{"id":"https://openalex.org/W2074781228","doi":"https://doi.org/10.1109/isscc.2012.6176941","title":"A sampling-based 128×128 direct photon-counting X-ray image sensor with 3 energy bins and spatial resolution of 60μm/pixel","display_name":"A sampling-based 128×128 direct photon-counting X-ray image sensor with 3 energy bins and spatial resolution of 60μm/pixel","publication_year":2012,"publication_date":"2012-02-01","ids":{"openalex":"https://openalex.org/W2074781228","doi":"https://doi.org/10.1109/isscc.2012.6176941","mag":"2074781228"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2012.6176941","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2012.6176941","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101602883","display_name":"Hyun\u2010Sik Kim","orcid":"https://orcid.org/0000-0002-4564-7938"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Sik Kim","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038258742","display_name":"Sang-Wook Han","orcid":"https://orcid.org/0000-0002-4098-3326"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-Wook Han","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110197518","display_name":"Jun\u2010Hyeok Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun-Hyeok Yang","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032895767","display_name":"Sunil Kim","orcid":"https://orcid.org/0000-0002-8889-9844"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sunil Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100338309","display_name":"Young Kim","orcid":"https://orcid.org/0000-0002-8428-7701"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100656156","display_name":"Sangwook Kim","orcid":"https://orcid.org/0000-0003-2134-1640"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangwook Kim","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059735783","display_name":"Daekun Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dae-Kun Yoon","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019276953","display_name":"Junsu Lee","orcid":"https://orcid.org/0000-0002-3305-8503"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun-Su Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067120338","display_name":"Jae-Chul Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Chul Park","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111549044","display_name":"Younghun Sung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Younghun Sung","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002596948","display_name":"SeongDeok Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Deok Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yongin, South Korea","Samsung Advanced Institute of Technology, Yongin, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054097644","display_name":"Seung\u2010Tak Ryu","orcid":"https://orcid.org/0000-0002-6947-7785"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Tak Ryu","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060752633","display_name":"Gyu\u2010Hyeong Cho","orcid":"https://orcid.org/0000-0003-3875-7538"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyu-Hyeong Cho","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST , Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST , Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2747,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.89172782,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"110","last_page":"112"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photon-counting","display_name":"Photon counting","score":0.7687612771987915},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.6223510503768921},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6139605641365051},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5183323621749878},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4909713566303253},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.48067793250083923},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.47241297364234924},{"id":"https://openalex.org/keywords/photon","display_name":"Photon","score":0.4588488042354584},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.428706556558609},{"id":"https://openalex.org/keywords/photon-energy","display_name":"Photon energy","score":0.4279063045978546},{"id":"https://openalex.org/keywords/sub-pixel-resolution","display_name":"Sub-pixel resolution","score":0.42420464754104614},{"id":"https://openalex.org/keywords/medical-imaging","display_name":"Medical imaging","score":0.41691023111343384},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.382731556892395},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3414980173110962},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.332526296377182},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.32824674248695374},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3195818066596985},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.302959144115448},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.29199206829071045},{"id":"https://openalex.org/keywords/digital-image-processing","display_name":"Digital image processing","score":0.17614451050758362}],"concepts":[{"id":"https://openalex.org/C2781402376","wikidata":"https://www.wikidata.org/wiki/Q17126172","display_name":"Photon counting","level":3,"score":0.7687612771987915},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.6223510503768921},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6139605641365051},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5183323621749878},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4909713566303253},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.48067793250083923},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.47241297364234924},{"id":"https://openalex.org/C159317903","wikidata":"https://www.wikidata.org/wiki/Q3198","display_name":"Photon","level":2,"score":0.4588488042354584},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.428706556558609},{"id":"https://openalex.org/C2778785133","wikidata":"https://www.wikidata.org/wiki/Q25303639","display_name":"Photon energy","level":3,"score":0.4279063045978546},{"id":"https://openalex.org/C152363868","wikidata":"https://www.wikidata.org/wiki/Q7630627","display_name":"Sub-pixel resolution","level":5,"score":0.42420464754104614},{"id":"https://openalex.org/C31601959","wikidata":"https://www.wikidata.org/wiki/Q931309","display_name":"Medical imaging","level":2,"score":0.41691023111343384},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.382731556892395},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3414980173110962},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.332526296377182},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.32824674248695374},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3195818066596985},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.302959144115448},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.29199206829071045},{"id":"https://openalex.org/C104317675","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Digital image processing","level":4,"score":0.17614451050758362},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2012.6176941","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2012.6176941","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2086997168","https://openalex.org/W2088965801","https://openalex.org/W2116767043","https://openalex.org/W2123232003","https://openalex.org/W2152658865","https://openalex.org/W2167135979"],"related_works":["https://openalex.org/W1998362441","https://openalex.org/W2048850214","https://openalex.org/W2025695699","https://openalex.org/W4230754424","https://openalex.org/W2059277266","https://openalex.org/W3094013200","https://openalex.org/W2359666499","https://openalex.org/W2074781228","https://openalex.org/W2116644198","https://openalex.org/W1973678082"],"abstract_inverted_index":{"The":[0,14],"photon-counting":[1,16],"method":[2,17],"is":[3,35],"one":[4],"of":[5],"several":[6],"useful":[7],"image-detection":[8],"methods":[9],"for":[10,38,42],"digital":[11],"X-ray":[12],"imaging.":[13],"direct-type":[15,33],"has":[18],"higher":[19],"X-ray-to-charge":[20],"conversion":[21],"efficiency":[22,46],"and":[23,47],"position":[24],"resolution":[25],"compared":[26],"with":[27],"the":[28,44,48],"indirect-type":[29],"detection":[30,34],"method.":[31],"Therefore,":[32],"more":[36],"suitable":[37],"medical":[39],"imaging":[40],"applications":[41],"which":[43],"dose":[45],"image":[49],"quality":[50],"are":[51],"especially":[52],"important.":[53]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}