034743","https://openalex.org/W2788525133","https://openalex.org/W2171162600","https://openalex.org/W159155456","https://openalex.org/W2482369952","https://openalex.org/W2792488046"],"abstract_inverted_index":{"Recently":[0],"there":[1],"has":[2,29,79],"been":[3],"increased":[4],"demand":[5],"for":[6,21],"not":[7,67],"only":[8],"ultra-low":[9],"power,":[10],"but":[11],"also":[12,78],"high":[13,69],"performance,":[14],"even":[15],"in":[16,140],"standby-power-critical":[17],"applications.":[18],"Sensor":[19],"nodes,":[20],"example,":[22],"need":[23],"a":[24,96,118,137],"microcontroller":[25],"unit":[26],"(MCU)":[27],"that":[28],"the":[30,75,141],"ability":[31],"to":[32,70,99,170],"process":[33,77],"signals":[34],"and":[35,44,50,74,86,104,127,144,152],"compress":[36],"data":[37],"immediately.":[38],"A":[39,90],"previously":[40],"reported":[41],"130nm":[42],"CMOS":[43,111,126],"FeRAM-based":[45],"MCU":[46,122],"features":[47,164],"zero-standby":[48],"power":[49,103],"fast":[51],"wakeup":[52,150],"operation":[53,135,147],"by":[54],"incorporating":[55],"FeRAM":[56,76],"devices":[57],"into":[58],"logic":[59],"circuits":[60],"[1].":[61],"The":[62,163],"8MHz":[63],"speed,":[64],"however,":[65],"was":[66],"sufficiently":[68,166],"meet":[71],"application":[72],"requirements,":[73],"drawbacks:":[80],"low":[81],"compatibility":[82,109],"with":[83,108,110,136,148],"standard":[84,125],"CMOS,":[85],"write":[87],"endurance":[88],"limitations.":[89],"spintronics-based":[91],"nonvolatile":[92,120],"integrated":[93],"circuit":[94],"is":[95],"promising":[97],"option":[98],"achieve":[100,171],"zero":[101],"standby":[102],"high-speed":[105],"operation,":[106],"along":[107],"processes.":[112],"In":[113],"this":[114],"work,":[115],"we":[116],"demonstrate":[117],"fully":[119],"16b":[121],"using":[123],"90nm":[124],"three-terminal":[128],"SpinRAM":[129],"technology.":[130],"It":[131],"achieves":[132],"20MHz,":[133],"145\u03bcW/MHz":[134],"1V":[138],"supply":[139],"active":[142,154],"state,":[143],"4.5\u03bcW":[145],"intermittent":[146],"120ns":[149],"time":[151],"0.1%":[153],"ratio,":[155],"without":[156],"forwarding":[157],"of":[158],"re-boot":[159],"code":[160],"from":[161],"memory.":[162],"provide":[165],"long":[167],"battery":[168],"life":[169],"maintenance-free":[172],"sensor":[173],"nodes.":[174]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":24},{"year":2016,"cited_by_count":23},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}