{"id":"https://openalex.org/W2053943475","doi":"https://doi.org/10.1109/isscc.2011.5746379","title":"A 17.7Mpixel 120fps CMOS image sensor with 34.8Gb/s readout","display_name":"A 17.7Mpixel 120fps CMOS image sensor with 34.8Gb/s readout","publication_year":2011,"publication_date":"2011-02-01","ids":{"openalex":"https://openalex.org/W2053943475","doi":"https://doi.org/10.1109/isscc.2011.5746379","mag":"2053943475"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2011.5746379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2011.5746379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029009055","display_name":"Takayuki Toyama","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Takayuki Toyama","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028215186","display_name":"Koji Mishina","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Koji Mishina","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103060981","display_name":"Hiroyuki Tsuchiya","orcid":"https://orcid.org/0000-0002-2144-8272"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroyuki Tsuchiya","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034086295","display_name":"Tatsuya Ichikawa","orcid":"https://orcid.org/0009-0007-4870-8007"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tatsuya Ichikawa","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056638956","display_name":"Hiroyuki Iwaki","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroyuki Iwaki","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049071036","display_name":"Yuji Gendai","orcid":"https://orcid.org/0000-0003-0169-5492"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuji Gendai","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019775230","display_name":"Hirotaka Murakami","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hirotaka Murakami","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113823390","display_name":"Kenichi Takamiya","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122684","display_name":"Sony Computer Science Laboratories","ror":"https://ror.org/02nc46417","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210122684"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Takamiya","raw_affiliation_strings":["Sony LSI Design, Inc., Kanagawa, Japan","Sony LSI Design, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony LSI Design, Inc., Kanagawa, Japan","institution_ids":["https://openalex.org/I4210122684"]},{"raw_affiliation_string":"Sony LSI Design, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210122684"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050597382","display_name":"Hiroshi Shiroshita","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hiroshi Shiroshita","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109166401","display_name":"Yoshinori Muramatsu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yoshinori Muramatsu","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047946185","display_name":"Toshihiro Furusawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Toshihiro Furusawa","raw_affiliation_strings":["Sony, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Sony, Kanagawa, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5029009055"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":8.2139,"has_fulltext":false,"cited_by_count":120,"citation_normalized_percentile":{"value":0.97837211,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"420","last_page":"422"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.701153039932251},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6491794586181641},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.6468931436538696},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.633766233921051},{"id":"https://openalex.org/keywords/high-resolution","display_name":"High resolution","score":0.5426067113876343},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5240081548690796},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5184037685394287},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.5075963735580444},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.506423830986023},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5042339563369751},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.4804248809814453},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.4646987318992615},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4601685404777527},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.43870535492897034},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4298642873764038},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4215543866157532},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4214901924133301},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3232288360595703},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24623391032218933},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14624232053756714},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1237027645111084},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.12162074446678162}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.701153039932251},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6491794586181641},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.6468931436538696},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.633766233921051},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.5426067113876343},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5240081548690796},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5184037685394287},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.5075963735580444},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.506423830986023},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5042339563369751},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.4804248809814453},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.4646987318992615},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4601685404777527},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43870535492897034},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4298642873764038},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4215543866157532},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4214901924133301},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3232288360595703},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24623391032218933},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14624232053756714},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1237027645111084},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.12162074446678162},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2011.5746379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2011.5746379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1517400802","https://openalex.org/W2025818514","https://openalex.org/W2070247293","https://openalex.org/W2104086223","https://openalex.org/W3043154785","https://openalex.org/W6656733091","https://openalex.org/W6781132224"],"related_works":["https://openalex.org/W4385733096","https://openalex.org/W2093540298","https://openalex.org/W2160828022","https://openalex.org/W1966119149","https://openalex.org/W2129163123","https://openalex.org/W2562583481","https://openalex.org/W7077903","https://openalex.org/W1966415111","https://openalex.org/W2094128133","https://openalex.org/W2136888551"],"abstract_inverted_index":{"Recently,":[0],"the":[1,70,105],"demands":[2],"to":[3,38],"achieve":[4],"both":[5],"high-speed":[6,84,93],"and":[7,61,86,108],"high-quality":[8],"imaging":[9,27,85,94],"including":[10],"high":[11,49,87,96,99],"A/D":[12],"resolution":[13,60],"have":[14,35],"increased.":[15],"The":[16],"new":[17],"target":[18],"specification":[19],"is":[20,91],"60fps":[21],"Ultra-High-Definition":[22],"with":[23,48,58,75,98],"12b":[24,59],"resolution.":[25],"This":[26,40,90],"requires":[28],"24Gb/s,":[29],"while":[30],"reported":[31],"CMOS":[32,45],"image":[33,46,50,72,88],"sensors":[34],"reached":[36],"up":[37],"6.5Gb/s.":[39],"paper":[41],"presents":[42],"a":[43,62,81],"34.8Gb/s":[44],"sensor":[47],"quality,":[51,107],"which":[52,102],"realizes":[53],"17.7M":[54],"pixels":[55],"at":[56],"120fps":[57],"dynamic":[63],"range":[64],"of":[65,69],"over":[66],"75dB":[67],"(one":[68],"highest":[71],"qualities,":[73],"compared":[74],"data":[76,111],"from).":[77],"Generally":[78],"there":[79],"exists":[80],"trade-off":[82],"between":[83],"quality.":[89],"because":[92,109],"brings":[95],"power":[97],"thermal":[100],"noise,":[101],"also":[103],"degrades":[104],"signal":[106],"fast":[110],"transfer":[112],"may":[113],"require":[114],"more":[115,119],"output":[116],"pins,":[117],"bringing":[118],"interference.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":20},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":12},{"year":2014,"cited_by_count":13},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":17}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}