{"id":"https://openalex.org/W2011593284","doi":"https://doi.org/10.1109/isscc.2010.5433971","title":"A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling","display_name":"A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W2011593284","doi":"https://doi.org/10.1109/isscc.2010.5433971","mag":"2011593284"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2010.5433971","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433971","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020642096","display_name":"Yong Lim","orcid":"https://orcid.org/0000-0002-1161-5671"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yong Lim","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084142971","display_name":"Kyoungmin Koh","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyoungmin Koh","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100390573","display_name":"Kyungmin Kim","orcid":"https://orcid.org/0000-0002-5167-0683"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungmin Kim","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030321060","display_name":"Han Yang","orcid":"https://orcid.org/0009-0006-4946-1395"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Han Yang","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038379228","display_name":"Juha Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Juha Kim","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047619172","display_name":"Youngkyun Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngkyun Jeong","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100734815","display_name":"Seungjin Lee","orcid":"https://orcid.org/0000-0003-1034-1098"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungjin Lee","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075257352","display_name":"Hansoo Lee","orcid":"https://orcid.org/0000-0003-3132-7420"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hansoo Lee","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050227053","display_name":"Sin-Hwan Lim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sin-Hwan Lim","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064882937","display_name":"Yunseok Han","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yunseok Han","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100434611","display_name":"Jinwoo Kim","orcid":"https://orcid.org/0000-0003-1210-0669"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinwoo Kim","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051815160","display_name":"Jaecheol Yun","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaecheol Yun","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103594950","display_name":"Seogheon Ham","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seogheon Ham","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066971192","display_name":"Yun-Tae Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yun-Tae Lee","raw_affiliation_strings":["Samsung Electronics, Yongin, Korea","Samsung Electronics, Yongin, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics, Yongin, Korea#TAB#","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5020642096"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":4.1091,"has_fulltext":false,"cited_by_count":79,"citation_normalized_percentile":{"value":0.93962035,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"396","last_page":"397"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.7457547187805176},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6950383186340332},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6488193273544312},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6445928812026978},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6177405118942261},{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"Fixed-pattern noise","score":0.5384644269943237},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4639418125152588},{"id":"https://openalex.org/keywords/image-noise","display_name":"Image noise","score":0.45785534381866455},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.4303201138973236},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4208371341228485},{"id":"https://openalex.org/keywords/column","display_name":"Column (typography)","score":0.4159894585609436},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37300777435302734},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3484041392803192},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.30786073207855225},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2778804302215576},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2205713987350464},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17465728521347046},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09856918454170227}],"concepts":[{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.7457547187805176},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6950383186340332},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6488193273544312},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6445928812026978},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6177405118942261},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.5384644269943237},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4639418125152588},{"id":"https://openalex.org/C35772409","wikidata":"https://www.wikidata.org/wiki/Q1323086","display_name":"Image noise","level":3,"score":0.45785534381866455},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.4303201138973236},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4208371341228485},{"id":"https://openalex.org/C2780551164","wikidata":"https://www.wikidata.org/wiki/Q2306599","display_name":"Column (typography)","level":3,"score":0.4159894585609436},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37300777435302734},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3484041392803192},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.30786073207855225},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2778804302215576},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2205713987350464},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17465728521347046},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09856918454170227},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2010.5433971","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433971","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2005852137","https://openalex.org/W2023874974","https://openalex.org/W2144536291","https://openalex.org/W2167115535","https://openalex.org/W2170733362","https://openalex.org/W2175009324","https://openalex.org/W3114204430","https://openalex.org/W6787557784","https://openalex.org/W6958801112"],"related_works":["https://openalex.org/W2331709517","https://openalex.org/W1990138130","https://openalex.org/W2170745046","https://openalex.org/W2119302896","https://openalex.org/W2050092207","https://openalex.org/W1963996011","https://openalex.org/W2031597920","https://openalex.org/W2348495072","https://openalex.org/W1980889479","https://openalex.org/W2029098715"],"abstract_inverted_index":{"A":[0],"pseudo-multiple":[1],"sampling":[2],"technique":[3,33],"for":[4],"a":[5,11,25],"low-noise":[6],"CIS":[7],"is":[8,22],"implemented":[9],"using":[10],"conventional":[12],"column-parallel":[13],"single-slope":[14],"ADC":[15,46,55],"structure":[16],"with":[17],"no":[18],"additional":[19],"circuitry.":[20],"It":[21],"applied":[23],"to":[24,41,51],"1/3.2-inch":[26],"8Mpixel":[27],"CIS.":[28],"Measurement":[29],"results":[30],"show":[31],"the":[32],"effectively":[34],"reduces":[35],"dark":[36],"temporal":[37],"noise":[38],"from":[39,49],"1.6e-":[40],"1.2e-":[42],"in":[43,53],"10":[44],"b":[45],"mode,":[47],"and":[48],"1.8e-":[50],"1.1e-":[52],"12b":[54],"mode.":[56]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":10},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":6}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}