{"id":"https://openalex.org/W2019978720","doi":"https://doi.org/10.1109/isscc.2013.6487601","title":"F2: VLSI power-management techniques: Principles and applications","display_name":"F2: VLSI power-management techniques: Principles and applications","publication_year":2013,"publication_date":"2013-02-01","ids":{"openalex":"https://openalex.org/W2019978720","doi":"https://doi.org/10.1109/isscc.2013.6487601","mag":"2019978720"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2013.6487601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2013.6487601","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109942953","display_name":"Leland Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Leland Chang","raw_affiliation_strings":["IBM, NY","IBM, Yorktown Heights, NY USA"],"affiliations":[{"raw_affiliation_string":"IBM, NY","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Yorktown Heights, NY USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047150107","display_name":"Shannon Morton","orcid":null},"institutions":[{"id":"https://openalex.org/I1304085615","display_name":"Nvidia (United Kingdom)","ror":"https://ror.org/02kr42612","country_code":"GB","type":"company","lineage":["https://openalex.org/I1304085615","https://openalex.org/I4210127875"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Shannon Morton","raw_affiliation_strings":["NVIDIA, Bristol, United Kingdom","NVIDIA, Bristol, UK"],"affiliations":[{"raw_affiliation_string":"NVIDIA, Bristol, United Kingdom","institution_ids":["https://openalex.org/I1304085615"]},{"raw_affiliation_string":"NVIDIA, Bristol, UK","institution_ids":["https://openalex.org/I1304085615"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103565965","display_name":"Ken Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ken Chang","raw_affiliation_strings":["Xilinx, San Jose, CA","Xilinx, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx, San Jose, CA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109158104","display_name":"Jin-Man Han","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088807","display_name":"Samsung Pharm (South Korea)","ror":"https://ror.org/003eds368","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210088807"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin-Man Han","raw_affiliation_strings":["Samsung, Hwasung, Korea","Samsung, Hwasung, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung, Hwasung, Korea","institution_ids":["https://openalex.org/I4210088807"]},{"raw_affiliation_string":"Samsung, Hwasung, South Korea","institution_ids":["https://openalex.org/I4210088807"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012770413","display_name":"P. Malcovati","orcid":"https://orcid.org/0000-0001-6514-9672"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Piero Malcovati","raw_affiliation_strings":["Universita degli Studi di Pavia, Pavia, Lombardia, IT","University of Pavia, Pavia / Italy"],"affiliations":[{"raw_affiliation_string":"Universita degli Studi di Pavia, Pavia, Lombardia, IT","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"University of Pavia, Pavia / Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025438151","display_name":"Vladimir Stojanovi\u0107","orcid":"https://orcid.org/0000-0001-7233-6863"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]},{"id":"https://openalex.org/I4210088807","display_name":"Samsung Pharm (South Korea)","ror":"https://ror.org/003eds368","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210088807"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Vladimir Stojanovic","raw_affiliation_strings":["Samsung, Hwasung, Korea","MIT, Cambridge MA, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung, Hwasung, Korea","institution_ids":["https://openalex.org/I4210088807"]},{"raw_affiliation_string":"MIT, Cambridge MA, USA#TAB#","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5109942953"],"corresponding_institution_ids":["https://openalex.org/I1341412227"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08617032,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"502","last_page":"503"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9846000075340271,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-management","display_name":"Power management","score":0.7664133310317993},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5876704454421997},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5676173567771912},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.528522253036499},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5102105140686035},{"id":"https://openalex.org/keywords/power-electronics","display_name":"Power electronics","score":0.5046690702438354},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.49684885144233704},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.48619598150253296},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.4827089309692383},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4391515851020813},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4331341087818146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.431529700756073},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41828033328056335},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.416031152009964},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.412382036447525},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.41075190901756287},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3435359001159668},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.31375232338905334},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3100038766860962},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1852911114692688},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1471801996231079}],"concepts":[{"id":"https://openalex.org/C2778774385","wikidata":"https://www.wikidata.org/wiki/Q4437810","display_name":"Power management","level":3,"score":0.7664133310317993},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5876704454421997},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5676173567771912},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.528522253036499},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5102105140686035},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.5046690702438354},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.49684885144233704},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.48619598150253296},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.4827089309692383},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4391515851020813},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4331341087818146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.431529700756073},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41828033328056335},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.416031152009964},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.412382036447525},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.41075190901756287},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3435359001159668},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.31375232338905334},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3100038766860962},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1852911114692688},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1471801996231079},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2013.6487601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2013.6487601","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2443567922","https://openalex.org/W1967088250","https://openalex.org/W2144034023","https://openalex.org/W3185548375","https://openalex.org/W2070385207","https://openalex.org/W1585873818","https://openalex.org/W2060523593","https://openalex.org/W1966123461","https://openalex.org/W2004319832","https://openalex.org/W79358250"],"abstract_inverted_index":{"Across":[0],"the":[1,11,42,45,59,87],"spectrum":[2],"of":[3,13,26,35,47,114],"microelectronics":[4],"applications,":[5,37],"power":[6],"management":[7],"is":[8],"critical":[9],"to":[10,110],"enabling":[12],"power-efficient":[14],"products.":[15],"This":[16],"Forum":[17,56],"will":[18,57,105],"provide":[19],"practicing":[20],"circuit":[21],"designers":[22],"with":[23],"a":[24,32],"summary":[25],"power-management":[27,115],"techniques,":[28],"including":[29,65,96],"perspectives":[30],"from":[31],"wide":[33],"range":[34],"product":[36],"and":[38,67,83,101,103,117],"an":[39],"outlook":[40],"for":[41,72,79],"future":[43,120],"in":[44,54,62],"context":[46],"coming":[48],"challenges.":[49],"The":[50],"first":[51],"four":[52,90],"speakers":[53,91],"this":[55],"present":[58],"general":[60],"principles":[61],"development":[63],"today,":[64],"power-gating":[66],"state-retention":[68],"modes,":[69],"PLL/DLL":[70],"techniques":[71,116],"dynamic":[73,80],"frequency":[74],"scaling,":[75,82],"integrated":[76],"voltage":[77,81],"regulators":[78],"low-power":[84],"signaling.":[85],"In":[86],"second":[88],"half,":[89],"representing":[92],"different":[93],"industry":[94],"perspectives,":[95],"microprocessors,":[97],"consumer":[98],"electronics,":[99],"microcontrollers":[100],"mobile,":[102],"DRAM,":[104],"utilize":[106],"practical":[107],"case":[108],"studies":[109],"detail":[111],"current":[112],"usage":[113],"speculate":[118],"on":[119],"trends.":[121]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}