{"id":"https://openalex.org/W2082355442","doi":"https://doi.org/10.1109/isscc.2010.5434027","title":"Stable RGBW AMOLED display with OLED degradation compensation using electrical feedback","display_name":"Stable RGBW AMOLED display with OLED degradation compensation using electrical feedback","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W2082355442","doi":"https://doi.org/10.1109/isscc.2010.5434027","mag":"2082355442"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2010.5434027","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5434027","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111946804","display_name":"G. Reza Chaji","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146856","display_name":"IGNIS Innovation (Canada)","ror":"https://ror.org/05gsw2536","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210146856"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"G. Reza Chaji","raw_affiliation_strings":["Iqnis Innovation, Kitchener, Canada","Ignis Innovation, Kitchener, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iqnis Innovation, Kitchener, Canada","institution_ids":[]},{"raw_affiliation_string":"Ignis Innovation, Kitchener, Canada","institution_ids":["https://openalex.org/I4210146856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010703656","display_name":"Stefan Alexander","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146856","display_name":"IGNIS Innovation (Canada)","ror":"https://ror.org/05gsw2536","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210146856"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Stefan Alexander","raw_affiliation_strings":["Iqnis Innovation, Kitchener, Canada","Ignis Innovation, Kitchener, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iqnis Innovation, Kitchener, Canada","institution_ids":[]},{"raw_affiliation_string":"Ignis Innovation, Kitchener, Canada","institution_ids":["https://openalex.org/I4210146856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023360912","display_name":"J. Marcel Dionne","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146856","display_name":"IGNIS Innovation (Canada)","ror":"https://ror.org/05gsw2536","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210146856"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"J. Marcel Dionne","raw_affiliation_strings":["Iqnis Innovation, Kitchener, Canada","Ignis Innovation, Kitchener, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iqnis Innovation, Kitchener, Canada","institution_ids":[]},{"raw_affiliation_string":"Ignis Innovation, Kitchener, Canada","institution_ids":["https://openalex.org/I4210146856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020919742","display_name":"Yaser Azizi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146856","display_name":"IGNIS Innovation (Canada)","ror":"https://ror.org/05gsw2536","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210146856"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yaser Azizi","raw_affiliation_strings":["Iqnis Innovation, Kitchener, Canada","Ignis Innovation, Kitchener, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iqnis Innovation, Kitchener, Canada","institution_ids":[]},{"raw_affiliation_string":"Ignis Innovation, Kitchener, Canada","institution_ids":["https://openalex.org/I4210146856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066505024","display_name":"Corbin Church","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146856","display_name":"IGNIS Innovation (Canada)","ror":"https://ror.org/05gsw2536","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210146856"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Corbin Church","raw_affiliation_strings":["Iqnis Innovation, Kitchener, Canada","Ignis Innovation, Kitchener, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iqnis Innovation, Kitchener, Canada","institution_ids":[]},{"raw_affiliation_string":"Ignis Innovation, Kitchener, Canada","institution_ids":["https://openalex.org/I4210146856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057229041","display_name":"John W. Hamer","orcid":"https://orcid.org/0009-0008-7651-5664"},"institutions":[{"id":"https://openalex.org/I175669267","display_name":"Carestream (United States)","ror":"https://ror.org/048m16q57","country_code":"US","type":"company","lineage":["https://openalex.org/I175669267"]},{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Hamer","raw_affiliation_strings":["Eastman Kodak, Rochester, NY","Eastman Kodak, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Eastman Kodak, Rochester, NY","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]},{"raw_affiliation_string":"Eastman Kodak, Rochester, NY, USA","institution_ids":["https://openalex.org/I175669267"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071060735","display_name":"Jeff Spindler","orcid":null},"institutions":[{"id":"https://openalex.org/I175669267","display_name":"Carestream (United States)","ror":"https://ror.org/048m16q57","country_code":"US","type":"company","lineage":["https://openalex.org/I175669267"]},{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeff Spindler","raw_affiliation_strings":["Eastman Kodak, Rochester, NY","Eastman Kodak, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Eastman Kodak, Rochester, NY","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]},{"raw_affiliation_string":"Eastman Kodak, Rochester, NY, USA","institution_ids":["https://openalex.org/I175669267"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053226693","display_name":"Arokia Nathan","orcid":"https://orcid.org/0000-0002-2070-8853"},"institutions":[{"id":"https://openalex.org/I2801237587","display_name":"London Centre for Nanotechnology","ror":"https://ror.org/04ptp8872","country_code":"GB","type":"facility","lineage":["https://openalex.org/I2801237587"]},{"id":"https://openalex.org/I4210146856","display_name":"IGNIS Innovation (Canada)","ror":"https://ror.org/05gsw2536","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210146856"]},{"id":"https://openalex.org/I45129253","display_name":"University College London","ror":"https://ror.org/02jx3x895","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I45129253"]}],"countries":["CA","GB"],"is_corresponding":false,"raw_author_name":"Arokia Nathan","raw_affiliation_strings":["London Center for Nanotechnology, University College London, London, United Kingdom","Ignis Innovation, Kitchener, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"London Center for Nanotechnology, University College London, London, United Kingdom","institution_ids":["https://openalex.org/I2801237587","https://openalex.org/I45129253"]},{"raw_affiliation_string":"Ignis Innovation, Kitchener, Canada","institution_ids":["https://openalex.org/I4210146856"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6483,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.90388961,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"118","last_page":"119"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amoled","display_name":"AMOLED","score":0.9551509022712708},{"id":"https://openalex.org/keywords/oled","display_name":"OLED","score":0.8963088989257812},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7050303220748901},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6539291143417358},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5038356184959412},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48291775584220886},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4382578134536743},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.40219032764434814},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3271141052246094},{"id":"https://openalex.org/keywords/active-matrix","display_name":"Active matrix","score":0.19995102286338806},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.18291404843330383},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10991200804710388},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07207632064819336}],"concepts":[{"id":"https://openalex.org/C101050124","wikidata":"https://www.wikidata.org/wiki/Q527747","display_name":"AMOLED","level":5,"score":0.9551509022712708},{"id":"https://openalex.org/C150759737","wikidata":"https://www.wikidata.org/wiki/Q209593","display_name":"OLED","level":3,"score":0.8963088989257812},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7050303220748901},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6539291143417358},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5038356184959412},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48291775584220886},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4382578134536743},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40219032764434814},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3271141052246094},{"id":"https://openalex.org/C70201059","wikidata":"https://www.wikidata.org/wiki/Q3142195","display_name":"Active matrix","level":4,"score":0.19995102286338806},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.18291404843330383},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10991200804710388},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07207632064819336},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isscc.2010.5434027","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5434027","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},{"id":"pmh:oai:generic.eprints.org:405227","is_oa":false,"landing_page_url":"http://publications.eng.cam.ac.uk/405227/","pdf_url":null,"source":{"id":"https://openalex.org/S4406922847","display_name":"Cambridge University Engineering Department Publications Database","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2023440710","https://openalex.org/W2024375383","https://openalex.org/W2045665761","https://openalex.org/W2085620619","https://openalex.org/W2115368094","https://openalex.org/W2152617954","https://openalex.org/W2155399297","https://openalex.org/W6671740906"],"related_works":["https://openalex.org/W2909645275","https://openalex.org/W2147646071","https://openalex.org/W2165355630","https://openalex.org/W1913387790","https://openalex.org/W3172017258","https://openalex.org/W2121318755","https://openalex.org/W2806633811","https://openalex.org/W1996748490","https://openalex.org/W2094078956","https://openalex.org/W2569963104"],"abstract_inverted_index":{"We":[0,24,41],"present":[1],"an":[2,9],"electronic":[3],"monitoring":[4],"and":[5,20,28,57],"feedback":[6],"scheme":[7],"for":[8],"AMOLED":[10],"display":[11,36],"that":[12,37],"substantially":[13],"reduces":[14],"the":[15,26,39,45,63],"appearance":[16],"of":[17],"image":[18],"degradation":[19],"increases":[21],"useful":[22],"lifetime.":[23],"describe":[25],"methodology":[27],"show":[29],"results":[30],"on":[31],"a":[32,52],"32-inch":[33],"1080p":[34],"OLED":[35],"establishes":[38],"benefits.":[40],"further":[42],"explain":[43],"how":[44],"same":[46],"technique":[47],"can":[48],"be":[49],"used":[50],"as":[51],"diagnostic":[53],"tool":[54],"to":[55],"identify":[56],"discriminate":[58],"among":[59],"defects":[60],"introduced":[61],"during":[62],"manufacturing":[64],"process.":[65]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}