{"id":"https://openalex.org/W2057579915","doi":"https://doi.org/10.1109/isscc.2013.6487723","title":"A 0.026mm<sup>2</sup> 5.3mW 32-to-2000MHz digital fractional-N phase locked-loop using a phase-interpolating phase-to-digital converter","display_name":"A 0.026mm<sup>2</sup> 5.3mW 32-to-2000MHz digital fractional-N phase locked-loop using a phase-interpolating phase-to-digital converter","publication_year":2013,"publication_date":"2013-02-01","ids":{"openalex":"https://openalex.org/W2057579915","doi":"https://doi.org/10.1109/isscc.2013.6487723","mag":"2057579915"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2013.6487723","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2013.6487723","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011801401","display_name":"Taekwang Jang","orcid":"https://orcid.org/0000-0002-4651-0677"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Tae-Kwang Jang","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109461638","display_name":"Nan Xing","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Xing Nan","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007626964","display_name":"F. Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"F. Liu","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027795684","display_name":"Jungeun Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungeun Shin","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102121913","display_name":"Hyungreal Ryu","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyungreal Ryu","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100462759","display_name":"Jihyun Kim","orcid":"https://orcid.org/0000-0001-8493-2881"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihyun Kim","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058392128","display_name":"Tae-Ik Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeik Kim","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103247483","display_name":"Jaejin Park","orcid":"https://orcid.org/0009-0000-1919-3306"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaejin Park","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101850552","display_name":"Hojin Park","orcid":"https://orcid.org/0000-0001-5581-6427"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hojin Park","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin, South Korea","Samsung Electron., Yongin, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5011801401"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":1.2019,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.81773212,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/retiming","display_name":"Retiming","score":0.800250768661499},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7597373723983765},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6129107475280762},{"id":"https://openalex.org/keywords/frequency-divider","display_name":"Frequency divider","score":0.5326758623123169},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5152666568756104},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5150641798973083},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.512731671333313},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5072621703147888},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4861297309398651},{"id":"https://openalex.org/keywords/phase-frequency-detector","display_name":"Phase frequency detector","score":0.4298720061779022},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.3988051414489746},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.33436572551727295},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3162640929222107},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2863551378250122},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21953710913658142},{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.12907066941261292}],"concepts":[{"id":"https://openalex.org/C41112130","wikidata":"https://www.wikidata.org/wiki/Q2146175","display_name":"Retiming","level":2,"score":0.800250768661499},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7597373723983765},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6129107475280762},{"id":"https://openalex.org/C74982907","wikidata":"https://www.wikidata.org/wiki/Q1455624","display_name":"Frequency divider","level":3,"score":0.5326758623123169},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5152666568756104},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5150641798973083},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.512731671333313},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5072621703147888},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4861297309398651},{"id":"https://openalex.org/C2776158855","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase frequency detector","level":5,"score":0.4298720061779022},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.3988051414489746},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.33436572551727295},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3162640929222107},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2863551378250122},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21953710913658142},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.12907066941261292},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2013.6487723","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2013.6487723","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6800000071525574,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1552193912","https://openalex.org/W1975693956","https://openalex.org/W2075169931","https://openalex.org/W2084208879","https://openalex.org/W2108185796","https://openalex.org/W2108458508","https://openalex.org/W2150783292"],"related_works":["https://openalex.org/W2068427108","https://openalex.org/W2896013912","https://openalex.org/W1603142061","https://openalex.org/W2296682797","https://openalex.org/W2769299326","https://openalex.org/W3007469504","https://openalex.org/W1917800633","https://openalex.org/W2085519149","https://openalex.org/W4248972354","https://openalex.org/W2131223048"],"abstract_inverted_index":{"Recent":[0],"innovations":[1],"in":[2,119,144,156,178],"semiconductor":[3],"processes":[4],"have":[5,71],"accelerated":[6],"the":[7,34,50,72,106,179,184,192,198,201,226],"transition":[8],"from":[9,40,191],"analog":[10,57,77,112],"circuits":[11,118,128],"to":[12,146,197],"their":[13],"digital":[14,17,97],"counterparts,":[15],"with":[16,76,129,151],"PLLs":[18],"(DPLLs)":[19],"being":[20],"an":[21],"example":[22],"of":[23,36,189,200,212],"this":[24,91,157],"trend":[25],"[1].":[26,154,204],"All-digital":[27],"or":[28],"fully":[29],"synthesizable":[30],"approaches,":[31,54],"which":[32,55,104,209],"exploit":[33],"merits":[35],"advanced":[37],"processes,":[38],"suffer":[39],"poor":[41],"noise":[42,240],"performance":[43],"and":[44,69,87,116,126,217,221,232],"high":[45],"power":[46,115,125,185],"consumption":[47],"[2].":[48],"On":[49],"other":[51],"hand,":[52],"hybrid":[53],"employ":[56],"components":[58],"such":[59,79],"as":[60,80,167],"digital-to-analog":[61],"converters":[62],"(DACs),":[63],"digital-to-time":[64],"converters,":[65],"phase":[66,169,220],"interpolators":[67],"(PIs)":[68],"regulators,":[70],"typical":[73],"difficulties":[74],"associated":[75],"circuits,":[78],"low":[81],"output":[82],"resistance,":[83],"small":[84],"voltage":[85],"headroom":[86],"large":[88],"variation.":[89],"In":[90,173],"paper,":[92],"we":[93],"propose":[94],"a":[95,100,134,159,168,213,218,229],"highly":[96],"architecture":[98],"for":[99,111,228],"DPLL":[101],"-":[102],"one":[103],"minimizes":[105],"design":[107],"effort":[108],"typically":[109],"required":[110],"circuits.":[113,234],"The":[114,205],"area-consuming":[117],"prior":[120],"works":[121],"are":[122],"replaced":[123],"by":[124],"area-efficient":[127],"competitive":[130],"performance.":[131],"For":[132],"example,":[133],"conventional":[135,175],"time-to-digital":[136],"converter":[137,162],"(TDC)":[138],"usually":[139],"occupies":[140],"considerable":[141],"chip":[142],"area":[143],"order":[145],"maximize":[147],"input":[148],"dynamic":[149],"range":[150],"precise":[152],"resolution":[153],"Instead,":[155],"work,":[158],"time-windowed":[160],"phase-to-digital":[161],"using":[163],"interpolated":[164],"DCO":[165],"phases":[166],"reference":[170],"is":[171,194,210,242],"adopted.":[172],"addition,":[174],"synchronous":[176,230],"counters":[177],"feedback":[180],"path":[181],"drastically":[182],"increase":[183],"consumption.":[186],"Furthermore,":[187],"retiming":[188,233],"data":[190],"TDC":[193],"unavoidable":[195],"due":[196],"meta-stability":[199],"sampling":[202],"flip-flops":[203],"proposed":[206],"divider":[207,216],"scheme,":[208],"composed":[211],"multi-modulus":[214],"frequency":[215,222],"dead-zone-free":[219],"detector":[223],"(PFD),":[224],"eliminates":[225],"need":[227],"counter":[231],"A":[235],"calibration-free":[236],"\u0394\u03a3":[237],"modulator":[238],"(DSM)":[239],"canceller":[241],"also":[243],"included.":[244]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}