{"id":"https://openalex.org/W3150129602","doi":"https://doi.org/10.1109/isscc.2010.5433950","title":"A scalable shield-bitline-overdrive technique for 1.3V Chain FeRAM","display_name":"A scalable shield-bitline-overdrive technique for 1.3V Chain FeRAM","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W3150129602","doi":"https://doi.org/10.1109/isscc.2010.5433950","mag":"3150129602"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2010.5433950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050556210","display_name":"D. Takashima","orcid":"https://orcid.org/0000-0002-8527-067X"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Daisaburo Takashima","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027720906","display_name":"H. Shiga","orcid":"https://orcid.org/0009-0004-4626-3647"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidehiro Shiga","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045459990","display_name":"Daisuke Hashimoto","orcid":"https://orcid.org/0000-0002-7880-889X"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daisuke Hashimoto","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110466807","display_name":"Tadashi Miyakawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadashi Miyakawa","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022556912","display_name":"S. Shiratake","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinichiro Shiratake","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063273965","display_name":"Katsuhiko Hoya","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Katsuhiko Hoya","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051964273","display_name":"Ryu Ogiwara","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryu Ogiwara","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021622545","display_name":"Ryosuke Takizawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryosuke Takizawa","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031669788","display_name":"Sumiko Doumae","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sumiko Doumae","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110211240","display_name":"Ryo Fukuda","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryo Fukuda","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112448242","display_name":"Yohji Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohji Watanabe","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047672572","display_name":"Shuso Fujii","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuso Fujii","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113686919","display_name":"T. Ozaki","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tohru Ozaki","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103515591","display_name":"Hiroyuki Kanaya","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Kanaya","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027173687","display_name":"S. Shuto","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Susumu Shuto","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100514976","display_name":"K. Yamakawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Yamakawa","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069187351","display_name":"I. Kunishima","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Iwao Kunishima","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108634453","display_name":"Takeshi Hamamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Hamamoto","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018287721","display_name":"A. Nitayama","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akihiro Nitayama","raw_affiliation_strings":["Toshiba, Yokohama, Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":19,"corresponding_author_ids":["https://openalex.org/A5050556210"],"corresponding_institution_ids":["https://openalex.org/I1292669757"],"apc_list":null,"apc_paid":null,"fwci":2.5977,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.906299,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"262","last_page":"263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectric-ram","display_name":"Ferroelectric RAM","score":0.8341317176818848},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.820264995098114},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7091131210327148},{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.6533076763153076},{"id":"https://openalex.org/keywords/ferroelectric-capacitor","display_name":"Ferroelectric capacitor","score":0.6461325287818909},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5974524021148682},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5703425407409668},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5023050308227539},{"id":"https://openalex.org/keywords/shield","display_name":"Shield","score":0.49778199195861816},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.462258517742157},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2317546308040619},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.21084022521972656},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2085866928100586},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.18528997898101807},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1704401671886444}],"concepts":[{"id":"https://openalex.org/C161164327","wikidata":"https://www.wikidata.org/wiki/Q703656","display_name":"Ferroelectric RAM","level":4,"score":0.8341317176818848},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.820264995098114},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7091131210327148},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.6533076763153076},{"id":"https://openalex.org/C189366214","wikidata":"https://www.wikidata.org/wiki/Q4103842","display_name":"Ferroelectric capacitor","level":4,"score":0.6461325287818909},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5974524021148682},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5703425407409668},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5023050308227539},{"id":"https://openalex.org/C138081364","wikidata":"https://www.wikidata.org/wiki/Q852013","display_name":"Shield","level":2,"score":0.49778199195861816},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.462258517742157},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2317546308040619},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.21084022521972656},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2085866928100586},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.18528997898101807},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1704401671886444},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C5900021","wikidata":"https://www.wikidata.org/wiki/Q163082","display_name":"Petrology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2010.5433950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2002691895","https://openalex.org/W2100954356","https://openalex.org/W2167326092","https://openalex.org/W3141663781"],"related_works":["https://openalex.org/W2389813843","https://openalex.org/W1977120737","https://openalex.org/W2122610418","https://openalex.org/W2953255424","https://openalex.org/W2010294673","https://openalex.org/W2097792885","https://openalex.org/W4241447640","https://openalex.org/W2346143700","https://openalex.org/W2166508075","https://openalex.org/W3213606764"],"abstract_inverted_index":{"A":[0],"ferroelectric":[1,37],"capacitor":[2],"overdrive":[3],"with":[4,23],"shield-bitline":[5],"drive":[6],"for":[7],"1.3":[8,58],"V":[9,34,59],"chain":[10],"FeRAM":[11],"has":[12],"been":[13],"verified":[14],"using":[15],"a":[16],"0.13":[17],"\u00bfm":[18,25],"576":[19],"Kb":[20],"test":[21],"chip":[22],"0.719":[24],"<sup":[26],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[27],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[28],"cell.":[29],"This":[30],"technique":[31],"applies":[32],"0.24":[33],"bias":[35],"to":[36],"capacitors":[38],"without":[39],"increasing":[40],"stress":[41],"and":[42,55],"bitline":[43],"capacitance.":[44],"The":[45],"measured":[46],"tail-to-tail":[47],"cell":[48],"signal":[49],"is":[50],"improved":[51],"by":[52],"100":[53],"mV":[54],"doubled":[56],"in":[57],"array":[60],"operation.":[61]},"counts_by_year":[{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}